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May 1980
ISSN 0031-9228
EISSN 1945-0699
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Thin‐film formation
Physics Today 33 (5), 26–33 (1980);
https://doi.org/10.1063/1.2914077
The advances made in the last few years are due to developments in four areas: increased demand, new analytic techniques, improved process monitors and controls, and detailed process modelling.
Analysis of thin films and interfaces
Physics Today 33 (5), 34–38 (1980);
https://doi.org/10.1063/1.2914078
Recent advances in analytical techniques let us measure the properties and control the quality of microstructures and let us use them to study novel physical phenomena.
Applications in energy, optics and electronics
Physics Today 33 (5), 40–49 (1980);
https://doi.org/10.1063/1.2914079
One can use thin‐film technologies for heat mirrors, anti‐reflection coatings, interference filters, solar cells, metal contacts, Schottky barriers and Josephson junctions.
Applications of metallurgical coatings
Physics Today 33 (5), 50–55 (1980);
https://doi.org/10.1063/1.2914080
The surface of a coated material can possess structure and properties quite different from those of the bulk material, thus allowing components to be individually tailored for specialized needs.
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Lindsay McKenzie; Hannah Daniel
Another Fowler
Peter J. Turchi
Wu, Shaknov, and the EPR dilemma
Peter W. Milonni