Over the past seven or eight years, we have witnessed the development of a host of new tools for analyzing the atomic structures of surfaces. The quantitative structural information provided by these new tools has already contributed greatly to our understanding of the electronic, vibrational and chemical properties of surfaces. Through the continuing innovation of surface scientists all over the world, new and improved spectroscopies and microscopies are being invented and brought on line every year. The scanning tunneling microscope, which has an unprecedented ability to map the three‐dimensional topography of surfaces, is just one recent example. (See PHYSICS TODAY, April 1982, page 21.)

1.
For general references on surface spectroscopy, see J. Demuth, P. Avouris, PHYSICS TODAY, November 1983, page 62.
2.
P. H.
Citrin
,
P.
Eisenberger
,
R. C.
Hewitt
,
Phys. Rev. Lett.
41
,
309
(
1978
).
3.
P.
Eisenberger
,
W. C.
Marra
,
Phys. Rev. Lett.
46
,
1081
(
1980
).
4.
I. K.
Robinson
,
Phys. Rev. Lett.
50
,
1145
(
1983
).
5.
T. L. Einstein, R. L. Park in Extended X‐Ray Absorption Fine Structure, R. W. Joyner, ed., Plenum, New York (1984).
6.
L. C. Feldman in Chemistry and Physics of Solid Surfaces, R. C. Vanselow, ed., volume 3, CRC Press, Boca Raton (1981).
7.
M. J. Drinkwine, D. Lichtman in Progress in Surface Science, S. G. Davisson, ed., Pergamon, New York (1977).
8.
T. E. Madey, F. P. Netzer, J. E. Houston, D. M. Hanson, R. Stockbauer in Desorption Induced by Electron Transitions, Diet 1, N. H. Tolk, M. M. Traum, J. C. Tully, T. E. Madey, eds., Springer‐Verlag, New York (1983).
9.
See, for example, E. W. Müller, T. T. Tsong, Field Ion Microscopy: Principles and Applications, Elsevier, New York (1969).
10.
E. Eastman, F. J. Himpsel, PHYSICS TODAY, May 1981, page 64.
11.
J. W.
Davenport
,
Phys. Rev. Lett.
36
,
945
(
1976
).
12.
S.
Lehwald
,
J. M.
Szeftel
,
H.
Ibach
,
T. S.
Rahman
,
D. L.
Mills
,
Phys. Rev. Lett.
50
,
518
(
1983
);
J. M.
Szeftel
,
S.
Lehwald
,
H.
Ibach
,
T. S.
Rahman
,
J. E.
Black
,
D. L.
Mills
,
Phys. Rev. Lett.
51
,
268
(
1983
).
13.
D. J.
Chadi
,
Phys. Rev. Lett.
41
,
1062
(
1978
).
14.
M. L. Cohen, V. Heine, J. C. Phillips, Scientific American, June 1982, page 82.
15.
U.
Landman
,
R. N.
Hill
,
M.
Mostoller
,
Phys. Rev.
B21
,
448
(
1980
).
16.
See, for example,
D. L.
Adams
,
H. B.
Nielsen
,
J. N.
Andersen
,
I.
Stensgaard
,
R.
Feidenhans'l
,
J. E.
Sorensen
,
Phys. Rev. Lett.
49
,
669
(
1982
).
17.
H. L.
Davis
,
J. R.
Noonan
,
Surface Sci.
126
,
245
(
1983
);
Y.
Kuk
,
L. C.
Feldman
,
Bul. Amer. Phys. Soc.
29
,
390
(
1984
).
18.
J.
Sokolov
,
H. D.
Shih
,
U.
Bardi
,
F.
Jona
,
P. M.
Marcus
,
Solid State Comm.
48
,
739
(
1983
).
19.
M. K.
Debe
,
D. A.
King
,
Phys. Rev. Lett.
39
,
708
(
1977
).
20.
R. J.
Koestner
,
M. A.
Van Hove
,
G. A.
Somorjai
,
J. Phys. Chem.
87
,
203
(
1983
).
21.
L. L.
Kesmodel
,
L. H.
Dubois
,
G. A.
Somorjai
,
J. Chem. Phys.
70
,
2180
(
1979
).
22.
K. C.
Pandey
,
Phys. Rev. Lett.
49
,
223
(
1982
).
23.
S. Y.
Tong
,
A. R.
Lubinsky
,
B. J.
Mrstik
,
M. A.
Van Hove
,
Phys. Rev.
B17
,
3303
(
1978
);
A.
Kahn
,
G.
Cisneros
,
M.
Bonn
,
P.
Mark
,
C. B.
Duke
,
Surface Sci.
71
,
387
(
1978
).
24.
S. Y.
Tong
,
G.
Xu
,
W. N.
Mei
,
Phys. Rev. Lett.
52
,
1693
(
1984
).
This content is only available via PDF.
You do not currently have access to this content.