The demand for efficient, alternative sources of energy is a growing and crucial issue in today’s world. Solar energy offers a vast, inexhaustible, free and clean option for future power needs. Although new technologies emerge every day, silicon-based solar panels represent the most feasible and commercial solution. The reason for this is its well established manufacturing process and the abundance of this material in the earth’s crust. In order to achieve highly efficient devices, all losses associated with the photovoltaic cell operation must be minimized. Amongst them, optical losses as high as 30% light reflectivity are characteristic of bare SI substrates. In this paper reduced reflectivity is reported by micro-texturing the front surface of a single crystalline silicon wafer using a diode pumped Nd:YVO4 laser system with a computer controlled 3 axis galvanometer beam scanner. High laser scanning speeds (∼1 m/s) were applied so this texturing technique might compete with current industrial texturing practices.

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