1-10 of 10
Drude model
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Laser requirements for the design of fast laser-driven semiconductor switches for THz and mm-waves

Free
S. C. Schaub, Z. W. Cohick, B. W. Hoff
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 92, 113106 (2021)
https://doi.org/10.1063/5.0062711
Published: November 2021
View articletitled, Laser requirements for the design of fast laser-driven semiconductor switches for THz and mm-waves
Open the PDF for Laser requirements for the design of fast laser-driven semiconductor switches for THz and mm-waves in another window
Journal Articles

Breakthrough instruments and products: Investigation of atomic layer deposited Al:ZnO layer by spectroscopic ellipsometry from the deep-UV to the mid-IR in one instrument

Open Access
László Makai, Tero Lehto, Bálint Fodor, Peter King
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 92, 119501 (2021)
https://doi.org/10.1063/5.0071638
Published: November 2021
View articletitled, Breakthrough instruments and products: Investigation of atomic layer deposited Al:ZnO layer by spectroscopic ellipsometry from the deep-UV to the mid-IR in one instrument
Open the PDF for Breakthrough instruments and products: Investigation of atomic layer deposited Al:ZnO layer by spectroscopic ellipsometry from the deep-UV to the mid-IR in one instrument in another window
Journal Articles

Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source

Available to Purchase
Akihide Hamano, Seigo Ohno, Hiroaki Minamide, Hiromasa Ito
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 89, 073701 (2018)
https://doi.org/10.1063/1.5025228
Published: July 2018
View articletitled, Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source
Open the PDF for Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source in another window
Journal Articles

Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence

Available to Purchase
Jakub Holovský, Zdeněk Remeš, Aleš Poruba, Daniel Franta, Brianna Conrad, Lucie Abelová, David Bušek
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 89, 063114 (2018)
https://doi.org/10.1063/1.5015988
Published: June 2018
View articletitled, Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence
Open the PDF for Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence in another window
Journal Articles

Plasma mirrors for short pulse KrF lasers

Open Access
Barnabás Gilicze, Angéla Barna, Zsolt Kovács, Sándor Szatmári, István B. Földes
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 87, 083101 (2016)
https://doi.org/10.1063/1.4960089
Published: August 2016
View articletitled, Plasma mirrors for short pulse KrF lasers
Open the PDF for Plasma mirrors for short pulse KrF lasers in another window
Journal Articles

Measurement of ac conductivity of gold nanofilms at microwave frequencies

Available to Purchase
Yin Poo, Rui-xin Wu, Xin Fan, John Q. Xiao
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 064701 (2010)
https://doi.org/10.1063/1.3436450
Published: June 2010
View articletitled, Measurement of ac conductivity of gold nanofilms at microwave frequencies
Open the PDF for Measurement of ac conductivity of gold nanofilms at microwave frequencies in another window
Journal Articles

Variable-wavelength frequency-domain terahertz ellipsometry

Available to Purchase
T. Hofmann, C. M. Herzinger, A. Boosalis, T. E. Tiwald, J. A. Woollam, M. Schubert
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 81, 023101 (2010)
https://doi.org/10.1063/1.3297902
Published: February 2010
View articletitled, Variable-wavelength frequency-domain terahertz ellipsometry
Open the PDF for Variable-wavelength frequency-domain terahertz ellipsometry in another window
Journal Articles

Fabry-Pérot interferometry for microplasma diagnostics

Available to Purchase
H. Hojo, A. Mase
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 77, 10F329 (2006)
https://doi.org/10.1063/1.2351910
Published: October 2006
View articletitled, Fabry-Pérot interferometry for microplasma diagnostics
Open the PDF for Fabry-Pérot interferometry for microplasma diagnostics in another window
Journal Articles

Phase-sensitive lock-in detection of semiconductor waveguide intensity profiles

Available to Purchase
J. F. Holzman, R. Scollo, H.-J. Lohe, F. Robin, H. Jäckel, D. Erni
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 76, 113102 (2005)
https://doi.org/10.1063/1.2126810
Published: November 2005
View articletitled, Phase-sensitive lock-in detection of semiconductor waveguide intensity profiles
Open the PDF for Phase-sensitive lock-in detection of semiconductor waveguide intensity profiles in another window
Journal Articles

Development of a microwave transmission setup for time-resolved measurements of the transient complex conductivity in bulk samples

Available to Purchase
J. M. Schins, P. Prins, F. C. Grozema, R. D. Abellón, M. P. de Haas, L. D. A. Siebbeles
Journal: Review of Scientific Instruments
Rev. Sci. Instrum. 76, 084703 (2005)
https://doi.org/10.1063/1.2008978
Published: August 2005
View articletitled, Development of a microwave transmission setup for time-resolved measurements of the transient complex conductivity in bulk samples
Open the PDF for Development of a microwave transmission setup for time-resolved measurements of the transient complex conductivity in bulk samples in another window