Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction, RolfErniImperial College Press, London, 2010. $88.00 (354 pp.). ISBN 978-1-84816-536-6

Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction is a discussion of the successful approaches that have emerged in the past few years for correcting spherical aberration and the higher-order electron-optic aberrations that remain when spherical aberration is eliminated. “Microscopists who used to deal with spherical aberration and defocus have started to adopt the optical concepts which were previously mostly relevant for experts working in electron optics,” says author Rolf Erni, who heads the Electron Microscopy Center of the Swiss Federal Laboratories for Materials Testing and Research in Zürich.

In 1936 Otto Scherzer proposed his famous theorem: For stationary, round electron lenses that are free of charges, the constant of spherical aberration, C3, and the constant of chromatic aberration, Cc, are positive finite. Positive...

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