1-20 of 709
Lasers
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

III–V semiconductor devices grown by metalorganic chemical vapor deposition—The development of the Swiss Army Knife for semiconductor epitaxial growth

Russell D. Dupuis
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 060803 (2023)
https://doi.org/10.1116/6.0003062
Published: October 2023
View article titled, III–V semiconductor devices grown by metalorganic chemical vapor deposition—The development of the Swiss Army Knife for semiconductor epitaxial growth
Open the PDF for III–V semiconductor devices grown by metalorganic chemical vapor deposition—The development of the Swiss Army Knife for semiconductor epitaxial growth in another window
Journal Articles

Maximizing the performance of a field emission device by profiling the emitter’s height distribution

Sergey V. Filippov, Fernando F. Dall’Agnol, Eugeni O. Popov, Anatoly G. Kolosko, Thiago A. de Assis
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 050601 (2023)
https://doi.org/10.1116/6.0003016
Published: September 2023
View article titled, Maximizing the performance of a field emission device by profiling the emitter’s height distribution
Open the PDF for Maximizing the performance of a field emission device by profiling the emitter’s height distribution in another window
Journal Articles

Secondary ion mass spectrometry quantification: Do you remember when a factor of 2 was good enough?

Charles W. Magee, Temel H. Buyuklimanli
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 030803 (2023)
https://doi.org/10.1116/6.0002466
Published: April 2023
View article titled, Secondary ion mass spectrometry quantification: Do you remember when a factor of 2 was good enough?
Open the PDF for Secondary ion mass spectrometry quantification: Do you remember when a factor of 2 was good enough? in another window
Journal Articles

High quality factor silicon nitride nanomechanical resonators fabricated by maskless femtosecond laser micromachining

Roghayeh Nikbakht, Xitong Xie, Arnaud Weck, Raphael St-Gelais
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 023002 (2023)
https://doi.org/10.1116/5.0124150
Published: March 2023
View article titled, High quality factor silicon nitride nanomechanical resonators fabricated by maskless femtosecond laser micromachining
Open the PDF for High quality factor silicon nitride nanomechanical resonators fabricated by maskless femtosecond laser micromachining in another window
Journal Articles

Scanning electron microscope imaging by selective e-beaming using photoelectron beams from semiconductor photocathodes

Tomohiro Nishitani, Yuta Arakawa, Shotaro Noda, Atsushi Koizumi, Daiki Sato, Haruka Shikano, Hokuto Iijima, Yoshio Honda, Hiroshi Amano
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 064203 (2022)
https://doi.org/10.1116/6.0002111
Published: November 2022
View article titled, Scanning electron microscope imaging by selective e-beaming using photoelectron beams from semiconductor photocathodes
Open the PDF for Scanning electron microscope imaging by selective e-beaming using photoelectron beams from semiconductor photocathodes in another window
Journal Articles

Experimental considerations in electron beam transport on a nanophotonic chip using alternating phase focusing

Roy Shiloh, Tomáš Chlouba, Peter Hommelhoff
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 010602 (2022)
https://doi.org/10.1116/6.0001598
Published: December 2021
View article titled, Experimental considerations in electron beam transport on a nanophotonic chip using alternating phase focusing
Open the PDF for Experimental considerations in electron beam transport on a nanophotonic chip using alternating phase focusing in another window
Journal Articles

Diffraction-grating beam splitter, interferometric-lithography nanopatterning with a multilongitudinal-mode diode laser

Vineeth Sasidharan, Alexander Neumann, S. R. J. Brueck
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 062603 (2021)
https://doi.org/10.1116/6.0001377
Published: November 2021
View article titled, Diffraction-grating beam splitter, interferometric-lithography nanopatterning with a multilongitudinal-mode diode laser
Open the PDF for Diffraction-grating beam splitter, interferometric-lithography nanopatterning with a multilongitudinal-mode diode laser in another window
Journal Articles

