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Journal Articles

Study of grain boundary diffusion of potassium in gold films using a clean, controlled, and localized source of alkali atoms

M. H. Farías, J. L. Peña, F. Sánchez‐Sinencio
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 853–857 (1982)
https://doi.org/10.1116/1.571835
Published: September 1982
View article titled, Study of grain boundary diffusion of potassium in gold films using a clean, controlled, and localized source of alkali atoms
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Journal Articles

Chemical control of recombination at grain boundaries and liquid interfaces: Electrical power and hydrogen generating photoelectrochemical cells

A. Heller
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 559–561 (1982)
https://doi.org/10.1116/1.571762
Published: July 1982
View article titled, Chemical control of recombination at grain boundaries and liquid interfaces: Electrical power and hydrogen generating photoelectrochemical cells
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Journal Articles

Similarity in interactions between metal–semiconductor and metal–metal interfaces

Chin‐An Chang
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 639–642 (1982)
https://doi.org/10.1116/1.571804
Published: July 1982
View article titled, Similarity in interactions between metal–semiconductor and metal–metal interfaces
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Journal Articles

Grain boundary diffusion of phosphorus in polycrystalline silicon

P. H. Holloway
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 19–22 (1982)
https://doi.org/10.1116/1.571713
Published: May 1982
View article titled, Grain boundary diffusion of phosphorus in polycrystalline silicon
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Journal Articles

Angle‐resolved photoemission studies of oxide formation on Cu(100)

D. T. Ling, J. N. Miller, P. Pianetta, D. L. Weissman, I. Lindau, W. E. Spicer
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 47–49 (1982)
https://doi.org/10.1116/1.571734
Published: May 1982
View article titled, Angle‐resolved photoemission studies of oxide formation on Cu(100)
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Journal Articles

Auger and x‐ray characterization of surface nitride films on Ti, Zr, and Hf

P. T. Dawson, S. A. J. Stazyk
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 21, 36–41 (1982)
https://doi.org/10.1116/1.571732
Published: May 1982
View article titled, Auger and x‐ray characterization of surface nitride films on Ti, Zr, and Hf
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Journal Articles

F2 adsorption on Si observed with SIMS and QCM

J. W. Coburn, E.‐A. Knabbe, E. Kay
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 480–483 (1982)
https://doi.org/10.1116/1.571340
Published: March 1982
View article titled, F<sub>2</sub> adsorption on Si observed with SIMS and QCM
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Journal Articles

Polycrystalline thin films for terrestrial solar cells

A. Rothwarf
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 282–289 (1982)
https://doi.org/10.1116/1.571283
Published: March 1982
View article titled, Polycrystalline thin films for terrestrial solar cells
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Journal Articles

Chemical, compositional, and electrical properties of semiconductor grain boundaries

L. L. Kazmerski
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 423–429 (1982)
https://doi.org/10.1116/1.571325
Published: March 1982
View article titled, Chemical, compositional, and electrical properties of semiconductor grain boundaries
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Journal Articles

Interpretation of MVV and L2,3 VV Auger spectra of Co

D. M. Zehner, J. R. Noonan, H. H. Madden
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 859–862 (1982)
https://doi.org/10.1116/1.571504
Published: March 1982
View article titled, Interpretation of <em>M</em><em>V</em><em>V</em> and <em>L</em><sub>2,3</sub> <em>V</em><em>V</em> Auger spectra of Co
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Journal Articles

Single‐crystal GaAs films on amorphous substrates by the CLEFT process

C. O. Bozler, R. W. McClelland, J. P. Salerno, J. C. C. Fan
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 720–725 (1982)
https://doi.org/10.1116/1.571438
Published: March 1982
View article titled, Single‐crystal GaAs films on amorphous substrates by the CLEFT process
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Journal Articles

Surface diffusion activation energy determination using ion beam microtexturing

S. M. Rossnagel, R. S. Robinson
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 195–198 (1982)
https://doi.org/10.1116/1.571356
Published: February 1982
View article titled, Surface diffusion activation energy determination using ion beam microtexturing
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Journal Articles

Pressure and angle of incidence effects in reactive planar magnetron sputtered ZnO layers

S. Maniv, W. D. Westwood, E. Colombini
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 162–170 (1982)
https://doi.org/10.1116/1.571350
Published: February 1982
View article titled, Pressure and angle of incidence effects in reactive planar magnetron sputtered ZnO layers
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Journal Articles

Fabrication of thick narrow electrodes on concentrator solar cells

A. Blakers, P. B. Kosel, M. R. Willison, M. A. Green
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 20, 13–15 (1982)
https://doi.org/10.1116/1.571300
Published: January 1982
View article titled, Fabrication of thick narrow electrodes on concentrator solar cells
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Journal Articles

Initial oxidation of CuInSe2

L. L. Kazmerski, O. Jamjoum, P. J. Ireland, S. K. Deb, R. A. Mickelsen, W. Chen
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 467–471 (1981)
https://doi.org/10.1116/1.571040
Published: September 1981
View article titled, Initial oxidation of CuInSe<sub>2</sub>
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Journal Articles

Optical investigation of the electrical properties of a polycrystalline–semiconductor–electrolyte interface using electroreflectance

R. P. Silberstein, Joseph K. Lyden, Micha Tomkiewicz, Fred H. Pollak
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 406–410 (1981)
https://doi.org/10.1116/1.571028
Published: September 1981
View article titled, Optical investigation of the electrical properties of a polycrystalline–semiconductor–electrolyte interface using electroreflectance
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Journal Articles

MBE‐grown fluoride films: A new class of epitaxial dielectrics

R. F. C. Farrow, P. W. Sullivan, G. M. Williams, G. R. Jones, D. C. Cameron
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 415–420 (1981)
https://doi.org/10.1116/1.571030
Published: September 1981
View article titled, MBE‐grown fluoride films: A new class of epitaxial dielectrics
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Journal Articles

X‐ray photoelectron spectroscopy of sputtered platinum thin films containing large amounts of carbon

J. P. Delrue, J. J. Pireaux, R. Caudano, T. Robert, A. Hecq
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 257–259 (1981)
https://doi.org/10.1116/1.571115
Published: July 1981
View article titled, X‐ray photoelectron spectroscopy of sputtered platinum thin films containing large amounts of carbon
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Journal Articles

Semiconducting behavior in antimony‐doped bismuth films

V. Damodara Das, M. S. Jagadeesh
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 19, 89–92 (1981)
https://doi.org/10.1116/1.571022
Published: May 1981
View article titled, Semiconducting behavior in antimony‐doped bismuth films
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Journal Articles

A study of the initial oxidation of polycrystalline Si using surface analysis techniques

L. L. Kazmerski, O. Jamjoum, P. J. Ireland, R. L. Whitney
Journal: Journal of Vacuum Science and Technology
J. Vac. Sci. Technol. 18, 960–964 (1981)
https://doi.org/10.1116/1.570964
Published: April 1981
View article titled, A study of the initial oxidation of polycrystalline Si using surface analysis techniques
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