1-20 of 22
Capacitance meter
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Noise and thermal performance of a sub-attofarad capacitance sensor for precision measurements, with applications in gravitational wave detectors

Available to Purchase
S. Saraf, S. Buchman, C. Y. Lui, S. Wang, J. Lipa
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 95, 034503 (2024)
https://doi.org/10.1063/5.0198159
Published: March 2024
View articletitled, Noise and thermal performance of a sub-attofarad capacitance sensor for precision measurements, with applications in gravitational wave detectors
Open the PDF for Noise and thermal performance of a sub-attofarad capacitance sensor for precision measurements, with applications in gravitational wave detectors in another window
Journal Articles

High precision, low excitation capacitance measurement methods from 10 mK to room temperature

Available to Purchase
Lili Zhao, Wenlu Lin, Xing Fan, Yuanjun Song, Hong Lu, Yang Liu
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 93, 053910 (2022)
https://doi.org/10.1063/5.0087772
Published: May 2022
View articletitled, High precision, low excitation capacitance measurement methods from 10 mK to room temperature
Open the PDF for High precision, low excitation capacitance measurement methods from 10 mK to room temperature in another window
Journal Articles

Capacitive detection of magnetostriction, dielectric constant, and magneto-caloric effects in pulsed magnetic fields

Available to Purchase
Atsushi Miyake, Hiroyuki Mitamura, Shiro Kawachi, Kenta Kimura, Tsuyoshi Kimura, Takumi Kihara, Makoto Tachibana, Masashi Tokunaga
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 91, 105103 (2020)
https://doi.org/10.1063/5.0010753
Published: October 2020
View articletitled, Capacitive detection of magnetostriction, dielectric constant, and magneto-caloric effects in pulsed magnetic fields
Open the PDF for Capacitive detection of magnetostriction, dielectric constant, and magneto-caloric effects in pulsed magnetic fields in another window
Journal Articles

A highly precise cross-capacitive sensor for metal debris detection in insulating oil

Available to Purchase
Tarikul Islam, Mujeeb Yousuf, Mohd Nauman
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 91, 025005 (2020)
https://doi.org/10.1063/1.5139925
Published: February 2020
View articletitled, A highly precise cross-capacitive sensor for metal debris detection in insulating oil
Open the PDF for A highly precise cross-capacitive sensor for metal debris detection in insulating oil in another window
Journal Articles

Integrated impedance bridge for absolute capacitance measurements at cryogenic temperatures and finite magnetic fields

Available to Purchase
G. J. Verbiest, H. Janssen, D. Xu, X. Ge, M. Goldsche, J. Sonntag, T. Khodkov, L. Banszerus, N. von den Driesch, D. Buca, K. Watanabe, T. Taniguchi, C. Stampfer
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 90, 084706 (2019)
https://doi.org/10.1063/1.5089207
Published: August 2019
View articletitled, Integrated impedance bridge for absolute capacitance measurements at cryogenic temperatures and finite magnetic fields
Open the PDF for Integrated impedance bridge for absolute capacitance measurements at cryogenic temperatures and finite magnetic fields in another window
Journal Articles

Capacitive displacement sensor for detecting planar submicrometer motion

Available to Purchase
Svetlana Avramov-Zamurovic, Jae Myung Yoo, Nicholas G. Dagalakis
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 065001 (2016)
https://doi.org/10.1063/1.4952585
Published: June 2016
View articletitled, Capacitive displacement sensor for detecting planar submicrometer motion
Open the PDF for Capacitive displacement sensor for detecting planar submicrometer motion in another window
Journal Articles

Maximizing the rigidity of a large planar orifice air bearing

Available to Purchase
Michael Mullen, John Broadhurst
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 85, 085112 (2014)
https://doi.org/10.1063/1.4890210
Published: August 2014
View articletitled, Maximizing the rigidity of a large planar orifice air bearing
Open the PDF for Maximizing the rigidity of a large planar orifice air bearing in another window
Journal Articles

Cryogenic apparatus for study of near-field heat transfer

Available to Purchase
T. Kralik, P. Hanzelka, V. Musilova, A. Srnka, M. Zobac
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 82, 055106 (2011)
https://doi.org/10.1063/1.3585985
Published: May 2011
View articletitled, Cryogenic apparatus for study of near-field heat transfer
Open the PDF for Cryogenic apparatus for study of near-field heat transfer in another window
Journal Articles

Capacitive measurement of mercury column heights in capillaries

Available to Purchase
Sarah Frey, Ranko Richert
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 034702 (2010)
https://doi.org/10.1063/1.3355023
Published: March 2010
View articletitled, Capacitive measurement of mercury column heights in capillaries
Open the PDF for Capacitive measurement of mercury column heights in capillaries in another window
Journal Articles

