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Journal Articles

Development and characterization of a charge‐coupled device detection system for ion microscopy

Lisa K. Turner, David S. Mantus, Yong‐Chien Ling, Mark T. Bernius, George H. Morrison

Rev. Sci. Instrum. 60, 886–894 (1989)

https://doi.org/10.1063/1.1140340

Published: May 1989

View articletitled, Development and characterization of a charge‐coupled device detection system for ion microscopy

Journal Articles

High Voltage Sweep and Controlled Magnetic Lens Current Supplies for the Electron Microprobe

David F. Kyser, Donald E. Horne

Rev. Sci. Instrum. 43, 1334–1338 (1972)

https://doi.org/10.1063/1.1685919

Published: September 1972

View articletitled, High Voltage Sweep and Controlled Magnetic Lens Current Supplies for the Electron Microprobe

Journal Articles

Modification of a Cosslett‐Nixon Microfocus X‐Ray Tube for Use as an X‐Ray Microanalyzer

R. R. Dils, L. Zeitz, D. L. Keith, R. A. Huggins

Rev. Sci. Instrum. 32, 1040–1044 (1961)

https://doi.org/10.1063/1.1717609

Published: September 1961

View articletitled, Modification of a Cosslett‐Nixon Microfocus X‐Ray Tube for Use as an X‐Ray Microanalyzer

Journal Articles

Electron Probe X‐Ray Microanalyzer

L. S. Birks, E. J. Brooks

Rev. Sci. Instrum. 28, 709–712 (1957)

https://doi.org/10.1063/1.1715982

Published: September 1957

View articletitled, Electron Probe X‐Ray Microanalyzer