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January 01 2000

X‐Ray Scattering from Soft‐Matter Thin Films: Materials Science and Basic Research

Metin Tolan;

Metin Tolan

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Michael D. Ward

Michael D. Ward

Reviewer

University of Minnesota, Minneapolis, Minnesota

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Physics Today 53 (1), 58 (2000);

https://doi.org/10.1063/1.882947