Focus on nanoscience and nanotechnology Free

An atomic force microscopy technique incorporating electronics and proprietary AFM probe technology is now available for integration with Asylum Research’s MFP-3D and Cypher AF microscopes. The technique, scanning microwave impedance microscopy (sMIM), was developed by PrimeNano. It enables nanoscale mapping of permittivity and conductivity with high sensitivity and resolution on any material, including conductors, semiconductors, and insulators. Most conventional nanoelectrical AFM modes are limited to measuring either resistance or capacitance and require laborious sample preparation. Asylum claims that sMIM improves on those technologies because it senses sample variations in both conductivity (resistance) and permittivity (capacitance) while needing only minimal preparation. Those attributes also make sMIM applicable to a broader range of samples, including ferroelectrics, piezoelectrics, and low-dimensional nanomaterials. Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, http://www.asylumresearch.com

Attocube’s new photonic probe station is a compact, stable, easy-to-use tabletop setup for nanophotonic device characterization. It combines two optical fiber probes and a free optical-beam confocal microscope. The lensed fibers are used as plane lightwave-coupling waveguides in and out of the sample. Each fiber probe features three individual degrees of freedom (5 mm³). Aligned with the waveguide structure, the sample can be independently positioned under the perpendicular confocal microscope within a range of 10 × 15 mm. That allows the sample surface to be probed and the light to be coupled to out-of-plane photonic structures. The photonic probe station can be combined with attocube’s attoDRY700 tabletop cryostat for convenient characterization of photonic nanostructures in a temperature range from 3 K to 300 K. attocube systems AG, Königinstrasse 11a, 80539 Munich, Germany, http://www.attocube.com

Micromirror total internal reflection fluorescence (TIRF) microscopy is the only proven method for studying the ordered assembly and function of multicomponent biomolecular machines. The MicroMirror TIRF system from Mad City Labs uses through-the-objective excitation, but it replaces the dichroic mirror used in conventional TIRF systems with two broadband micromirrors positioned at the back aperture of the objective lens. According to the company, eliminating the dichroic mirror leads to superior signal-to-noise ratios and simplifies the introduction of multiple spectral lines to experiments. The MicroMirror TIRF system has been used to study biomolecular systems that incorporate three or more laser lines, which can be difficult to accommodate in conventional dichroic TIRF instruments. Motion is controlled by an xy micropositioning platform and an integrated xyz closed-loop nanopositioning system that uses proprietary sensors for subnanometer precision and high stability. Mad City Labs Inc, 2524 Todd Drive, Madison, WI 53713, http://www.madcitylabs.com

According to Oxford Instruments, its new detector for transmission electron microscopes (TEMs) has the highest sensitivity in silicon drift detector (SDD) technology. The X-Max^N 100TLE is designed for field emission and aberration-corrected TEM users working in nanoscience. It has a 100-mm² sensor, a windowless configuration, and a novel mechanical design that delivers ultrahigh solid angles. The detector is sensitive for all elements, especially low-energy x rays. For example, the effective solid angle is 12 times greater than a traditional 30-mm² SDD for N Kα x rays. Users will therefore be able to detect much lower concentrations of elements such as impurities and dopants at the nanoscale. Another benefit is that more data can be collected before the beam degrades sensitive samples. Oxford Instruments plc, Tubney Woods, Abingdon, Oxfordshire, OX13 5QX, UK, http://www.oxford-instruments.com

Physik Instrumente has introduced the LPS-22 series of economical, miniaturized positioning stages driven by compact piezo-inertia motor drives. Linear and rotation stages are available in open- and closed-loop designs and with travel ranges of ¼ inch, ½ inch, and 1 inch. With dimensions as small as 22 × 22 × 10 mm, the LPS-22 is one of the smallest precision linear stages available. Open-loop and encoder-equipped versions enable resolution down to 1 nm. The optimized piezo motor drive allows for push and pull forces to 3 N (½ pound) and velocity to 10 mm/s. The stages can be combined into xy units, and rotation can be added with the company’s new rotation piezo stages. The ultralow-profile rotators are available with diameters of 14 mm, 22 mm, and 32 mm and have a profile height as low as 7 mm. No adapter plates are required for mounting. Physik Instrumente LP, 16 Albert Street, Auburn, MA 01501, http://www.physikinstrumente.com

Anasys Instruments has introduced the nanoIR2, an IR spectroscopy platform based on atomic force microscopy (AFM). The system combines the nanoscale spatial resolution of a full-featured atomic force microscope with IR spectroscopy’s excellence in chemical characterization and identification. Because the nanoIR2 can operate with top-side illumination, there is no need to prepare samples on a zinc selenide prism. Additionally, measurements can be made on diverse samples. AFM-IR measurements have been demonstrated on semiconductor devices, thin films, nanocomposites, data storage samples, and tissue sections. The nanoIR2 provides a new resonance-enhanced mode that increases the sensitivity of the technique and enables AFM-IR measurements on samples of sub-20 nm in thickness. Anasys Instruments Corporation, 325 Chapala Street, Santa Barbara, CA 93101, http://www.anasysinstruments.com

