Off-the-shelf beam analysis systems work very well in investigating and measuring collimated laser beam spatial profiles, focus spot spatial profiles, and the waist caustic. These standard systems have some shortcomings, however, related to viewing very small focus spot sizes at any wavelength, but especially at 10.6um. Another problem that these beam analysis systems can solve is alignment of optics and other components that can be damaged by high power beams if improperly set-up. This presentation will investigate the use of novel but simple imaging systems to allow in-depth analysis and real-time imaging of focus spot sizes from ∼10um to 100um at any laser wavelength, including 10.6um, allowing resolution of features as small as 0.25um. It will also investigate the use of low power pointing laser beams and artificial incoherent light to produce fine alignment and registration of optics and opto-mechanical components to high power laser beams. Examples will also employ ray-tracing information to validate the optical systems.
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ICALEO 2009: 28th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing
November 2–5, 2009
Orlando, Florida, USA
ISBN:
978-0-912035-59-8
PROCEEDINGS PAPER
Novel beam analysis applications and hardware Available to Purchase
Thomas R. Kugler
Thomas R. Kugler
1
Laser Mechanisms, Inc.
25325 Regency Drive, Novi, MI, 48375, USA
1
Laser Mechanisms, Inc.
25325 Regency Drive, Novi, MI, 48375, USA
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Published Online:
November 01 2009
Citation
Thomas R. Kugler; November 2–5, 2009. "Novel beam analysis applications and hardware." Proceedings of the ICALEO 2009: 28th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. ICALEO 2009: 28th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. Orlando, Florida, USA. (pp. pp. 521-526). ASME. https://doi.org/10.2351/1.5061605
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