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Journal Articles

Growth and surface properties of lanthanum hexaboride crystals

Toru Inoue, Mitsuru Nakada, Takahiko Uozumi, Eizi Sugata
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 952–956 (1982)
https://doi.org/10.1116/1.571872
Published: November 1982
View article titled, Growth and surface properties of lanthanum hexaboride crystals
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Journal Articles

Refractory metal contacts to GaAs: Interface chemistry and Schottky‐barrier formation

J. R. Waldrop, S. P. Kowalczyk, R. W. Grant
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 607–610 (1982)
https://doi.org/10.1116/1.571795
Published: July 1982
View article titled, Refractory metal contacts to GaAs: Interface chemistry and Schottky‐barrier formation
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Journal Articles

Apparatus surface conditioning effects in copper sulfide reactive sputtering for photovoltaic applications

J. A. Thornton, D. G. Cornog, R. B. Hall, L. C. DiNetta
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 296–299 (1982)
https://doi.org/10.1116/1.571285
Published: March 1982
View article titled, Apparatus surface conditioning effects in copper sulfide reactive sputtering for photovoltaic applications
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Journal Articles

Matrix effects in SIMS: Ion yield enhancement in copper sulfide films on copper and copper alloys

G. E. Hammer
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 403–405 (1982)
https://doi.org/10.1116/1.571477
Published: March 1982
View article titled, Matrix effects in SIMS: Ion yield enhancement in copper sulfide films on copper and copper alloys
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Journal Articles

Chemical bonding and charge redistribution: Valence band and core level correlations for the Ni/Si, Pd/Si, and Pt/Si systems

P. J. Grunthaner, F. J. Grunthaner, A. Madhukar
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 680–683 (1982)
https://doi.org/10.1116/1.571627
Published: March 1982
View article titled, Chemical bonding and charge redistribution: Valence band and core level correlations for the Ni/Si, Pd/Si, and Pt/Si systems
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Journal Articles

Electron stimulated desorption of excited alkali atoms from alkali halide surfaces

T. R. Pian, N. Tolk, J. Kraus, M. M. Traum, J. Tully, W. E. Collins
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 555–558 (1982)
https://doi.org/10.1116/1.571431
Published: March 1982
View article titled, Electron stimulated desorption of excited alkali atoms from alkali halide surfaces
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Journal Articles

Operational aspects of a gallium phosphide source of P2 vapor in molecular beam epitaxy

S. L. Wright, H. Kroemer
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 143–148 (1982)
https://doi.org/10.1116/1.571348
Published: February 1982
View article titled, Operational aspects of a gallium phosphide source of P<sub>2</sub> vapor in molecular beam epitaxy
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Journal Articles

Anisotropic and selective reactive ion etching of polysilicon using SF6

P. Parrens
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 1403–1407 (1981)
https://doi.org/10.1116/1.571219
Published: November 1981
View article titled, Anisotropic and selective reactive ion etching of polysilicon using SF<sub>6</sub>
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Journal Articles

Interference enhanced Raman scattering study of the interfacial reaction of Pd on a‐Si:H

R. J. Nemanich, C. C. Tsai, M. J. Thompson, T. W. Sigmon
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 685–688 (1981)
https://doi.org/10.1116/1.571085
Published: September 1981
View article titled, Interference enhanced Raman scattering study of the interfacial reaction of Pd on a‐Si:H
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Journal Articles

Electronic states and atomic structure at the Pd2Si–Si interface

P. E. Schmid, P. S. Ho, H. Föll, G. W. Rubloff
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 937–943 (1981)
https://doi.org/10.1116/1.570960
Published: April 1981
View article titled, Electronic states and atomic structure at the Pd<sub>2</sub>Si–Si interface
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Journal Articles

Characterization of thin films for laser systems using surface analytical techniques

T. W. Humpherys, R. L. Lusk, K. C. Jungling
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 296–300 (1981)
https://doi.org/10.1116/1.570745
Published: March 1981
View article titled, Characterization of thin films for laser systems using surface analytical techniques
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Journal Articles

Ammonia adsorption on the Pt(111) and Pt(S)‐6(111)×(111) surfaces

J. L. Gland, E. B. Kollin
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 604–606 (1981)
https://doi.org/10.1116/1.570831
Published: March 1981
View article titled, Ammonia adsorption on the Pt(111) and Pt(S)‐6(111)×(111) surfaces
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Journal Articles

Ammonia adsorption and decomposition on a Ni(110) surface

M. Grunze, M. Golze, R. K. Driscoll, P. A. Dowben
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 611–615 (1981)
https://doi.org/10.1116/1.570833
Published: March 1981
View article titled, Ammonia adsorption and decomposition on a Ni(110) surface
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Journal Articles

Local atomic order in native III–V oxides

G. Lucovsky, R. S. Bauer
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 17, 946–951 (1980)
https://doi.org/10.1116/1.570644
Published: September 1980
View article titled, Local atomic order in native III–V oxides
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Journal Articles

Versatile infrared window mounting for ultrahigh vacuum applications

P. Hollins, J. Pritchard
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 17, 665 (1980)
https://doi.org/10.1116/1.570539
Published: March 1980
View article titled, Versatile infrared window mounting for ultrahigh vacuum applications
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Journal Articles

Phosphosilicate glass flow for integrated optics

A. Naumaan, J. T. Boyd
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 17, 529–532 (1980)
https://doi.org/10.1116/1.570501
Published: January 1980
View article titled, Phosphosilicate glass flow for integrated optics
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Journal Articles

Köhler illumination and brightness measurement with lanthanum hexaboride cathodes

Alec N. Broers
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 1692–1698 (1979)
https://doi.org/10.1116/1.570274
Published: November 1979
View article titled, Köhler illumination and brightness measurement with lanthanum hexaboride cathodes
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Journal Articles

Chemical and structural properties of the Pd/Si interface during the initial stages of silicide formation

P. S. Ho, T. Y. Tan, J. E. Lewis, G. W. Rubloff
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 1120–1124 (1979)
https://doi.org/10.1116/1.570171
Published: September 1979
View article titled, Chemical and structural properties of the Pd/Si interface during the initial stages of silicide formation
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Journal Articles

Copper sulfide films deposited by cylindrical magnetron reactive sputtering

Arthur D. Jonath, William W. Anderson, John A. Thornton, David G. Cornog
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 200–203 (1979)
https://doi.org/10.1116/1.569907
Published: March 1979
View article titled, Copper sulfide films deposited by cylindrical magnetron reactive sputtering
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Journal Articles

Application of Auger electron spectroscopy to studies of the silicon/silicide interface

John A. Roth, C. R. Crowell
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 15, 1317–1324 (1978)
https://doi.org/10.1116/1.569759
Published: July 1978
View article titled, Application of Auger electron spectroscopy to studies of the silicon/silicide interface
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