We developed a novel surface analysis system using a vacuum ultraviolet (VUV) photons. When the VUV photons were irradiated on the material surface, surface desorption was stimulated. The desorbed species were analyzed by the mass analyzer. First, we studied the decomposition process excited by VUV excimer lamps. We found that the different photon energy resulted in the different time dependence of the fragment detection even if the contamination had similar chemical construction. It suggested that the tracing the decomposition process We developed an analyzing system, called “photo-stimulated desorption mass spectrometer (PSD)”. A broadband VUV radiation for surface desorption was obtained from the Ar plasma excited by a Q-SW Nd:YAG laser. We selected and scanned wavelength by a monochromator. The desorbed species were analyzed by the quadrupole mass analyzer. We scanned the VUV wavelength and obtained the mass data. This PSD system enables us to analyze without damage on the sample.
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ICALEO 2010: 29th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing
September 26–30, 2010
Anaheim, California, USA
ISBN:
978-0-912035-61-1
PROCEEDINGS PAPER
Surface analysis system by VUV photons-stimulated desorption Available to Purchase
Masahito Katto;
Masahito Katto
1
Cooperative Research Center, University of Miyazaki
, 1-1 Gakuen-Kibanadai-Nishi, Miyazaki, 889-2192, Japan
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Atushi Yokotani;
Atushi Yokotani
2
Dept. of Electrical and Electronic Eng., University of Miyazaki
, 1-1 Gakuen-Kibanadai-Nishi, Miyazaki, 889-2192, Japan
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Masanori Kaku;
Masanori Kaku
2
Dept. of Electrical and Electronic Eng., University of Miyazaki
, 1-1 Gakuen-Kibanadai-Nishi, Miyazaki, 889-2192, Japan
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Shoichi Kubodera;
Shoichi Kubodera
2
Dept. of Electrical and Electronic Eng., University of Miyazaki
, 1-1 Gakuen-Kibanadai-Nishi, Miyazaki, 889-2192, Japan
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Nobuyoshi Miyabayashi;
Nobuyoshi Miyabayashi
3
ESCO, Ltd
., Oak Bldg., 1-3-12 Nishikubo, Musashino 180-0013, Japan
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Wataru Sasaki
Wataru Sasaki
4
NTP, Inc., CRC, University of Miyazaki
, 1-1 Gakuen-Kibanadai-Nishi, Miyazaki, 889-2192, Japan
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Published Online:
September 01 2010
Citation
Masahito Katto, Atushi Yokotani, Masanori Kaku, Shoichi Kubodera, Nobuyoshi Miyabayashi, Wataru Sasaki; September 26–30, 2010. "Surface analysis system by VUV photons-stimulated desorption." Proceedings of the ICALEO 2010: 29th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. ICALEO 2010: 29th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. Anaheim, California, USA. (pp. pp. 1439-1443). ASME. https://doi.org/10.2351/1.5061998
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