This paper approaches the topic of Laser Beam Image Recording from the user’s perspective. It discusses the parameters of concern to a system group charged with specifying a high performance Laser Beam Image Recording Subsystem. The paper concentrates on those parameters that have significant impact on interface complexity, image quality and cost. A block diagram of a typical Laser Beam Recorder is shown along with a brief explanation of the following subsystems: Image Data Interface, Control Data Interface, Image Data Processor, Annotation, scan Data Processor, Command and Control, Electro Optics, Film Transport, and Built-In-Test-Equipment. Ranges of the following signal parameters are given: Line Rate, Data Rate, Data Duty Factor and Bytes/Line. Typical values of the following critical image quality parameters are given: Resolution, Raster and Banding, Geometric Fidelity, and Density Fidelity. Each of the critical parameters are defined and measuring techniques and equipment discussed. A list of system level questions which a user should consider when formulating the Laser Beam Recorder specification are also presented.
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ICALEO '84: Proceedings of the Medicine and Biology Symposium
November 12–15, 1984
Boston, Massachusetts, USA
ISBN:
978-0-912035-28-4
PROCEEDINGS PAPER
Critical parameters associated with specifying a laser image recorder Available to Purchase
S. L. Corsover;
S. L. Corsover
RCA Government Communications Systems Recording Systems
Front and Cooper Streets Camden, New Jersey 08102, USA
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D. G. Herzog;
D. G. Herzog
RCA Government Communications Systems Recording Systems
Front and Cooper Streets Camden, New Jersey 08102, USA
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D. W. Donze
D. W. Donze
RCA Government Communications Systems Recording Systems
Front and Cooper Streets Camden, New Jersey 08102, USA
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Published Online:
November 01 1984
Citation
S. L. Corsover, D. G. Herzog, D. W. Donze; November 12–15, 1984. "Critical parameters associated with specifying a laser image recorder." Proceedings of the ICALEO '84: Proceedings of the Medicine and Biology Symposium. ICALEO '84: Proceedings of the Optical Communications & Information Processing Conference and Imaging & Display Technology Conferences. Boston, Massachusetts, USA. (pp. pp. 85-93). ASME. https://doi.org/10.2351/1.5059586
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