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Journal Articles

Optical and field effect studies of the Hg0.7Cd0.3 Te–anodic oxide interface

R. B. Schoolar, B. K. Janousek, R. L. Alt, R. C. Carscallen, M. J. Daughtery, A. A. Fote
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 164–167 (1982)
https://doi.org/10.1116/1.571704
Published: May 1982
View article titled, Optical and field effect studies of the Hg<sub>0.7</sub>Cd<sub>0.3</sub> Te–anodic oxide interface
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Journal Articles

Theoretical determination of electron density distribution in an orbitron device correlated with results concerning its ionization efficiency

B. Petit, M. L. Feidt
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 1109–1113 (1982)
https://doi.org/10.1116/1.571579
Published: April 1982
View article titled, Theoretical determination of electron density distribution in an orbitron device correlated with results concerning its ionization efficiency
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Journal Articles

Exploiting energy‐dependent photoemission in Si d‐metal interfaces: The Si(111)–Pd case

I. Abbati, G. Rossi, I. Lindau, W. E. Spicer
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 636–640 (1981)
https://doi.org/10.1116/1.571077
Published: September 1981
View article titled, Exploiting energy‐dependent photoemission in Si <em>d</em>‐metal interfaces: The Si(111)–Pd case
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Journal Articles

Measurement of ion energy distribution in an orbitron device

M. L. Feidt, B. Petit
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 987–993 (1981)
https://doi.org/10.1116/1.570970
Published: April 1981
View article titled, Measurement of ion energy distribution in an orbitron device
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Journal Articles

Bonding and photoemission of chemisorbed molecules: Molecular orbital cluster model theory

P. S. Bagus, K. Hermann, M. Steel
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 435–452 (1981)
https://doi.org/10.1116/1.570760
Published: March 1981
View article titled, Bonding and photoemission of chemisorbed molecules: Molecular orbital cluster model theory
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Journal Articles

Impurities‐related memory traps in silicon nitride thin films

V.J. Kapoor, R. S. Bailey, S. R. Smith
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 305–308 (1981)
https://doi.org/10.1116/1.570747
Published: March 1981
View article titled, Impurities‐related memory traps in silicon nitride thin films
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Journal Articles

Systematics on the electron states of silicon d‐metal interfaces

L. Braicovich, I. Abbati, J. N. Miller, I. Lindau, S. Schwarz, P. R. Skeath, C. Y. Su, W. E. Spicer
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 17, 1005–1008 (1980)
https://doi.org/10.1116/1.570581
Published: September 1980
View article titled, Systematics on the electron states of silicon <em>d</em>‐metal interfaces
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Journal Articles

Positronium emission from metal surfaces

I. J. Rosenberg, A. H. Weiss, K. F. Canter
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 17, 253–255 (1980)
https://doi.org/10.1116/1.570403
Published: January 1980
View article titled, Positronium emission from metal surfaces
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Journal Articles

Experimental and theoretical study of cross‐sectional profiles of resist patterns in electron‐beam lithography

K. Murata, E. Nomura, K. Nagami, T. Kato, H. Nakata
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 1734–1738 (1979)
https://doi.org/10.1116/1.570283
Published: November 1979
View article titled, Experimental and theoretical study of cross‐sectional profiles of resist patterns in electron‐beam lithography
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Journal Articles

Bulk interpretation of the angle‐resolved photoemission spectra from GaAs(110)

J. Colbert, N. J. Shevchik
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 1302–1306 (1979)
https://doi.org/10.1116/1.570146
Published: September 1979
View article titled, Bulk interpretation of the angle‐resolved photoemission spectra from GaAs(110)
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Journal Articles

Electronic structure in GaAs/Ge through angle‐resolved photoemission

D. Denley, K. A. Mills, P. Perfetti, D. A. Shirley
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 1501–1503 (1979)
https://doi.org/10.1116/1.570232
Published: September 1979
View article titled, Electronic structure in GaAs/Ge through angle‐resolved photoemission
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Journal Articles

Fabrication of hemispherical structures using semiconductor technology for use in thermonuclear fusion research

K. D. Wise, T. N. Jackson, N. A. Masnari, M. G. Robinson, D. E. Solomon, G. H. Wuttke, W. B. Rensel
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 936–939 (1979)
https://doi.org/10.1116/1.570116
Published: May 1979
View article titled, Fabrication of hemispherical structures using semiconductor technology for use in thermonuclear fusion research
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Journal Articles

Plasma etching—A discussion of mechanisms

J. W. Coburn, Harold F. Winters
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 391–403 (1979)
https://doi.org/10.1116/1.569958
Published: March 1979
View article titled, Plasma etching—A discussion of mechanisms
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Journal Articles

Vacuum system for national synchrotron light source

J. C. Schuchman, J. B. Godel, W. Jordan, T. Oversluizen
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 720–723 (1979)
https://doi.org/10.1116/1.570067
Published: March 1979
View article titled, Vacuum system for national synchrotron light source
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Journal Articles

Issues in fabricating electron devices with submicrometer dimensions

R. C. Henderson, D. C. Mayer, J. G. Nash
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 260–268 (1979)
https://doi.org/10.1116/1.569923
Published: March 1979
View article titled, Issues in fabricating electron devices with submicrometer dimensions
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Journal Articles

Surface impurity studies in the ISX‐A tokamak

L. C. Emerson, R. E. Clausing, L. Heatherly
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 766–768 (1979)
https://doi.org/10.1116/1.570080
Published: March 1979
View article titled, Surface impurity studies in the ISX‐A tokamak
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Journal Articles

Residual gas analysis in the ISX‐A tokamak

J. E. Simpkins, R. J. Colchin, D. R. Overbey
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 16, 763–765 (1979)
https://doi.org/10.1116/1.570079
Published: March 1979
View article titled, Residual gas analysis in the ISX‐A tokamak
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Journal Articles

Desorption of neutral molecules from Al(6061) by electron and ion bombardment

D. Edwards, Jr.
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 15, 1586–1596 (1978)
https://doi.org/10.1116/1.569815
Published: July 1978
View article titled, Desorption of neutral molecules from Al(6061) by electron and ion bombardment
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Journal Articles

Influence of the free surface on the electrical behavior of metal contacts to p‐InAs

M. F. Millea, A. H. Silver
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 15, 1362–1369 (1978)
https://doi.org/10.1116/1.569766
Published: July 1978
View article titled, Influence of the free surface on the electrical behavior of metal contacts to <em>p</em>‐InAs
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Journal Articles

Diagnostic methods for sputtering plasmas

John A. Thornton
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 15, 188–192 (1978)
https://doi.org/10.1116/1.569452
Published: March 1978
View article titled, Diagnostic methods for sputtering plasmas
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