Focus on Laboratory Equipment

Hiden Analytical has developed a new range of quadrupole mass spectrometers specifically for molecular beam studies in high- and ultrahigh-vacuum environments. The model 3F series incorporates a so-called cross beam ion source. In this arrangement, a section of the molecular beam is allowed to pass through the ionization region of an electron impact ion source. Instruments are available in 100-, 200-, and 300-atomic mass units ranges. The 300-amu range suits many requirements and there are options to 2500 amu. To improve the mass discrimination of the 3F in all ranges, a three-section mass filter is used; the mass resolution and sensitivity of the 3F can be controlled from the front-panel keyboard. Hiden Analytical Inc, 75 Hancock Road, Suite H, Peterborough, New Hampshire 03458-1100, http://www.hidenanalytical.com

Circle number 181 on Reader Service Card

Pfeiffer Vacuum has introduced the QualyTest Component (QTC) helium leak detector, a modular apparatus designed to be integrated into automated assembly and test systems. The leak detector is equipped with a turbo-drag pump packaged in a unique housing that permits the direct flow of helium into the analyzer cell, which in turn results in quicker response, fast recovery time, and high sensitivity. The QTC provides repeatable and stable leak-rate measurements from 5 × 10⁻¹¹ up to 0.2 std-cc/s and a maximum test pressure of 15 torr. It can be controlled via standard field bus protocols, RS-232, RS-485, and digital I/O and incorporates various analog voltage outputs that correspond to leak rate. Available options include a built-in calibrated leak, and an automated sniffer control. Pfeiffer Vacuum Inc, 24 Trafalgar Square, Nashua, New Hampshire 03063-1988, http://www.pfeiffer-vacuum.com

Circle number 182 on Reader Service Card

LEO Electron Microscopy has announced a new series of Ultra field emission scanning electron microscopes (FESEM) that provide ultrahigh resolution topographic and compositional imaging combined with an analytical specimen chamber. The Ultra incorporates an energy and angle-selected back-scattered electron detector (denoted EsB), which is positioned in the electron optical column directly above the existing in-lens SE detector. The SE is used for clear imaging of surface details with secondary electrons, while the EsB detector is used to give compositional information about the specimen surface. The latter features an integrated filtering grid that prevents secondary electrons from entering the EsB detector while enabling high-resolution images of charging specimens. LEO Electron Microscopy Inc, One Zeiss Drive, Thornwood, New York 10594, http://www.leo-usa.com

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Ambios Technology has added an extended vertical scan range capability to its XP series stylus profilometers, which are designed for precision step height, thin film stress, film thickness, and surface roughness measurements. The new 400-µm z-range offering—compared to the 100-µm maximum vertical range of the XP-1 and XP-2 systems—makes the profilometers ideal for surface measurements from nanometers to micrometers. The extended range enables the measurements of large steps on samples such as MEMS devices, thick-film hybrid semiconductor circuits, glass substrates, micro-lenses and other optical wave guides, precision machined surfaces, and polymers. The vertical resolution of the XP series is specified as 0.15 nm at 10 µm, 1.5 nm at 100 µm, and 6.0 nm at the 400-µm vertical scan range. Ambios Technology Inc, 303 Portrero Street, Suite 42-303, Santa Cruz, California 95060, http://www.ambiostech.com

Circle number 184 on Reader Service Card

Bohlin Instruments has developed rectangular torsion fixtures for its Gemini and C-VOR rheometers. The fixtures are designed to accept a solid sample with a free length of 50 mm, a width to 13 mm, and a thickness to 10 mm. They can be used in conjunction with the company’s forced-gas oven to enable the characterization of dynamic properties, such as loss and storage moduli, over a wide temperature and frequency range. The capability to measure larger sample sizes is of particular use for samples containing small particles of aggregate in which bulk property determination is of interest. The fixtures are spring-loaded with adjustable clamping pressure that can be reproducibly set with a pre-set torque driver, and offer the ability to remotely load and align the sample within the clamps. Bohlin Instruments, 11 Harts Lane, Suite 1, East Brunswick, New Jersey 08816, http://www.bohlin.com

