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Journal Articles

Synthesis and characterization of thin film polyelectrolytes for solid-state lithium microbatteries

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Yifan Gao, Wyatt E. Tenhaeff
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 051401 (2019)
https://doi.org/10.1116/1.5109436
Published: September 2019
View article titled, Synthesis and characterization of thin film polyelectrolytes for solid-state lithium microbatteries
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Includes: Supplementary data
Journal Articles

Study of defects in β-Ga2O3 by isothermal capacitance transient spectroscopy

Yu-Yao Lin, Adam T. Neal, Shin Mou, Jian V. Li
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 041204 (2019)
https://doi.org/10.1116/1.5109088
Published: July 2019
View article titled, Study of defects in β-Ga<sub>2</sub>O<sub>3</sub> by isothermal capacitance transient spectroscopy
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Journal Articles

Chemical reaction and diffusion kinetics during laser-induced submillisecond heating for lithographic applications

Jing Jiang, Byungki Jung, Michael O. Thompson, Christopher K. Ober
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 041601 (2019)
https://doi.org/10.1116/1.5086871
Published: June 2019
View article titled, Chemical reaction and diffusion kinetics during laser-induced submillisecond heating for lithographic applications
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Includes: Supplementary data
Journal Articles

Impact of annealing on the current conduction and trap properties of CeO2/La2O3 metal-insulator-metal capacitors

Isabella Rossetto, Rossella Piagge, Fabrizio Toia, Sabina Spiga, Alessio Lamperti, Silvia Vangelista, Riina Ritasalo, Päivi Järvinen, Gabriella Ghidini
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 021205 (2019)
https://doi.org/10.1116/1.5060712
Published: February 2019
View article titled, Impact of annealing on the current conduction and trap properties of CeO<sub>2</sub>/La<sub>2</sub>O<sub>3</sub> metal-insulator-metal capacitors
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Journal Articles

Data retention investigation in Al:HfO2-based resistive random access memory arrays by using high-temperature accelerated tests

Eduardo Perez, Mamathamba K. Mahadevaiah, Cristian Zambelli, Piero Olivo, Christian Wenger
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 012202 (2019)
https://doi.org/10.1116/1.5054983
Published: January 2019
View article titled, Data retention investigation in Al:HfO<sub>2</sub>-based resistive random access memory arrays by using high-temperature accelerated tests
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Journal Articles

Analysis of conductive filament density in resistive random access memories: a 3D kinetic Monte Carlo approach

Samuel Aldana, Pedro García-Fernández, Rocío Romero-Zaliz, Francisco Jiménez-Molinos, Francisco Gómez-Campos, Juan Bautista Roldán
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 062201 (2018)
https://doi.org/10.1116/1.5049213
Published: October 2018
View article titled, Analysis of conductive filament density in resistive random access memories: a 3D kinetic Monte Carlo approach
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Journal Articles

Electrical and optical characterization of CdTe solar cells with CdS and CdSe buffers—A comparative study

Editor’s Pick
Md Dalim Mia, Craig H. Swartz, Sanjoy Paul, Sandeep Sohal, Corey R. Grice, Yanfa Yan, Mark Holtz, Jian V. Li
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 052904 (2018)
https://doi.org/10.1116/1.5044219
Published: September 2018
View article titled, Electrical and optical characterization of CdTe solar cells with CdS and CdSe buffers—A comparative study
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Journal Articles

Differences between Li, Na, and K migration in thin SiO2 films during ToF-SIMS O2+ depth profiling

Stefan Krivec, Andreas Amsüss, Stefan Schwab, Herbert Hutter
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F129 (2018)
https://doi.org/10.1116/1.5019659
Published: March 2018
View article titled, Differences between Li, Na, and K migration in thin SiO<sub>2</sub> films during ToF-SIMS O<sub>2</sub><sup>+</sup> depth profiling
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Journal Articles

Study of charge transport properties in a ZnO/CdS/Cu(In,Ga)Se2 solar cell via admittance spectroscopy

Sanjoy Paul, Roberto Lopez, Ingrid L. Repins, Jian V. Li
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 022904 (2018)
https://doi.org/10.1116/1.5013046
Published: February 2018
View article titled, Study of charge transport properties in a ZnO/CdS/Cu(In,Ga)Se<sub>2</sub> solar cell via admittance spectroscopy
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Journal Articles

Current relaxation analysis in AlGaN/GaN high electron mobility transistors

Alexander Y. Polyakov, N. B. Smirnov, Ivan V. Shchemerov, In-Hwan Lee, Taehoon Jang, Alexey A. Dorofeev, Nadezhda B. Gladysheva, Eugene S. Kondratyev, Yulia A. Turusova, Roman A. Zinovyev, A. V. Turutin, Fan Ren, S. J. Pearton
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 35, 011207 (2017)
https://doi.org/10.1116/1.4973973
Published: January 2017
View article titled, Current relaxation analysis in AlGaN/GaN high electron mobility transistors
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Journal Articles

