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Journal Articles

Design of multi-frequency point, high-isolation switches for micro-channel plate data acquisition

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Yihao Yang, Yongsheng Gou, Yang Yang, Penghui Feng, Bo Wang, Baiyu Liu, Jianan Wei, Jinshou Tian, Wei Zhao
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 94, 104713 (2023)
https://doi.org/10.1063/5.0159975
Published: October 2023
View articletitled, Design of multi-frequency point, high-isolation switches for micro-channel plate data acquisition
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Journal Articles

0.342 nW Class-AB enhanced flipped source follower low pass filter for biomedical applications

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Diksha Thakur, Kulbhushan Sharma
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 93, 114709 (2022)
https://doi.org/10.1063/5.0108207
Published: November 2022
View articletitled, 0.342 nW Class-AB enhanced flipped source follower low pass filter for biomedical applications
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Journal Articles

Design of a low-noise low-voltage amplifier for improved neural signal recording

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Kulbhushan Sharma, Rahul Kumar Tripathi, H. S. Jatana, Rajnish Sharma
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 93, 064710 (2022)
https://doi.org/10.1063/5.0087527
Published: June 2022
View articletitled, Design of a low-noise low-voltage amplifier for improved neural signal recording
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Journal Articles

Low-voltage low-noise gate driven quasi-floating bulk self-cascode current mirror operational transconductance amplifier

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K. Sharma, R. Sharma
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 92, 034717 (2021)
https://doi.org/10.1063/5.0038939
Published: March 2021
View articletitled, Low-voltage low-noise gate driven quasi-floating bulk self-cascode current mirror operational transconductance amplifier
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Journal Articles

Design and simulation of pseudo-resistor with extremely high linearity for an improved neural signal recording

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K. Sharma, S. S. Jamuar, R. Sharma
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 91, 066102 (2020)
https://doi.org/10.1063/1.5125409
Published: June 2020
View articletitled, Design and simulation of pseudo-resistor with extremely high linearity for an improved neural signal recording
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Journal Articles

Characterization of the photocurrents generated by the laser of atomic force microscopes

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Yanfeng Ji, Fei Hui, Yuanyuan Shi, Vanessa Iglesias, David Lewis, Jiebin Niu, Shibing Long, Ming Liu, Alexander Hofer, Werner Frammelsberger, Guenther Benstetter, Andrew Scheuermann, Paul C. McIntyre, Mario Lanza
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 083703 (2016)
https://doi.org/10.1063/1.4960597
Published: August 2016
View articletitled, Characterization of the photocurrents generated by the laser of atomic force microscopes
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Includes: Supplementary data
Journal Articles

An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements

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T. Dargent, K. Haddadi, T. Lasri, N. Clément, D. Ducatteau, B. Legrand, H. Tanbakuchi, D. Theron
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 84, 123705 (2013)
https://doi.org/10.1063/1.4848995
Published: December 2013
View articletitled, An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements
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Journal Articles

A hyperthermal energy ion beamline for probing hot electron chemistry at surfaces

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M. P. Ray, R. E. Lake, S. A. Moody, V. Magadala, C. E. Sosolik
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 076106 (2008)
https://doi.org/10.1063/1.2960559
Published: July 2008
View articletitled, A hyperthermal energy ion beamline for probing hot electron chemistry at surfaces
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Journal Articles

Improving the electrical performance of a conductive atomic force microscope with a logarithmic current-to-voltage converter

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L. Aguilera, M. Lanza, M. Porti, J. Grifoll, M. Nafría, X. Aymerich
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 073701 (2008)
https://doi.org/10.1063/1.2952058
Published: July 2008
View articletitled, Improving the electrical performance of a conductive atomic force microscope with a logarithmic current-to-voltage converter
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Journal Articles

Enhanced electrical performance for conductive atomic force microscopy

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Xavier Blasco, Montserrat Nafria, Xavier Aymerich
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 76, 016105 (2005)
https://doi.org/10.1063/1.1832579
Published: December 2004
View articletitled, Enhanced electrical performance for conductive atomic force microscopy
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Journal Articles

Novel charge integrating pulsed I(V) technique: A measurement of Fowler–Nordheim currents through thin SiO2 films

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J. C. Poler, W. S. Woodward, E. A. Irene
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 64, 781–787 (1993)
https://doi.org/10.1063/1.1144159
Published: March 1993
View articletitled, Novel charge integrating pulsed I(V) technique: A measurement of Fowler–Nordheim currents through thin SiO2 films
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Journal Articles

Thermally stimulated current measurements of SiO2 defect density and energy in irradiated metal‐oxide‐semiconductor capacitors

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Richard A. Reber, Jr., Daniel M. Fleetwood
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 63, 5714–5725 (1992)
https://doi.org/10.1063/1.1143354
Published: December 1992
View articletitled, Thermally stimulated current measurements of SiO2 defect density and energy in irradiated metal‐oxide‐semiconductor capacitors
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Journal Articles

Interface circuit between a capacitance meter (PAR 410) and a microcomputer (Apple II)

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K. Bohlin
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 56, 2147–2150 (1985)
https://doi.org/10.1063/1.1138385
Published: November 1985
View articletitled, Interface circuit between a capacitance meter (PAR 410) and a microcomputer (Apple II)
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Journal Articles

Electrometer for Ionization Chambers Using Metal‐Oxide‐Semiconductor Field‐Effect Transistors

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Joseph B. McCaslin
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 35, 1587–1591 (1964)
https://doi.org/10.1063/1.1719216
Published: November 1964
View articletitled, Electrometer for Ionization Chambers Using Metal‐Oxide‐Semiconductor Field‐Effect Transistors
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