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The DM Digital Microscope series from Leica Microsystems includes the DM4000 M, designed to deliver optimized imaging by selecting the objective, filter, and contrast method. All aspects of the light path are automatically adjusted to the user’s preferred settings. Innovations include the Fluorescence Intensity Manager, which sets the fluorescence illumination so that the specimen is preserved to the greatest possible extent; the company’s Constant Color Intensity Control that assures complete color balance; a focus finder that provides easy focusing of highly reflective, polished surfaces; and a 1.25× overview objective for rapid scanning. The DM4000 M features the Ergotube with which the user can adjust the view for individual comfort. Leica Microsystems Inc, 2345 Waukegan Road, Bannockburn, Illinois 60015, http://www.leica-microsystems.com

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Renishaw’s new structural and chemical analyzer combines the capabilities of scanning electron microscopy (SEM) with Raman, photoluminescence (PL), and cathodoluminescence (CL) spectroscopies. SEM provides the means to visualize samples with high spatial resolution and large depth of field, while Raman, PL, and CL measurements offer chemical, physical, electronic, and structural information. Fully retractable optics, inserted between the SEM’s objective lens and the sample, precisely position a micrometer-sized laser spot while retaining the capability to view the sample via secondary electron imaging, and analyze it using energy dispersive spectroscopy. The collection optics are also suitable for PL and CL studies. Renishaw Inc, Spectroscopy Products Division, 5277 Trillium Boulevard, Hoffman Estates, Illinois 60192, http://www.renishaw.com

Circle number 187 on Reader Service Card

Sigma Instruments has introduced the model SQC-222, a thin-film deposition controller for multilayer co-deposition of up to four materials. The basic instrument monitors two quartz crystal sensors and provides two proportional-integral-derivative (PID) control outputs. Eight digital inputs, eight relay outputs, and two RS-232 ports provide flexible process control. The SQC-222 allows each source material to be monitored by a single sensor or by multiple sensors. Outputs can be mapped to any inputs and can be configured as PID source control outputs or recorder outputs. Up to 25 processes, 400 layers, 25 films, and two rate ramps per film can be created and stored in the SQC-222. A process simulate mode allows the user to develop and test processes at the instrument, offline, or on a PC. Sigma Instruments, 120 Commerce Drive, Unit 1, Fort Collins, Colorado 80524, http://www.sig-inst.com

Circle number 188 on Reader Service Card

Micro Photonics has announced the Millbrook MiniSIMS, a secondary ion mass spectrometer with the high-sensitivity trace-element detection features of the SIMS technique in a compact desktop instrument. The MiniSIMS has three modes of detection. In static SIMS, for surface analysis, a high-energy ion beam is focused onto a sample and then the mass spectrum of the resulting secondary ions is analyzed; all elements can be detected in this way. In imaging SIMS, for spatial analysis, the ion beam is scanned over the sample surface to build an image showing the distribution of any species. Dynamic SIMS, for depth analysis, uses an ion beam to etch away surface layers in a small area and thus enables the SIMS spectrum to reveal the composition of the subsurface region. Micro Photonics Inc, P.O. Box 3129, Allentown, Pennsylvania 18106-0129, http://www.microphotonics.com

Circle number 189 on Reader Service Card

The FIA-SIA-LOV Sequential Injection Analyzer from Ocean Optics combines a computer-controlled six-position valve, precision syringe pump, and a spectrophotometric flow cell in a system that can automate virtually any wet-chemistry laboratory procedure. Software is used for control procedures to sequence through sample dilution, addition of reagents, and mixing and routing of the sample through the flow cell for continuous- or stopped-flow measurements. The FIA-SIA-LOV is compatible with Ocean Optics spectrometers, light sources, and optical fibers for dynamic spectral analyses of optical absorbance or fluorescence of fluids. The analyzer, developed by FIALab Instruments, also offers multichannel, multiassay flexibility. Ocean Optics Inc, 380 Main Street, Dunedin, Florida 34698, http://www.oceanoptics.com

