The Unity detector from Oxford Instruments enables a new imaging technique called BEX in scanning electron microscopes. According to the company, Unity is the first detector that features backscattered-electron (BSE) and x-ray imaging sensors within one detector head located under the microscope pole piece. Topographic, crystallographic, atomic number, and elemental information are combined in an immediate full-color, high-resolution visual output. Accurate chemical mapping of whole samples is provided in minutes; users can quickly identify features and regions that warrant further investigation. The novel operating position for the x-ray sensors allows consistent chemical data to be acquired across a wide range of working distances. The BSE sensors are custom shaped to maximize signal collection and Peltier cooled for enhanced sensitivity. The company says the Unity detector can increase microscope productivity by up to 100-fold. Oxford Instruments Nanoanalysis, Halifax Rd, High Wycombe HP12 3SE, UK, https://nano.oxinst.com
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