GaN is expected to replace GaAs and Si materials in the next generation high power density Microwave Monolithic Integrated Circuits (MMIC), thanks to its excellent material characteristics. Sapphire is one of the most promising substrate materials for GaN-based MMIC for its excellent physical characteristics and cost effectiveness. Interconnects across MMIC devices are made possible by via holes through sapphire layer, which is typically > 100 um in depth. Since sapphire is chemically stable and physically strong, it is very difficult to make such deep via holes in sapphire using conventional techniques, such as wet or dry etching. Our picosecond laser provides a viable, and probably unique, solution to this problem. It was demonstrated that > 300 um holes can be machined in sapphire with our 526 nm picosecond laser.
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ICALEO 2007: 26th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing
October 29–November 1, 2007
Orlando, Florida, USA
ISBN:
978-0-912035-88-8
PROCEEDINGS PAPER
Via hole machining in sapphire using an ultrafast laser Available to Purchase
Nagaraj Batta;
Nagaraj Batta
Panasonic Boston Lab of Panasonic R&D Company of America
68 Rogers Street, Cambridge, MA 02142, USA
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Shuichi Nagai;
Shuichi Nagai
Panasonic Boston Lab of Panasonic R&D Company of America
68 Rogers Street, Cambridge, MA 02142, USA
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Published Online:
October 01 2007
Citation
Nagaraj Batta, Shuichi Nagai, Ming Li; October 29–November 1, 2007. "Via hole machining in sapphire using an ultrafast laser." Proceedings of the ICALEO 2007: 26th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. ICALEO 2007: 26th International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing. Orlando, Florida, USA. (pp. M102). ASME. https://doi.org/10.2351/1.5061110
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