Since its invention in 1986, the atomic force microscope has found widespread application by researchers who desire images of surfaces at length scales from tens of microns down to atomic distances. Commercial AFMs (and much more, customized, laboratory-built ones) can probe unprepared or minimally prepared samples under ambient conditions, in liquids, and in ultrahigh vacuum at temperatures from 1 K up to hundreds of kelvin above room temperature. But despite the AFM's relative ease of use, achieving optimum results requires a good knowledge of its operational principles. As a frequent AFM user, I've been often asked, "Is there a book you would recommend for students who are new to AFM techniques?" For a long time there wasn't, but now there's Atomic Force Microscopy by Peter Eaton and Paul West.
Of course, many other AFM-related books have been written, but they are either edited books in thematic series, books that focus...
