Advanced Light Microscopy, Vol. 3: Measuring Techniques

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February 01 1995

Maksymilian Pluta;

Maksymilian Pluta

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Richard E. Bisbing

Reviewer

McCrtme Associates Inc, Westmont, Illinois

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Physics Today 48 (2), 56 (1995);

https://doi.org/10.1063/1.2807914

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