Circle number 190 on Reader Service Card

BURLE Electro-Optics has introduced Resistive Glass products, manufactured from a proprietary lead silicate glass that has been doped to produce a resistive surface. The resistivity can be varied across three orders of magnitude in order to optimize current flow and electric field strength. Nichrome and gold electrodes are available on the glass surfaces, which can be applied to a wide variety of shapes and sizes. With an operating temperature range of −20°C to +400°C, these resistive glass products are suitable for such applications as ion guides, voltage dividers, conversion dynodes, ion mirrors, reflection lenses, and drift tubes for ion mobility spectrometers. BURLE Electro-Optics Inc, Sturbridge Business Park, P.O. Box 1159, Sturbridge, Massachusetts 01566-1159, http://www.burle.com

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Radio Frequency Company’s Macrowave RF Drying System provides a means for rapidly drying temperature-sensitive materials such as filter cake and granular pelletized materials. The system uses volumetric heating, which keeps the temperature uniform throughout the material. Volumetric heating removes water from material at bed depths up to 6 inches and reduces the moisture content to levels as low as 20 ppm. It is said to eliminate the long dwell time required by conventional surface-heating methods, and thereby provide a suitable replacement for tumble-, spray-, tray-, spin-flash, and belt/tunnel-dryers. The Macrowave system applies radio waves at a frequency of 40.68 MHz. Radio Frequency Co Inc, 150 Dover Road, Millis, Massachusetts 02054, http://www.radiofrequency.com

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Applied Multilayers is offering the CFM series of optical coating equipment, which uses an advanced reactive sputtering technology. The new coaters incorporate a closed field process to sustain an intense plasma in which the reactive sputtering takes place. This low-temperature deposition process requires no auxiliary ion or plasma source. The CFM coaters use up to six linear magnetrons and offer drum substrate carriers with diameters from 35 to 75 cm. The coaters can produce dense and optically stable thin films of metal oxides, metal nitrides, and many other materials likely to be used in modern optical coatings. Multilayer thickness is computer controlled on a time basis, although quartz crystal and optical monitoring are available. Applied Multilayers Ltd, 10 The Courtyard, Stenson Road, Coalville, Leicestershire LE67 4JP, UK, http://www.applied-multilayers.com

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GAMMEX has updated its radiation oncology line with the RBA-9 Radiation Beam Analyzer, which verifies photon and electron beam flatness and symmetry. In one setup and exposure, the RBA-9 checks for constancy of energy and dose monitor calibration, confirms beam homogeneity in multiple planes, and ensures correspondence between light and radiation fields. It also verifies laser line and cross coincidence and calculates short-term energy stability. The analyzer produces specialized measurements during installation and acceptance testing; it checks beam consistency with head and gantry rotation and the treatment machine beam steering system. The RBA-9 can be connected to a computer via an RS-232 port. GAMMEX rmi, P.O. Box 620327, Middleton, Wisconsin 53562-0327, http://www.gammex.com

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A new 100-page Fall 2003 reference catalog, “Scientifics,” from Edmund Scientific features more than 2000 products. These include optics, microscopes, telescopes, biomedical and weather instruments, lasers, magnets, binoculars, magnifiers, and more. Scientifics, 60 Pearce Avenue, Tonawanda, New York 14150-6711, http://www.scientificsonline.com

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Cole-Parmer has published a 2003-2004 Catalog Supplement with more than 2000 products for applications in food manufacturing, fluid handling, industrial technology, biotechnology, chemical processing, pharmaceuticals, and more. Cole-Parmer Instrument Co, 625 East Bunker Court, Vernon Hills, Illinois 60061-9872, http://www.coleparmer.com

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A 100-page catalog of industrial ovens and furnaces is available from The Grieve Corp. Included are a line of laboratory, bench, cabinet, truck, walk-in, and conveyor ovens; clean-room and pharmaceutical ovens; and furnaces to 2700°F. The Grieve Corp, 500 Hart Road, Round Lake, Illinois 60073-9989, http://www.grievecorp.com

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