Distribution of trace impurities in microvolumes and analysis of concentration using laser sputtered neutral mass spectrometry

Haruko Akutsu, Reiko Saito, Jun Asakawa, Kei Kiyokawa, Masato Morita, Tetsuo Sakamoto, Masaaki Fujii
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 064002 (2021)
https://doi.org/10.1116/6.0001244
Published: October 2021
View article titled, Distribution of trace impurities in microvolumes and analysis of concentration using laser sputtered neutral mass spectrometry
Open the PDF for Distribution of trace impurities in microvolumes and analysis of concentration using laser sputtered neutral mass spectrometry in another window
Journal Articles

Modeling the initial monolayer formation in thermally localized surface deposition

Bart de Braaf, Cor M. Rops, Cornelis Storm
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 052802 (2021)
https://doi.org/10.1116/6.0001098
Published: August 2021
View article titled, Modeling the initial monolayer formation in thermally localized surface deposition
Open the PDF for Modeling the initial monolayer formation in thermally localized surface deposition in another window
Journal Articles

Optical realization of the pascal—Characterization of two gas modulated refractometers

Isak Silander, Clayton Forssén, Johan Zakrisson, Martin Zelan, Ove Axner
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 044201 (2021)
https://doi.org/10.1116/6.0001042
Published: June 2021
View article titled, Optical realization of the pascal—Characterization of two gas modulated refractometers
Open the PDF for Optical realization of the pascal—Characterization of two gas modulated refractometers in another window
Journal Articles

Influence of primary electron incident angle and electron bombardment on the secondary electron yield of laser-treated copper

Yigang Wang, Wenli Zhang, Sihui Wang, Wei Wei, Jianwei Fang, Bangle Zhu, Yong Wang
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 034201 (2021)
https://doi.org/10.1116/6.0000952
Published: March 2021
View article titled, Influence of primary electron incident angle and electron bombardment on the secondary electron yield of laser-treated copper
Open the PDF for Influence of primary electron incident angle and electron bombardment on the secondary electron yield of laser-treated copper in another window
Journal Articles

Procedure for robust assessment of cavity deformation in Fabry–Pérot based refractometers

Johan Zakrisson, Isak Silander, Clayton Forssén, Martin Zelan, Ove Axner
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 054202 (2020)
https://doi.org/10.1116/6.0000375
Published: September 2020
View article titled, Procedure for robust assessment of cavity deformation in Fabry–Pérot based refractometers
Open the PDF for Procedure for robust assessment of cavity deformation in Fabry–Pérot based refractometers in another window
Includes: Supplementary data
Journal Articles

Electrical characterization of Si-doped conductive AlInN films grown nearly lattice-matched to c-plane GaN on sapphire by metalorganic chemical vapor deposition

Makoto Miyoshi, Taiki Nakabayashi, Mizuki Yamanaka, Takashi Egawa, Tetsuya Takeuchi
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 052205 (2020)
https://doi.org/10.1116/6.0000284
Published: September 2020
View article titled, Electrical characterization of Si-doped conductive AlInN films grown nearly lattice-matched to <em>c</em>-plane GaN on sapphire by metalorganic chemical vapor deposition
Open the PDF for Electrical characterization of Si-doped conductive AlInN films grown nearly lattice-matched to <em>c</em>-plane GaN on sapphire by metalorganic chemical vapor deposition in another window
Journal Articles

Atomic spectroscopy and laser frequency stabilization with scalable micrometer and sub-micrometer vapor cells

Eliran Talker, Roy Zektzer, Yefim Barash, Noa Mazurski, Uriel Levy
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 050601 (2020)
https://doi.org/10.1116/6.0000416
Published: August 2020
View article titled, Atomic spectroscopy and laser frequency stabilization with scalable micrometer and sub-micrometer vapor cells
Open the PDF for Atomic spectroscopy and laser frequency stabilization with scalable micrometer and sub-micrometer vapor cells in another window
Journal Articles

