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Journal Articles

A versatile system for the growth of porphyrin films via electrospray and molecular sublimation in vacuum and their multi-technique characterization

F. Goto, A. Calloni, R. Yivlialin, A. Bossi, F. Ciccacci, L. Duò, J. N. O’Shea, G. Bussetti
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 095102 (2024)
https://doi.org/10.1063/5.0223459
Published: September 2024
View article titled, A versatile system for the growth of porphyrin films via electrospray and molecular sublimation in vacuum and their multi-technique characterization
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Journal Articles

Needle in a haystack: Efficiently finding atomically defined quantum dots for electrostatic force microscopy

José Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park, Kieran Spruce, Patrick See, Neil Curson, Taylor J. Z. Stock, Peter Grutter
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 083709 (2024)
https://doi.org/10.1063/5.0208571
Published: August 2024
View article titled, Needle in a haystack: Efficiently finding atomically defined quantum dots for electrostatic force microscopy
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Journal Articles

An atomic force microscopy and total internal reflection fluorescence microscopy correlated system (AFM–TIRF) for fluorescence imaging and spectroscopy of a single particle

Xiumian Cao, Wenquan Wang, Yuanfei Jiang, Wei Feng, Shuping Xu, Weiqing Xu, Wenke Zhang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 073706 (2024)
https://doi.org/10.1063/5.0210704
Published: July 2024
View article titled, An atomic force microscopy and total internal reflection fluorescence microscopy correlated system (AFM–TIRF) for fluorescence imaging and spectroscopy of a single particle
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Journal Articles

Construction of a cryogenic dual scanner magnetic force microscope equipped with piezoresistive cantilever

Jungsub Lee, Jeehoon Kim
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 073701 (2024)
https://doi.org/10.1063/5.0214904
Published: July 2024
View article titled, Construction of a cryogenic dual scanner magnetic force microscope equipped with piezoresistive cantilever
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Journal Articles

Design, development, and performance of a versatile graphene epitaxy system for the growth of epitaxial graphene on SiC

S. Mondal, U. J. Jayalekshmi, S. Singh, R. K. Mukherjee, A. K. Shukla
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 063901 (2024)
https://doi.org/10.1063/5.0194852
Published: June 2024
View article titled, Design, development, and performance of a versatile graphene epitaxy system for the growth of epitaxial graphene on SiC
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Includes: Supplementary data
Journal Articles

A scanning probe microscope compatible with quantum sensing at ambient conditions

Ke Bian, Wentian Zheng, Xiakun Chen, Shichen Zhang, Rainer Stöhr, Andrej Denisenko, Sen Yang, Jörg Wrachtrup, Ying Jiang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 053707 (2024)
https://doi.org/10.1063/5.0202756
Published: May 2024
View article titled, A scanning probe microscope compatible with quantum sensing at ambient conditions
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Journal Articles

Experimental setup for thermal measurements at the nanoscale using a SThM probe with niobium nitride thermometer

R. Swami, G. Julié, S. Le-Denmat, G. Pernot, D. Singhal, J. Paterson, J. Maire, J. F. Motte, N. Paillet, H. Guillou, S. Gomès, O. Bourgeois
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 054904 (2024)
https://doi.org/10.1063/5.0203890
Published: May 2024
View article titled, Experimental setup for thermal measurements at the nanoscale using a SThM probe with niobium nitride thermometer
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Includes: Supplementary data
Journal Articles

Review of Scientific Instruments New Products

Andreas Mandelis
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 049501 (2024)
https://doi.org/10.1063/5.0212786
Published: April 2024
View article titled, <em>Review of Scientific Instruments</em> New Products
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Journal Articles

Microfabricated double-tilt apparatus for transmission electron microscope imaging of atomic force microscope probe

Takaaki Sato, Vivek Anand Menon, Hiroshi Toshiyoshi, Eita Tochigi
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 023705 (2024)
https://doi.org/10.1063/5.0186983
Published: February 2024
View article titled, Microfabricated double-tilt apparatus for transmission electron microscope imaging of atomic force microscope probe
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Includes: Supplementary data
Journal Articles

Determination of in-plane surface directions in scanning probe microscopy images

Bob Kyeyune, Reinhard Olbrich, Philipp Rahe, Michael Reichling
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 023702 (2024)
https://doi.org/10.1063/5.0182520
Published: February 2024
View article titled, Determination of in-plane surface directions in scanning probe microscopy images
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Journal Articles

