The American Crystallographic Association made an experiment in departing from the form of previous meetings for its winter meeting, February 24–26, 1965. The meeting was held, not on a university campus, but at a commercial motel in Suffern, New York, where the isolation provided little distraction from business. A small meeting was planned, but nearly 200 crystallographers eventually showed up. The first day was devoted to six invited papers in a symposium organized by S. C. Abrahams on accuracy in x‐ray intensity measurement. This subject has become of vital interest and some controversy among diffractionists with the growing sophistication of their experimental and computational techniques. This was followed by four sessions comprising 43 contributed papers, most of which illustrated directly the theme of the symposium.

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