Piezosystem jena now offers a three-axis positioning element, the Tritor 320 CAP. The new actuator was developed using finite element modeling technology to create accurate, dynamic positioning for large loads. Hinge flexure construction yields friction-free movement. Capacitive sensors allow the system to achieve excellent precision, which results in high reproducibility, linearity, and stability. The Tritor 320 CAP is suitable for applications in semiconductor technology, surface analysis, and mask inspection. Features include load handling up to 200 N, 1-nm resolution in closed-loop operation, and motion up to 320 µm. An aperture of 150 × 150 mm is available on request. The system can be adjusted for vacuum and low-temperature applications. piezosystem jena Inc, 2B Rosenfeld Drive, Hopedale, MA 01747, http://www.piezo-usa.com

Agar Scientific has added ultrathin graphene oxide support films to its range of transmission electron microscopy (TEM) accessories. The company claims that GO provides a support film that is thinner but of higher mechanical strength and electrical and thermal conductivity than films made from other materials. Supported on holey and lacey carbon and Quantifoil films, the hydrophilic films are suitable for imaging small nanoparticles, nanowires, and suspensions. Their low atomic number and thin-layer thickness result in lower background contrast than conventional supports. They can also be used in cryo-TEM studies. Because the vitreous ice layer can be very thin on GO support films, they can provide high contrast and thus high resolution for structural determination. Agar Scientific, Elektron Technology UK Ltd, Unit 7, M11 Business Link, Parsonage Lane, Stansted, Essex CM24 8GF, UK, http://www.agarscientific.com

Craic Technologies has designed FilmPro film-thickness measurement software for use with the company’s microspectrophotometers and controlling Lambdafire software. It allows users to measure the thickness of thin films rapidly and nondestructively by either transmission or reflectance. Able to analyze films of many materials on both transparent and opaque substrates, FilmPro permits users to measure thin films on semiconductors, MEMS devices, disk drives, flat-panel displays, and more. Sampling areas can range from more than 100 µm across to less than a micron. FilmPro incorporates easily modified processing recipes, the ability to create new film recipes, and data analysis tools. Craic Technologies Inc, 948 North Amelia Avenue, San Dimas, CA 91773, http://www.microspectra.com

Agilent Technologies has announced the 7500 atomic force microscope (AFM), an advanced instrument for nanoscale measurement, characterization, and manipulation. It achieves atomic resolution imaging with a 90-µm AFM closed-loop scanner and offers excellent environmental and temperature control. The 7500 AFM is suitable for applications in materials and polymer science, life sciences, electrochemistry, electrical characterization, and nanolithography. Several AFM imaging modes are supported by the system’s standard nose cone, which is easily interchanged with specialized nose cones that can extend the microscope’s capabilities. Agilent Technologies Inc, 5301 Stevens Creek Boulevard, Santa Clara, CA 95051, http://www.agilent.com

Carl Zeiss has added a nanotomography system for materials and life sciences to its Crossbeam series. The focused ion-beam column enables fast, precise materials processing that can be observed in real time with the field emission scanning electron microscope. The system achieves high resolution over the entire voltage and current range. Materials scientists can benefit from excellent 3D analytics, the ability to image magnetic and nonconductive specimens with maximum resolution, and the high materials contrast. Bioscientists can use Crossbeam for fast tomography series with high z resolution in cell and tissue biology. The microscope system is available in two versions. The Gemini I VP (variable pressure) column of Crossbeam 340 offers optimal analysis conditions for in situ experiments with outgassing and charging specimens. The Gemini II column with its double condenser system gives Crossbeam 540 users more information in a shorter time. Carl Zeiss Microscopy GmbH, Carl Zeiss Promenade 10, 07745 Jena, Germany, http://corporate.zeiss.com

Optofluidics has made available a novel nanoparticle analysis and manipulation system called the NanoTweezer. The new system captures, manipulates, and analyzes individual nanoscale objects, including protein aggregates, viruses, bacteria, and inorganic nanoparticles, in high numbers. With its proprietary nanophotonic waveguide technology, the NanoTweezer measures the most important nanoparticle properties, including size, shape, and coating quality. A plug-and-play attachment to standard microscopes, the system guides laser light into tiny waveguides within a flow cell. The light emanating from the waveguides acts like a tractor beam that captures and illuminates nanoparticles. Applications include single-particle spectroscopy (including Raman), coating measurements, shape and pigment analysis, and submicron particle imaging. Optofluidics Incorporated, 3711 Market Street, Suite 970, Philadelphia, PA, 19104, http://optofluidicscorp.com

The nProber II from DCG Systems is a new nanoprobing system for characterizing transistors and interconnects in semiconductor devices manufactured at advanced design nodes. To help accelerate technology development, maximize yield, and diagnose reliability issues, the nProber II offers automation enhancements and up to 40% throughput improvement over its predecessor, the nProber. A new probe positioner and nanopositioner drive the control system, which employs proprietary low-drift technology to improve probe landing and contact stability for the eight probes. Live imaging permits users to verify the sample and probe condition in real time and visually ensure that the correct device is probed. Computer-aided design navigation software enables the nProber II to quickly locate and move to the area of interest with better than 50-nm accuracy. DCG Systems Inc, 3400 West Warren Avenue, Fremont, CA 94538, http://www.dcgsystems.com