We present a method and apparatus that provides in situ, near real-time evaluation of metallic coatings used as protective barriers for various industrial applications. Identification of the elemental constituents of the coating and substrate is accomplished using the technique of laser plasma spectroscopy, whereby optical emissions from the plasma formed by focusing a high energy pulsed laser onto a part coating or substrate surface uniquely identify the elements present in the vaporized material. We present several applications, including use of this technique to determine coating presence, coating composition, coating thickness, coating composition as a function of depth, and identification of deposits on metallic surfaces.

Topics
Telecommunications engineering, Optical coatings, Lasers, Plasma spectroscopy
1.
Benicewicz
,
P. K.
,
Travaly
,
A. J.
,
Wu
,
P.
 &
Rozier
,
E.
 (
2004
)
Portable laser plasma spectroscopy apparatus and method for in situ identification of deposits
, US Patent 6,762,836.
Google Scholar
 
2.
Benicewicz
,
P. K.
,
Fomitchov
,
P. A.
,
Rozier
,
E.
,
Viertl
,
J. R.
 &
Schumaker
,
T. B.
 (
2006
)
Laser plasma spectroscopy apparatus and method for in situ depth profiling
, US Patent Application.
Google Scholar
 
3.
Gupta
,
B. K.
,
Das
,
N. N.
 &
Benicewicz
,
P. K.
 (
2006
)
Analysis of component for presence, composition and/or thickness of coating
, US Patent Application.
Google Scholar
 
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© 2006 Laser Institute of America.
2006
Laser Institute of America
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