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The 6th International Workshop on X-Ray Optics and Metrology

The International Workshop on X-ray Optics and Metrology (IWXM) has been held every three years as a satellite workshop of the International Synchrotron Radiation Instrumentation (SRI) Conference. It provides a unique platform for X-ray mirror and metrology developers and experts from both industry and synchrotron facilities to present their latest research and products and discuss future directions. Following up on past success, the 6th edition of IWXM was held at the Taiwan Photon Source (TPS), National Synchrotron Radiation Research Center (NSRRC), in Taiwan, on June 6-9, 2018.

Guest Editors: Yu-Shan Huang and Lahsen Assoufid

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Invited Articles
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Development of electroforming process for soft x-ray ellipsoidal mirror Available to Purchase
Takehiro Kume; Yoshinori Takei; Satoru Egawa; Hiroto Motoyama; Yoko Takeo; Gota Yamaguchi; Hidekazu Mimura
https://doi.org/10.1063/1.5057432
Preface
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The 6th International Workshop on X-ray Optics and Metrology—IWXM 2018 Free
Yu-Shan Huang; Lahsen Assoufid
https://doi.org/10.1063/1.5092158
Invited Articles
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Optimization of the size and shape of the scanning aperture in autocollimator-based deflectometric profilometers Free
Ian Lacey; Ralf D. Geckler; Andreas Just; Frank Siewert; Thomas Arnold; Hendrik Paetzelt; Brian V. Smith; Valeriy V. Yashchuk
https://doi.org/10.1063/1.5058710
Invited Articles
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On the characterization of a 1 m long, ultra-precise KB-focusing mirror pair for European XFEL by means of slope measuring deflectometry Available to Purchase
F. Siewert; J. Buchheim; G. Gwalt; R. Bean; A. P. Mancuso
https://doi.org/10.1063/1.5065473
Invited Articles
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High-speed adaptive optics using bimorph deformable x-ray mirrors Open Access
Simon G. Alcock; Ioana-Theodora Nistea; Vivek G. Badami; Riccardo Signorato; Kawal Sawhney
https://doi.org/10.1063/1.5060737
Invited Articles
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Development of a long trace profiler in situ at National Synchrotron Radiation Research Center Available to Purchase
Shang-Wei Lin; Duan-Jen Wang; Huang-Wen Fu; Huang-Ming Tsai; Chih-Yu Hua; Chang-Yang Kuo; Ming-Ying Hsu; Kai-Yang Kao; Gung-Chian Yin; Hok-Sum Fung; Shen-Yaw Perng; Chia-Feng Chang
https://doi.org/10.1063/1.5055634
Invited Articles
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Metrology for optical components of Taiwan Photon Source beamlines Available to Purchase
Duan-Jen Wang; Shang-Wei Lin; Huang-Wen Fu; Hok-Sum Fung; Tai-Yuan Wang
https://doi.org/10.1063/1.5054705
Invited Articles
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Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL Free
M. Thomasset; J. Dvorak; S. Brochet; D. Dennetiere; F. Polack
https://doi.org/10.1063/1.5055284
Invited Articles
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Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometry Available to Purchase
A. Akarid; F. Polack
https://doi.org/10.1063/1.5057742
Invited Articles
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Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source Free
Valeriy V. Yashchuk; Ian Lacey; Gevork S. Gevorkyan; Wayne R. McKinney; Brian V. Smith; Tony Warwick
https://doi.org/10.1063/1.5057441
Invited Articles
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Stitching techniques for measuring X-ray synchrotron mirror topography Available to Purchase
A. Vivo; R. Barrett; F. Perrin
https://doi.org/10.1063/1.5063339
Invited Articles
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Surface shape determination with a stitching Michelson interferometer and accuracy evaluation Available to Purchase
F. Polack; M. Thomasset; S. Brochet; D. Dennetiere
https://doi.org/10.1063/1.5061930
Invited Articles
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Deflectometry encoding the measured angle in a time-dependent intensity signal Available to Purchase
Pablo Pedreira; Josep Nicolas; Igors Šics; Dominique Heinis; Abel Fontserè; Alejandro Crisol; Juan Campos
https://doi.org/10.1063/1.5057768
Invited Articles
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Environmental influences on autocollimator-based angle and form metrology Free
Ralf D. Geckeler; Petr Křen; Andreas Just; Matthias Schumann; Michael Krause; Ian Lacey; Valeriy V. Yashchuk
https://doi.org/10.1063/1.5057402
Invited Articles
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Optimized alignment of X-ray mirrors with an automated speckle-based metrology tool Open Access
T. Zhou; H. Wang; O. J. L. Fox; K. J. S. Sawhney
https://doi.org/10.1063/1.5057712
Invited Articles
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Effective protocol for realizing contamination-free X-ray reflective optics Available to Purchase
Haruhiko Ohashi; Yasunori Senba; Yoshinori Kotani; Takanori Miura; Hikaru Kishimoto; Takahisa Koyama
https://doi.org/10.1063/1.5063262
Invited Articles
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In situ metrology for adaptive x-ray optics with an absolute distance measuring sensor array Open Access
V. G. Badami; E. Abruña; L. Huang; M. Idir
https://doi.org/10.1063/1.5060954
Invited Articles
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Development of a glue-free bimorph mirror for use in vacuum chambers Available to Purchase
Yoshio Ichii; Hiromi Okada; Hiroki Nakamori; Akihiko Ueda; Hiroyuki Yamaguchi; Satoshi Matsuyama; Kazuto Yamauchi
https://doi.org/10.1063/1.5066105
Invited Articles
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Installation and commissioning of the European XFEL beam transport in the first two beamlines from a metrology point of view Available to Purchase
M. Vannoni; I. Freijo-Martin
https://doi.org/10.1063/1.5055208
  • Online ISSN 1089-7623
  • Print ISSN 0034-6748

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