Kinetic Monte Carlo simulation of GaAs(001) MBE growth considering the V/III flux ratio effect

Oleg A. Ageev, Maxim S. Solodovnik, Sergey V. Balakirev, Mikhail M. Eremenko
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 041804 (2016)
https://doi.org/10.1116/1.4948514
Published: May 2016
View article titled, Kinetic Monte Carlo simulation of GaAs(001) MBE growth considering the V/III flux ratio effect
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Journal Articles

At the edge between metal organic chemical vapor deposition and atomic layer deposition: Fast Atomic Sequential Technique, for high throughput conformal deposition

Fabien Piallat, Julien Vitiello
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 021202 (2016)
https://doi.org/10.1116/1.4942497
Published: February 2016
View article titled, At the edge between metal organic chemical vapor deposition and atomic layer deposition: Fast Atomic Sequential Technique, for high throughput conformal deposition
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Journal Articles

Deep level transient spectroscopy in III-Nitrides: Decreasing the effects of series resistance

Alexander Y. Polyakov, Nikolai B. Smirnov, In-Hwan Lee, Stephen J. Pearton
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 33, 061203 (2015)
https://doi.org/10.1116/1.4932013
Published: September 2015
View article titled, Deep level transient spectroscopy in III-Nitrides: Decreasing the effects of series resistance
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Journal Articles

Removal of SU-8 by two types of hot-wire atomic hydrogen sources—Dissection of contributions by atomic hydrogen and substrate heating

Koki Tanaka, Masafumi Kumano, Shuji Tanaka
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 33, 052001 (2015)
https://doi.org/10.1116/1.4927376
Published: July 2015
View article titled, Removal of SU-8 by two types of hot-wire atomic hydrogen sources—Dissection of contributions by atomic hydrogen and substrate heating
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Journal Articles

Modeling of ion drift in 4H-SiC-based chemical MOSFET sensors

Tobias Erlbacher, Holger Schwarzmann, Anton J. Bauer, Gottfried H. Döhler, Martin Schreivogel, Theresa Lutz, Francesco H. Guillén, Jürgen Graf, Richard Fix, Lothar Frey
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 33, 01A103 (2015)
https://doi.org/10.1116/1.4903054
Published: December 2014
View article titled, Modeling of ion drift in 4H-SiC-based chemical MOSFET sensors
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Journal Articles

Ordered array of Ga droplets on GaAs(001) by local anodic oxidation

Elisa M. Sala, Monica Bollani, Sergio Bietti, Alexey Fedorov, Luca Esposito, Stefano Sanguinetti
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 32, 061206 (2014)
https://doi.org/10.1116/1.4901017
Published: November 2014
View article titled, Ordered array of Ga droplets on GaAs(001) by local anodic oxidation
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Journal Articles

Spatial location of the Ec-0.6 eV electron trap in AlGaN/GaN heterojunctions

In-Hwan Lee, Alexander Y. Polyakov, Nikolai B. Smirnov, Cheol-Koo Hahn, S. J. Pearton
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 32, 050602 (2014)
https://doi.org/10.1116/1.4895840
Published: September 2014
View article titled, Spatial location of the E<sub>c</sub>-0.6 eV electron trap in AlGaN/GaN heterojunctions
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Journal Articles

Effects of thermal annealing on variations of electron traps in the channel region of amorphous In-Ga-Zn-O thin film transistor

Aya Hino, Yasuyuki Takanashi, Hiroaki Tao, Shinya Morita, Mototaka Ochi, Hiroshi Goto, Kazushi Hayashi, Toshihiro Kugimiya
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 32, 031210 (2014)
https://doi.org/10.1116/1.4876155
Published: May 2014
View article titled, Effects of thermal annealing on variations of electron traps in the channel region of amorphous In-Ga-Zn-O thin film transistor
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Journal Articles

Activation energies for the growth of diamond films and the renucleation of diamond grains during film growth

Divani Carvalho Barbosa, Mauricio Ribeiro Baldan, Vladimir Jesus Trava-Airoldi, Evaldo Jose Corat
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 32, 031808 (2014)
https://doi.org/10.1116/1.4874308
Published: May 2014
View article titled, Activation energies for the growth of diamond films and the renucleation of diamond grains during film growth
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Journal Articles

In-situ optical microscopy observations of the growth of individual carbon nanocoils

Takehiro Gohara, Kuniharu Takei, Takayuki Arie, Seiji Akita
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 32, 031807 (2014)
https://doi.org/10.1116/1.4874004
Published: April 2014
View article titled, <em>In-situ</em> optical microscopy observations of the growth of individual carbon nanocoils
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