Modern Developments in Electron Microscopy; Fundamentals of Transmission Electron Microscopy

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January 01 1965

Benjamin M. Siegel;

Benjamin M. Siegel

Editor

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Robert D. Heidenreich;

Robert D. Heidenreich

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L. Marton

Reviewer

National Bureau of Standards

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Physics Today 18 (1), 100–104 (1965);

https://doi.org/10.1063/1.3047085

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