The descriptions of the new products listed in this section are based on information supplied to us by the manufacturers. Physics Today can assume no responsibility for their accuracy. For more information about a particular product, visit the website at the end of the product description.
Raman spectrometer
PerkinElmer has introduced the RamanStation 400, a benchtop Raman spectrometer that uses dispersive echelle-spectrograph technology to allow reliable performance without the need for moving parts and enable detection of the full spectral range (95–3500 cm−1) at high resolution in a single acquisition. The new instrument can perform rapid mapping, which permits the visualization of the distribution of chemical species across a sample surface. The RamanStation 400 allows large numbers of spectra to be quickly acquired—providing large maps in a few hours—and includes a range of clip-in sampling accessories and associated drop-in sample holders. The company's Insight software enables Raman maps to be easily manipulated and analyzed. The spectrometer is available with a flexible fiber-optic probe. PerkinElmer Life and Analytical Sciences Inc, 940 Winter Street, Waltham, MA 02451, http://www.perkinelmer.com
X-ray fluorescence analyzer
SPECTRO Analytical Instruments has announced the SPECTRO iQ II, the next generation of x-ray fluorescence (XRF) spectrometry instruments. Compared with the company's earlier SPECTRO iQ, the new version is easier to operate, with a software control interface that allows users to add an optional touchscreen to start, monitor, evaluate, and document the analytical processes with only a few commands. The iQ II incorporates a new detection system—a silicon drift detector unit—which is technically derived from the larger and more powerful SPECTRO XEPOS XRF instrument. The new detector offers a higher spectral resolution and lower detection limits for numerous elements, leading to measurements with higher accuracy and reproducibility. SPECTRO Analytical Instruments GmbH, Boschstrasse 10, 47533 Kleve, Germany, http://www.spectro.com
Field emission analytical SEM
The JSM-7001F from JEOL is a new thermal field emission analytical scanning electron microscope (SEM) that acquires high-resolution micrographs at up to 1 million times magnification. The instrument has applications ranging from semiconductors, metals, and minerals to nonconductive biological samples. The JSM-7001F can be configured for both high- and low-vacuum operation and features an in-lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kilovolts and high current is optimal for characterization of nanostructures with a resolution of 1.2 nm at 30 kV. The large specimen chamber, designed for samples up to 200 mm in diameter, simultaneously accommodates a wide variety of detectors. The SEM comes with a choice of three stage sizes and exchange chambers and a new five-axis automated stage. JEOL USA Inc, 11 Dearborn Road, Peabody, MA 01960, http://www.jeolusa.com
Laser-induced breakdown spectrometer
Ocean Optics has released the LIBS2500, the next-generation laser-induced breakdown spectroscopy (LIBS) system that incorporates up to seven high-resolution spectrometers for spectral coverage as broad as 200–980 nm. The instrument features a sensitivity of 10–50 ppm; a series of 2048-element, linear CCD detectors; and a seven-fiber optical sampling probe. Integral application software fires the laser and identifies the element being analyzed; it provides reference correlation by spectral line, time-dependent analysis, and line tracking over multiple samples. In addition, the software enables users to control the exact time of sampling during plasma decay. Accessories include the LIBS imaging module that allows users to adjust the laser to focus on the sample's region of interest. Ocean Optics Inc, 830 Douglas Avenue, Dunedin, FL 34698, http://www.oceanoptics.com
Microscope inspection system
J micro Technology's NAT-31 42X-540X is a microscope inspection system for microprobing. Based on high-clarity zoom optics and a USB 2.0 digital camera, it resolves features of 1 µm or less when added to the company's probe station, with which it can be used to find and inspect abnormalities on wafers or devices. The NAT-31 system zoom optics has a 0.7 x to 4.5 x objective lens that provides magnification of 42x to 270 x for probe placement and device-under-test alignment with the standard 0.5x auxiliary lens. There is a long working distance of 108 mm for the 540x optics and 189 mm for the 270x option. The camera has 1280 ×1024 resolution and onboard video processing to deliver outstanding image quality and provides a progressive scan of 1.3 megapixels with 30-bit color depth and red-green-blue capture. J micro Technology Inc, 3744 Northwest Bluegrass Place, Portland, OR 97229, http://www.jmicrotechnology.com
Testing nanodevices
Omicron NanoTechnology has developed the UHV NANOPROBE, designed for the local, nondestructive electrical testing of semiconductor and biomolecular nanodevices. The instrument has up to four independent scanning probe microscopes, capable of atomic scale resolution. The SPMs are combined with scanning electron microscope imaging to allow the simultaneous navigation of each SPM probe tip. This enables a large field of view for probe coarse positioning as well as fine positioning and rapid localization of nanometer-sized structures with the SEM's high-resolution capabilities. The UHV NANOPROBE incorporates a specially designed ultrahigh vacuum system, has a stage mounted on an external xy manipulator, and is optimally damped. It is available in single-chamber (S model) and dual-chamber (XP) versions. Omicron NanoTechnology USA, 14850 Scenic Heights Road, Suite 140, Eden Prairie, MN 55344, http://www.omicron-instruments.com
