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Journal Articles

Meso/macro-scale ultra-soft materials’ mechanical property evaluation device and testbed

Kazue Orikasa, Nicole Bacca, Arvind Agarwal
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 92, 073904 (2021)
https://doi.org/10.1063/5.0046282
Published: July 2021
View article titled, Meso/macro-scale ultra-soft materials’ mechanical property evaluation device and testbed
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Includes: Supplementary data
Journal Articles

Measurement of sub-nanonewton forces inside a scanning electron microscope

Waldemar Klauser, Malte Bartenwerfer, Sergej Fatikow
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 91, 043701 (2020)
https://doi.org/10.1063/1.5144653
Published: April 2020
View article titled, Measurement of sub-nanonewton forces inside a scanning electron microscope
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Includes: Supplementary data
Journal Articles

Rapid discrimination of chemically distinctive surface terminations in 2D material based heterostructures by direct van der Waals identification

Srinivasa Reddy Tamalampudi, Sergio Santos, Chia-Yun Lai, Tuza A. Olukan, Jin-You Lu, Nitul Rajput, Matteo Chiesa
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 91, 023907 (2020)
https://doi.org/10.1063/1.5128756
Published: February 2020
View article titled, Rapid discrimination of chemically distinctive surface terminations in 2D material based heterostructures by direct van der Waals identification
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Journal Articles

Graphene used as a lateral force microscopy calibration material in the low-load non-linear regime

Mathias J. Boland, Jacob L. Hempel, Armin Ansary, Mohsen Nasseri, Douglas R. Strachan
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 89, 113902 (2018)
https://doi.org/10.1063/1.5044727
Published: November 2018
View article titled, Graphene used as a lateral force microscopy calibration material in the low-load non-linear regime
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Journal Articles

A microelectromechanical systems (MEMS) force-displacement transducer for sub-5 nm nanoindentation and adhesion measurements

Youfeng Zhang, Yunje Oh, Douglas Stauffer, Andreas A. Polycarpou
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 89, 045109 (2018)
https://doi.org/10.1063/1.5021046
Published: April 2018
View article titled, A microelectromechanical systems (MEMS) force-displacement transducer for sub-5 nm nanoindentation and adhesion measurements
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Journal Articles

Development of a novel precision instrument for high-resolution simultaneous normal and shear force measurements between small planar samples

Troy Lundstrom, William Clark, Nader Jalili
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 88, 055002 (2017)
https://doi.org/10.1063/1.4983312
Published: May 2017
View article titled, Development of a novel precision instrument for high-resolution simultaneous normal and shear force measurements between small planar samples
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Journal Articles

A vacuum microgripping tool with integrated vibration releasing capability

Weibin Rong, Zenghua Fan, Lefeng Wang, Hui Xie, Lining Sun
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 085002 (2014)
https://doi.org/10.1063/1.4891695
Published: August 2014
View article titled, A vacuum microgripping tool with integrated vibration releasing capability
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Journal Articles

AtomicJ: An open source software for analysis of force curves

Paweł Hermanowicz, Michał Sarna, Kvetoslava Burda, Halina Gabryś
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 063703 (2014)
https://doi.org/10.1063/1.4881683
Published: June 2014
View article titled, AtomicJ: An open source software for analysis of force curves
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Includes: Supplementary data
Journal Articles

Particle beam experiments for the analysis of reactive sputtering processes in metals and polymer surfaces

Carles Corbella, Simon Grosse-Kreul, Oliver Kreiter, Teresa de los Arcos, Jan Benedikt, Achim von Keudell
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 103303 (2013)
https://doi.org/10.1063/1.4826066
Published: October 2013
View article titled, Particle beam experiments for the analysis of reactive sputtering processes in metals and polymer surfaces
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Journal Articles

An automated high throughput tribometer for adhesion, wear, and friction measurements

Vivek Kalihari, Shannon J. Timpe, Lyle McCarty, Matthew Ninke, Jim Whitehead
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 035104 (2013)
https://doi.org/10.1063/1.4794908
Published: March 2013
View article titled, An automated high throughput tribometer for adhesion, wear, and friction measurements
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Journal Articles

An atomic layer deposition reactor with dose quantification for precursor adsorption and reactivity studies