Tapping mode microwave impedance microscopy

Available to Purchase
K. Lai, W. Kundhikanjana, H. Peng, Y. Cui, M. A. Kelly, Z. X. Shen
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 80, 043707 (2009)
https://doi.org/10.1063/1.3123406
Published: April 2009
View articletitled, Tapping mode microwave impedance microscopy
Open the PDF for Tapping mode microwave impedance microscopy in another window
Journal Articles

Setup for in situ deep level transient spectroscopy of semiconductors during swift heavy ion irradiation

Available to Purchase
Sandeep Kumar, Sugam Kumar, Y. S. Katharria, C. P. Safvan, D. Kanjilal
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 79, 056103 (2008)
https://doi.org/10.1063/1.2919173
Published: May 2008
View articletitled, Setup for in situ deep level transient spectroscopy of semiconductors during swift heavy ion irradiation
Open the PDF for Setup for in situ deep level transient spectroscopy of semiconductors during swift heavy ion irradiation in another window
Journal Articles

Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes

Available to Purchase
V. T. Rangel-Kuoppa, M. Pessa
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 74, 4561–4563 (2003)
https://doi.org/10.1063/1.1610786
Published: October 2003
View articletitled, Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes
Open the PDF for Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes in another window
Journal Articles

A portable stray-immune capacitance meter

Available to Purchase
San Xu Yang, Wu Qiang Yang
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 73, 1958–1961 (2002)
https://doi.org/10.1063/1.1453504
Published: April 2002
View articletitled, A portable stray-immune capacitance meter
Open the PDF for A portable stray-immune capacitance meter in another window
Journal Articles

Inexpensive circuit for the measurement of capture cross section of deep level defects in semiconductors

Available to Purchase
C. V. Reddy, S. Fung, C. D. Beling
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 67, 4279–4281 (1996)
https://doi.org/10.1063/1.1147579
Published: December 1996
View articletitled, Inexpensive circuit for the measurement of capture cross section of deep level defects in semiconductors
Open the PDF for Inexpensive circuit for the measurement of capture cross section of deep level defects in semiconductors in another window
Journal Articles

A simple and inexpensive circuit for emission and capture deep level transient spectroscopy

Available to Purchase
C. V. Reddy, S. Fung, C. D. Beling
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 67, 257–261 (1996)
https://doi.org/10.1063/1.1147586
Published: January 1996
View articletitled, A simple and inexpensive circuit for emission and capture deep level transient spectroscopy
Open the PDF for A simple and inexpensive circuit for emission and capture deep level transient spectroscopy in another window
Journal Articles

A simple circuit for measuring C–V profiles at kilovolt voltages

Available to Purchase
Michael J. Chudobiak
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 66, 3703–3705 (1995)
https://doi.org/10.1063/1.1145424
Published: June 1995
View articletitled, A simple circuit for measuring C–V profiles at kilovolt voltages
Open the PDF for A simple circuit for measuring C–V profiles at kilovolt voltages in another window
Journal Articles

A novel computer based pseudo‐logarithmic capacitance/conductance DLTS system specifically designed for transient analysis

Available to Purchase
William A. Doolittle, Ajeet Rohatgi
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 63, 5733–5741 (1992)
https://doi.org/10.1063/1.1143356
Published: December 1992
View articletitled, A novel computer based pseudo‐logarithmic capacitance/conductance DLTS system specifically designed for transient analysis
Open the PDF for A novel computer based pseudo‐logarithmic capacitance/conductance DLTS system specifically designed for transient analysis in another window
Journal Articles

Considerations for capacitance DLTS measurements using a lock‐in amplifier

Available to Purchase
F. D. Auret
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 57, 1597–1603 (1986)
https://doi.org/10.1063/1.1138537
Published: August 1986
View articletitled, Considerations for capacitance DLTS measurements using a lock‐in amplifier
Open the PDF for Considerations for capacitance DLTS measurements using a lock‐in amplifier in another window
Journal Articles

Auxiliary circuits for pulse bias and equivalent series resistance measurements with a Boonton 72B capacitance meter

Available to Purchase
Laszlo Gutai
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 57, 463–468 (1986)
https://doi.org/10.1063/1.1138908
Published: March 1986
View articletitled, Auxiliary circuits for pulse bias and equivalent series resistance measurements with a Boonton 72B capacitance meter
Open the PDF for Auxiliary circuits for pulse bias and equivalent series resistance measurements with a Boonton 72B capacitance meter in another window
Journal Articles

Interface circuit between a capacitance meter (PAR 410) and a microcomputer (Apple II)

Available to Purchase
K. Bohlin
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 56, 2147–2150 (1985)
https://doi.org/10.1063/1.1138385
Published: November 1985
View articletitled, Interface circuit between a capacitance meter (PAR 410) and a microcomputer (Apple II)
Open the PDF for Interface circuit between a capacitance meter (PAR 410) and a microcomputer (Apple II) in another window