Near-IR analyzer
Malvern Instruments has introduced the SyNIRgi, a new NIR chemical imaging product based on the Spectral Dimensions Sapphire/NIRCI-2450 platform. The standard version will generate in minutes 81 920 NIR spectra from a 13 × 10 mm sample area; the two available wavelength ranges are 1200–2450 nm and 950–1720 nm. The shorter spectral range allows NIR imaging with a greater penetration depth and is well suited for imaging large fields of view and assessing the microcharacteristics of samples that consist of spatially complex arrangements of chemical species. For applications that require only a few wavelengths, collection of data at just those wavelengths can be achieved in seconds, with no loss of performance. The company's ISys software provides a suite of multivariate and statistical methods for analyzing the NIR chemical images. Malvern Instruments Inc, 10 Southville Road, Southborough, MA 01772, http://www.malvern.com
Laser energy sensors
Coherent has announced the new Multipurpose EnergyMax series of laser energy sensors, pulse energy detectors intended for use with a wide range of lasers operating in the sub-1 kHz repetition-rate domain. The sensors feature a broad wavelength coverage of 190 nm–12 µm and can measure pulse energies from 300 nJ to 2 J of lasers operating from a single shot to 1 kHz. Six models of the detectors are available, including low-energy range sensors for 300–500 nJ pulses in 10-, 25-, and 50-mm diameters, and high-energy models that cover 10 µJ–2 J in the same sizes. All units incorporate the company's MaxBlack coating, which is said to offer better damage resistance and mechanical durability characteristics compared with black paints. Spectral compensation and temperature compensation factors are provided. Coherent Inc, 5100 Patrick Henry Drive, Santa Clara, CA 95054, http://www.coherent.com
Plasma monitor
The EQP II plasma monitor from Hiden Analytical is designed for characterization and optimization of diverse plasma-related processes. The system directly measures mass and energy of both positive and negative process ions. Its integral electron bombardment ion source allows users to analyze neutrals and, with the addition of the electron attachment mode, to separate and identify electronegative radical species. The fast pulse ion counting detector, with submicrosecond resolution and repetition rates to 20 kHz, enables time-resolved studies. Compared with the earlier EQP version, the EQP II features a new high-sensitivity detector, programmable signal gating, fast data acquisition of up to 500 measurements/s, and an atmospheric plasma sampling system with integrated molecular beam chopper. Hiden Analytical Inc, 37699 Schoolcraft Road, Livonia, MI 48150, http://www.hideninc.com
High-resolution microscope
Michelson Diagnostics has released the EX1301 OCT microscope to enhance cancer diagnosis and treatment. The device uses optical coherence tomography to provide real-time images of subsurface tissue at near-cellular resolution without tissue removal—an optical biopsy. Sequential images and samples are saved automatically, as are all raw data for future analysis. The microscope incorporates the company's MultiBeam-OCT optics for image capture, a 1.3-megapixel context camera to pinpoint location of the OCT scan, and a live image zoom and pan. The EX1301 features an imaging wavelength of 1300 nm, an image capture time of 0.05 s, a subsurface imaging depth of 2 mm, and axial and lateral optical resolutions of better than 10 µm. Michelson Diagnostics Ltd, 11A Grays Farm Production Village, Grays Farm Road, Orpington, Kent BR5 3BD, UK, http://www.md-ltd.co.uk
Cooled cameras
Imperx's TEC series of thermoelectrically cooled cameras control thermal noise in the CCD sensor—the noise is decreased by 3 dB for every 6 °C drop in temperature—which allows operation with long exposure times and greater pixel-to-pixel accuracy. The TEC series are available in either monochrome or color configuration, including 8-, 10-, or 12-bit pixel data under software control; three models offer 4-, 11-, and 16- megapixels of resolution in a standard housing. Electronic shutter control features include pre-exposure and double exposure and speeds as fast as 0.08 ms to as long as 10 s. Users can also control the image output, frame rate, analog and digital sensor gain and offset, and image area-of-interest. As an option, automatic iris control is available. Imperx Inc, 6421 Congress Avenue, Suite 204, Boca Raton, FL 33487, http://www.imperx.com
Controlled apertures and slits
McPherson has developed thermally controlled aperture and slit systems to measure and tune specific wavelengths of the electromagnetic spectrum down into the highly energetic regions of nanometers. The new systems are intended for use on third-generation synchrotron storage rings and where extreme localized heating is encountered. The direct thermal relief of aperture blades guarantees maintenance of calibrated openings. Manipulation and adjustability from 5 µm to 10 mm and aperture blade length of up to 65 mm can accommodate a wide range of applications. Apertures and blades can be supplied in electrically isolated designs for closed-loop beam positioning. The units can be equipped with view ports, visualizing screens, beam current monitors, and translation stages. McPherson Inc, 7A Stuart Road, Chelmsford, MA 01824, http://www.mcphersoninc.com
See www.pt.ims.ca/12309-142
