Erbium-doped silicon is studied as an active lasing medium. Capture and emission properties of recombination centers introduced by erbium atoms in the silicon lattice is analyzed. Electron-hole recombination at these sites are equated to find out the excitation and de-excitation rates of erbium. A two level system is considered to analyze the effects of stimulated emission and confinement of the 1.54 μm erbium light in the optical cavity. For a cavity length of 300 μm with mirror reflectivities of 90%, and an optimistic absorption coefficient of 5 cm−1, a population inversion of 1.4x1018 cm−3 is estimated as the threshold value. On the assumption of 1019 cm−3 of optically active erbium sites with an overall spectral linewidth of 1Å, linear increase of optical power has been estimated for laser drive currents of the order of A/cm2. Theoretical calculation shows direct modulation capabilities of the proposed silicon laser. Modulating frequencies up to GHz. level with power levels of wattage range is estimated.
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ICALEO 2007: 26th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing
October 29–November 1, 2007
Orlando, Florida, USA
ISBN:
978-0-912035-88-8
PROCEEDINGS PAPER
Erbium-doped silicon laser Available to Purchase
M. Q. Huda;
M. Q. Huda
1
Department of EEE, Bangladesh University of Engineering & Technology
, Dhaka 1000, Bangladesh
, [email protected]
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Z. Hossain
Z. Hossain
1
Department of EEE, Bangladesh University of Engineering & Technology
, Dhaka 1000, Bangladesh
, [email protected]
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Published Online:
October 01 2007
Citation
M. Q. Huda, Z. Hossain; October 29–November 1, 2007. "Erbium-doped silicon laser." Proceedings of the ICALEO 2007: 26th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. ICALEO 2007: 26th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. Orlando, Florida, USA. (pp. P556). ASME. https://doi.org/10.2351/1.5061218
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