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Journal Articles
A successful phase space transformation chopper design for neutron backscattering spectroscopy
Available to PurchaseBernhard Frick, Tilo Seydel, Lambert van Eijck, Markus Appel, Jean-François Barthélémy, Richard Ammer, Pierre Courtois, Pascal Lachaume, Franck Lapeyre, David Bazzoli
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 96, 041501 (2025)
Published: April 2025
Journal Articles
Results from a synthetic model of the ITER XRCS-Core diagnostic based on high-fidelity x-ray ray tracing
Available to PurchaseN. A. Pablant, Z. Cheng, M. O’Mullane, L. Gao, R. Barnsley, M. N. Bartlett, M. Bitter, E. Bourcart, G. V. Brown, M. De Bock, L. F. Delgado-Aparicio, C. Dunn, A. J. Fairchild, N. Hell, K. W. Hill, J. Klabacha, F. Kraus, D. Lu, P. B. Magesh, S. Mishra, M. Sánchez del Río, R. Tieulent, Y. Yakusevich
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 95, 083517 (2024)
Published: August 2024
Journal Articles
A double crystal von Hamos spectrometer for traceable x-ray emission spectroscopy
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Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 92, 123105 (2021)
Published: December 2021
Journal Articles
Design and expected performance of a variable-radii sinusoidal spiral x-ray spectrometer for the National Ignition Facility
Available to PurchaseN. A. Pablant, M. Bitter, P. C. Efthimion, L. Gao, K. W. Hill, B. F. Kraus, J. Kring, M. J. MacDonald, N. Ose, Y. Ping, M. B. Schneider, S. Stoupin, Y. Yakusevitch
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 92, 093904 (2021)
Published: September 2021
Journal Articles
First characterization of chemical environments using energy dispersive inelastic x-ray scattering induced by an x-ray tube
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Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 92, 013102 (2021)
Published: January 2021
Journal Articles
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 91, 023105 (2020)
Published: February 2020
Journal Articles
Breakthrough in neutron backscattering spectroscopy: Energy resolution improved by one order of magnitude using the GaAs 200 reflection
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 90, 015119 (2019)
Published: January 2019
Journal Articles
C. Stoeckl, T. Filkins, R. Jungquist, C. Mileham, N. R. Pereira, S. P. Regan, M. J. Shoup, III, W. Theobald
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 89, 10G124 (2018)
Published: October 2018
Journal Articles
M. Bitter, K. W. Hill, Lan Gao, B. F. Kraus, P. C. Efthimion, L. Delgado-Aparicio, N. Pablant, B. Stratton, M. Schneider, F. Coppari, R. Kauffman, A. G. MacPhee, Y. Ping, D. Thorn
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 89, 10F118 (2018)
Published: October 2018
Journal Articles
Current capabilities of the residual stress diffractometer at the high flux isotope reactor
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Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 89, 092804 (2018)
Published: September 2018
Journal Articles
Elliptically bent crystal x-ray spectrometer for time-resolved laser plasma experiments
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Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 89, 093109 (2018)
Published: September 2018
Journal Articles
X-ray spectrometer having 12 000 resolving power at 8 keV energy
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Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 88, 103107 (2017)
Published: October 2017
Journal Articles
Diffraction based method to reconstruct the spectrum of the Thomson scattering x-ray source
Available to PurchaseZhijun Chi, Lixin Yan, Zhen Zhang, Zheng Zhou, Lianmin Zheng, Dong Wang, Qili Tian, Wei Wang, Zan Nie, Jie Zhang, Yingchao Du, Jianfei Hua, Jiaru Shi, Chihao Pai, Wei Lu, Wenhui Huang, Huaibi Chen, Chuanxiang Tang
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 88, 045110 (2017)
Published: April 2017
Journal Articles
Systematic search for spherical crystal X-ray microscopes matching 1–25 keV spectral line sources
Free
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 87, 123511 (2016)
Published: December 2016
Includes: Supplementary data
Journal Articles
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 87, 125117 (2016)
Published: December 2016
Journal Articles
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 87, 107101 (2016)
Published: October 2016
Journal Articles
Implementation of a new Cryopad on the diffractometer POLI at MLZ
Available to PurchaseV. Hutanu, W. Luberstetter, E. Bourgeat-Lami, M. Meven, A. Sazonov, A. Steffen, G. Heger, G. Roth, E. Lelièvre-Berna
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 87, 105108 (2016)
Published: October 2016
Journal Articles
Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering
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Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 87, 083107 (2016)
Published: August 2016
Journal Articles
Journal Articles
A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device
Available to PurchaseA. Abboud, C. Kirchlechner, S. Send, J. S. Micha, O. Ulrich, N. Pashniak, L. Strüder, J. Keckes, U. Pietsch
Journal:
Review of Scientific Instruments
Rev. Sci. Instrum. 85, 113901 (2014)
Published: November 2014
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