T. J. Larrabee, T. E. Mallouk, D. L. Allara
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 014102 (2013)
https://doi.org/10.1063/1.4774042
Published: January 2013
View article titled, An atomic layer deposition reactor with dose quantification for precursor adsorption and reactivity studies
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Journal Articles

Friction measurement on free standing plates using atomic force microscopy

X. S. Tang, Y. C. Loke, P. Lu, Sujeet K. Sinha, S. J. O'Shea
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 013702 (2013)
https://doi.org/10.1063/1.4773534
Published: January 2013
View article titled, Friction measurement on free standing plates using atomic force microscopy
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Journal Articles

Measurement of momentum transfer due to adhesive forces: On-ground testing of in-space body injection into geodesic motion

D. Bortoluzzi, M. Benedetti, L. Baglivo, M. De Cecco, S. Vitale
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 125107 (2011)
https://doi.org/10.1063/1.3658479
Published: December 2011
View article titled, Measurement of momentum transfer due to adhesive forces: On-ground testing of in-space body injection into geodesic motion
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Journal Articles

Manipulating InAs nanowires with submicrometer precision

Kilian Flöhr, Marcus Liebmann, Kamil Sladek, H. Yusuf Günel, Robert Frielinghaus, Fabian Haas, Carola Meyer, Hilde Hardtdegen, Thomas Schäpers, Detlev Grützmacher, Markus Morgenstern
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 113705 (2011)
https://doi.org/10.1063/1.3657135
Published: November 2011
View article titled, Manipulating InAs nanowires with submicrometer precision
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Journal Articles

Circular mode: A new scanning probe microscopy method for investigating surface properties at constant and continuous scanning velocities

Hussein Nasrallah, Pierre-Emmanuel Mazeran, Olivier Noël
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 113703 (2011)
https://doi.org/10.1063/1.3658049
Published: November 2011
View article titled, Circular mode: A new scanning probe microscopy method for investigating surface properties at constant and continuous scanning velocities
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Journal Articles

Adhesive-free colloidal probes for nanoscale force measurements: Production and characterization

M. Indrieri, A. Podestà, G. Bongiorno, D. Marchesi, P. Milani
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 023708 (2011)
https://doi.org/10.1063/1.3553499
Published: February 2011
View article titled, Adhesive-free colloidal probes for nanoscale force measurements: Production and characterization
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Includes: Supplementary data
Journal Articles

Efficient fabrication of wafer scale thin film of individualized single-walled carbon nanotubes by dual-nozzle spin casting

Yong Shin Kim, Soongeun Kwon, Dong Hun Shin, Hyung Cheoul Shim, Ju Yeon Woo, Donghyun Lim, Yoon Keun Kwak, Soohyun Kim, Chang-Soo Han
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 063905 (2010)
https://doi.org/10.1063/1.3455212
Published: June 2010
View article titled, Efficient fabrication of wafer scale thin film of individualized single-walled carbon nanotubes by dual-nozzle spin casting
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Journal Articles

Combination of a Knudsen effusion cell with a quartz crystal microbalance: In situ measurement of molecular evaporation rates with a fully functional deposition source

Rico Gutzler, Wolfgang M. Heckl, Markus Lackinger
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 015108 (2010)
https://doi.org/10.1063/1.3292510
Published: January 2010
View article titled, Combination of a Knudsen effusion cell with a quartz crystal microbalance: <em>In situ</em> measurement of molecular evaporation rates with a fully functional deposition source
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Journal Articles

How to measure forces with atomic force microscopy without significant influence from nonlinear optical lever sensitivity

Esben Thormann, Torbjön Pettersson, Per M. Claesson
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 80, 093701 (2009)
https://doi.org/10.1063/1.3194048
Published: September 2009
View article titled, How to measure forces with atomic force microscopy without significant influence from nonlinear optical lever sensitivity
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Journal Articles

Initial and adhesive contact between a diamond indenter and polydimethylsiloxane

Yan Xing Shen, Pal Jen Wei, Jen Fin Lin
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 096106 (2008)
https://doi.org/10.1063/1.2987692
Published: September 2008
View article titled, Initial and adhesive contact between a diamond indenter and polydimethylsiloxane
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