Application of calibrated and reusable probes on a home-made scanning probe microscope platform

Rui Xu, Yi Liu, Zhimu Yang, Qinmeng Jiang, Yanhui Zhang, Jianli Wang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 013702 (2024)
https://doi.org/10.1063/5.0169091
Published: January 2024
View article titled, Application of calibrated and reusable probes on a home-made scanning probe microscope platform
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Journal Articles

An integrated hinged dual-probe for co-target fast switching imaging

Kaixuan Wang, Jialin Shi, Tie Yang, Si Tang, Peng Yu, Huiyao Shi, Shenghang Zhai, Chanmin Su, Lianqing Liu
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 123706 (2023)
https://doi.org/10.1063/5.0167354
Published: December 2023
View article titled, An integrated hinged dual-probe for co-target fast switching imaging
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Includes: Supplementary data
Journal Articles

On the origin and elimination of cross coupling between tunneling current and excitation in scanning probe experiments that utilize the qPlus sensor

Michael Schelchshorn, Fabian Stilp, Marco Weiss, Franz J. Giessibl
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 113704 (2023)
https://doi.org/10.1063/5.0151615
Published: November 2023
View article titled, On the origin and elimination of cross coupling between tunneling current and excitation in scanning probe experiments that utilize the qPlus sensor
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Journal Articles

MilliKelvin microwave impedance microscopy in a dry dilution refrigerator

Leonard Weihao Cao, Chen Wu, Rajarshi Bhattacharyya, Ruolun Zhang, Monica T. Allen
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 093705 (2023)
https://doi.org/10.1063/5.0159548
Published: September 2023
View article titled, MilliKelvin microwave impedance microscopy in a dry dilution refrigerator
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Includes: Supplementary data
Journal Articles

Development of a cryogen-free sub-3 K low-temperature scanning probe microscope by remote liquefaction scheme

Ruisong Ma, Hao Li, Chenshuai Shi, Fan Wang, Le Lei, Yuanzhi Huang, Yani Liu, Huan Shan, Li Liu, Shesong Huang, Zhi-Chuan Niu, Qing Huan, Hong-Jun Gao
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 093701 (2023)
https://doi.org/10.1063/5.0165089
Published: September 2023
View article titled, Development of a cryogen-free sub-3 K low-temperature scanning probe microscope by remote liquefaction scheme
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Journal Articles

Simultaneous detection of force and tunneling current in electrolyte solution by using qPlus sensor

Naritaka Kobayashi, Masayuki Hojo, Kengo Baba, Ken Sakuta
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 073707 (2023)
https://doi.org/10.1063/5.0152398
Published: July 2023
View article titled, Simultaneous detection of force and tunneling current in electrolyte solution by using qPlus sensor
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Journal Articles

Design of 3D printed stage for in situ magnetic field application in magnetic force microscopy

B. Stropkai, S. Vorobiov, K. Richter, E. Ivanov, M. Orendáč, V. Komanicky
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 073702 (2023)
https://doi.org/10.1063/5.0145147
Published: July 2023
View article titled, Design of 3D printed stage for <em>in situ</em> magnetic field application in magnetic force microscopy
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Journal Articles

Customization of an atomic force microscope for multidimensional measurements under environmental conditions

Bugrahan Guner, Simon Laflamme, Omur E. Dagdeviren
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 063704 (2023)
https://doi.org/10.1063/5.0147331
Published: June 2023
View article titled, Customization of an atomic force microscope for multidimensional measurements under environmental conditions
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Includes: Supplementary data
Journal Articles

Mapping AC susceptibility with quantum diamond microscope

Shishir Dasika, Madhur Parashar, Kasturi Saha
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 053702 (2023)
https://doi.org/10.1063/5.0138301
Published: May 2023
View article titled, Mapping AC susceptibility with quantum diamond microscope
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Includes: Supplementary data
Journal Articles

Determining local modulus and strength of heterogeneous films by force–deflection mapping of microcantilevers

Kyle Larsen, Stefan Lehnardt, Bryce Anderson, Joseph Rowley, Richard Vanfleet, Robert Davis
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 033904 (2023)
https://doi.org/10.1063/5.0092934
Published: March 2023