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October 01 2000

Christoph Heiden

Alex Braginski;

Alex Braginski

Institute for Thin Film and Ion Technology, Jülich, Germany

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John Clarke;

John Clarke

University of California, Berkeley

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Michael Mück

Michael Mück

University of Giessen, Giessen, Germany

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Physics Today 53 (10), 104–105 (2000);

https://doi.org/10.1063/1.1325212