Development of two-color resonant ionization sputtered neutral mass spectrometry and microarea imaging for Sr

Yue Zhao, Takeru Yoshida, Yuzuka Ohmori, Yuta Miyashita, Masato Morita, Tetsuo Sakamoto, Kotaro Kato, Ryohei Terabayashi, Volker Sonnenschein, Hideki Tomita, Toshihide Kawai, Takeo Okumura, Yukihiko Satou, Masabumi Miyabe, Ikuo Wakaida
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 044001 (2020)
https://doi.org/10.1116/6.0000006
Published: May 2020
View article titled, Development of two-color resonant ionization sputtered neutral mass spectrometry and microarea imaging for Sr
Open the PDF for Development of two-color resonant ionization sputtered neutral mass spectrometry and microarea imaging for Sr in another window
Journal Articles

Structural and electrical properties of Pd/p-GaN contacts for GaN-based laser diodes

Maria Norman-Reiner, Erik Freier, Anna Mogilatenko, Ina Ostermay, Veit Hoffmann, Rafal Szukiewicz, Olaf Krüger, Detlef Hommel, Sven Einfeldt, Markus Weyers, Günther Tränkle
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 032211 (2020)
https://doi.org/10.1116/1.5143139
Published: April 2020
View article titled, Structural and electrical properties of Pd/p-GaN contacts for GaN-based laser diodes
Open the PDF for Structural and electrical properties of Pd/p-GaN contacts for GaN-based laser diodes in another window
Journal Articles

Improvement of ionization yield in sputtered neutral mass spectrometry using pulsed infrared and ultraviolet lasers

Reiko Saito, Haruko Akutsu, Jun Asakawa, Yue Zhao, Kei Kiyokawa, Masato Morita, Tetsuo Sakamoto, Masaaki Fujii
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034011 (2020)
https://doi.org/10.1116/6.0000088
Published: April 2020
View article titled, Improvement of ionization yield in sputtered neutral mass spectrometry using pulsed infrared and ultraviolet lasers
Open the PDF for Improvement of ionization yield in sputtered neutral mass spectrometry using pulsed infrared and ultraviolet lasers in another window
Journal Articles

Insulating regions in a TiO2 thin film defined by laser irradiation

Syeed E. Ahmed, Jesse Huso, Jacob R. Ritter, John Igo, Yi Gu, Matthew D. McCluskey
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 032203 (2020)
https://doi.org/10.1116/1.5142402
Published: March 2020
View article titled, Insulating regions in a TiO<sub>2</sub> thin film defined by laser irradiation
Open the PDF for Insulating regions in a TiO<sub>2</sub> thin film defined by laser irradiation in another window
Includes: Supplementary data
Journal Articles

Dynamic Stokes polarimetric imaging system with dual-wavelength operation

Chien-Yuan Han, Meng-Ting Chen, Hong-Bin Lai, Shih-Hsiang Lai, Shih-Chin Lin
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 014010 (2020)
https://doi.org/10.1116/1.5129301
Published: December 2019
View article titled, Dynamic Stokes polarimetric imaging system with dual-wavelength operation
Open the PDF for Dynamic Stokes polarimetric imaging system with dual-wavelength operation in another window
Journal Articles

Ellipsometric analysis of concentration gradients induced in semiconductor crystals by pulsed laser induced epitaxy

Jon Schlipf, Elena Martín, Michel Stchakovsky, Alessandro Benedetti, Inga A. Fischer, Jörg Schulze, Stefano Chiussi
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 061213 (2019)
https://doi.org/10.1116/1.5122777
Published: November 2019
View article titled, Ellipsometric analysis of concentration gradients induced in semiconductor crystals by pulsed laser induced epitaxy
Open the PDF for Ellipsometric analysis of concentration gradients induced in semiconductor crystals by pulsed laser induced epitaxy in another window