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Journal Articles

Optical measurement of the work function and the field reduction factor of metallic needle tips

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Stefan Meier, Jonas Heimerl, Philip Dienstbier, Peter Hommelhoff
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 103302 (2023)
https://doi.org/10.1063/5.0165802
Published: October 2023
View articletitled, Optical measurement of the work function and the field reduction factor of metallic needle tips
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Journal Articles

Electron-bombarded 〈110〉-oriented tungsten tips for stable tunneling electron emission

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T. K. Yamada, T. Abe, N. M. K. Nazriq, T. Irisawa
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 033703 (2016)
https://doi.org/10.1063/1.4943074
Published: March 2016
View articletitled, Electron-bombarded 〈110〉-oriented tungsten tips for stable tunneling electron emission
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Journal Articles

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

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Till Hagedorn, Mehdi El Ouali, William Paul, David Oliver, Yoichi Miyahara, Peter Grütter
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 113903 (2011)
https://doi.org/10.1063/1.3660279
Published: November 2011
View articletitled, Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
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Journal Articles

Note: Electrochemical etching of sharp iridium tips

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Jean-Benoît Lalanne, William Paul, David Oliver, Peter H. Grütter
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 116105 (2011)
https://doi.org/10.1063/1.3662473
Published: November 2011
View articletitled, Note: Electrochemical etching of sharp iridium tips
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Journal Articles

Note: Production of sharp gold tips with high surface quality

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Max Eisele, Michael Krüger, Markus Schenk, Alexander Ziegler, Peter Hommelhoff
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 026101 (2011)
https://doi.org/10.1063/1.3534078
Published: February 2011
View articletitled, Note: Production of sharp gold tips with high surface quality
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Journal Articles

Effects of process parameters on the electrochemical etching of sharp metallic tips with an attached mass

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Pilkyu Kim, Sungho Jeong, Mun Seok Jeong, Do-Kyeong Ko, Jongmin Lee
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 78, 096105 (2007)
https://doi.org/10.1063/1.2785851
Published: September 2007
View articletitled, Effects of process parameters on the electrochemical etching of sharp metallic tips with an attached mass
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Journal Articles

Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: “Atom-probe tomography” [ Rev. Sci. Instrum. 78 , 031101 ( 2007 ) ]

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David N. Seidman
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 78, 030901 (2007)
https://doi.org/10.1063/1.2716503
Published: March 2007
View articletitled, Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: “Atom-probe tomography” [ Rev. Sci. Instrum. 78 , 031101 ( 2007 ) ]
Open the PDF for Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: “Atom-probe tomography” [ Rev. Sci. Instrum. 78 , 031101 ( 2007 ) ] in another window
Journal Articles

A reproducible method to fabricate atomically sharp tips for scanning tunneling microscopy

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Yoshiaki Nakamura, Yutaka Mera, Koji Maeda
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 70, 3373–3376 (1999)
https://doi.org/10.1063/1.1149921
Published: August 1999
View articletitled, A reproducible method to fabricate atomically sharp tips for scanning tunneling microscopy
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Journal Articles

Systematic procedures for atom‐probe field‐ion microscopy studies of grain boundary segregation

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B. W. Krakauer, D. N. Seidman
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 63, 4071–4079 (1992)
https://doi.org/10.1063/1.1143214
Published: September 1992
View articletitled, Systematic procedures for atom‐probe field‐ion microscopy studies of grain boundary segregation
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Journal Articles

An ultrahigh vacuum tip transfer system for the scanning tunneling microscopy/field ion microscopy

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Kazuyoshi Sugihara, Akira Sakai, Yoshiaki Akama, Naohiro Shoda, Yoshihide Kato, Hiroshi Tokumoto, Hiroshi Murakami
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 61, 81–85 (1990)
https://doi.org/10.1063/1.1141905
Published: January 1990
View articletitled, An ultrahigh vacuum tip transfer system for the scanning tunneling microscopy/field ion microscopy
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Journal Articles

The Performance of Electron Multipliers in FIM Atom Probes

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S. S. Brenner, J. T. McKinney
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 43, 1264–1267 (1972)
https://doi.org/10.1063/1.1685899
Published: September 1972
View articletitled, The Performance of Electron Multipliers in FIM Atom Probes
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