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Journal Articles

Temperature effects on electrospray current from an externally wetted EMI-Im ionic liquid ion source

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Yukio Fujiwara
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 064204 (2023)
https://doi.org/10.1116/6.0003088
Published: December 2023
View articletitled, Temperature effects on electrospray current from an externally wetted EMI-Im ionic liquid ion source
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Includes: Supplementary data
Journal Articles

Ion-beam-assisted growth of cesium-antimonide photocathodes

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Pallavi Saha, Eric Montgomery, Shashi Poddar, Oksana Chubenko, Siddharth Karkare
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 064004 (2023)
https://doi.org/10.1116/6.0002909
Published: October 2023
View articletitled, Ion-beam-assisted growth of cesium-antimonide photocathodes
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Journal Articles

Study of surface damage in silicon by irradiation with focused rubidium ions using a cold-atom ion source

Open Access
S. Xu, Y. Li, M. A. Verheijen, E. R. Kieft, E. J. D. Vredenbregt
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 042804 (2023)
https://doi.org/10.1116/6.0002643
Published: June 2023
View articletitled, Study of surface damage in silicon by irradiation with focused rubidium ions using a cold-atom ion source
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Includes: Supplementary data
Journal Articles

Sputtering produced by vacuum electrospray droplet ions with different sizes and charges

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Satoshi Ninomiya, Lee Chuin Chen, Kenzo Hiraoka
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 032807 (2023)
https://doi.org/10.1116/6.0002529
Published: April 2023
View articletitled, Sputtering produced by vacuum electrospray droplet ions with different sizes and charges
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Includes: Supplementary data
Journal Articles

Design of a large nonevaporable getter pump for the full size ITER beam source prototype

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E. Sartori, M. Siragusa, G. Berton, C. Cavallini, S. Dal Bello, M. Fadone, L. Grando, D. Marcuzzi, D. Rizzetto, G. Serianni, P. Sonato, M. Zaupa, F. Dinh, A. Ferrara, E. Maccallini, M. Mura, F. Siviero, V. Toigo
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 034202 (2023)
https://doi.org/10.1116/6.0002395
Published: April 2023
View articletitled, Design of a large nonevaporable getter pump for the full size ITER beam source prototype
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Journal Articles

Effects of the temperature of a protic ionic liquid on ion beam production by vacuum electrospray

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Yukio Fujiwara
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 024202 (2023)
https://doi.org/10.1116/6.0002403
Published: March 2023
View articletitled, Effects of the temperature of a protic ionic liquid on ion beam production by vacuum electrospray
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Includes: Supplementary data
Journal Articles

Dysprosium liquid metal alloy ion source for magnetic nanostructures

Open Access
Lothar Bischoff, Nico Klingner, Paul Mazarov, Kilian Lenz, Ryszard Narkowicz, Wolfgang Pilz, Fabian Meyer
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 052802 (2022)
https://doi.org/10.1116/6.0001837
Published: August 2022
View articletitled, Dysprosium liquid metal alloy ion source for magnetic nanostructures
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Journal Articles

Ga-contamination-free scanning transmission electron microscope sample preparation by rectangular-shaped oxygen-ion-beam thinning using projection ion beam optical system

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Hiroyasu Shichi, Satoshi Tomimatsu
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 054003 (2020)
https://doi.org/10.1116/6.0000297
Published: September 2020
View articletitled, Ga-contamination-free scanning transmission electron microscope sample preparation by rectangular-shaped oxygen-ion-beam thinning using projection ion beam optical system
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Journal Articles

Observation of light and secondary ion emissions from surfaces irradiated with highly charged ions

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Naofumi Nishida, Makoto Sakurai, Daiji Kato, Hiroyuki A. Sakaue
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 044006 (2020)
https://doi.org/10.1116/6.0000042
Published: July 2020
View articletitled, Observation of light and secondary ion emissions from surfaces irradiated with highly charged ions
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Journal Articles

High current density electron emission from an electrodeposited metal nanowire array

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Tanouir Aloui, Matthew P. Kirley, Erik Vick, Allan Hilton, Pedro Colon, William Kim, Charles B. Parker, Jason J. Amsden, Jeffrey T. Glass, Kristin H. Gilchrist
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 043204 (2020)
https://doi.org/10.1116/6.0000135
Published: July 2020
View articletitled, High current density electron emission from an electrodeposited metal nanowire array
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Journal Articles

Ionization probability of sputtered indium atoms under impact of slow highly charged ions

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Matthias Herder, Philipp Ernst, Lucia Skopinski, Boris Weidtmann, Marika Schleberger, Andreas Wucher
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 044003 (2020)
https://doi.org/10.1116/6.0000171
Published: May 2020
View articletitled, Ionization probability of sputtered indium atoms under impact of slow highly charged ions
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Journal Articles

Analysis of useful ion yield for Si in GaN by secondary ion mass spectrometry

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M. K. Indika Senevirathna, Mark Vernon, Graham A. Cooke, Garnett B. Cross, Alexander Kozhanov, Michael D. Williams
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 044002 (2020)
https://doi.org/10.1116/6.0000138
Published: May 2020
View articletitled, Analysis of useful ion yield for Si in GaN by secondary ion mass spectrometry
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Journal Articles

Boron liquid metal alloy ion sources for special focused ion beam applications

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Lothar Bischoff, Nico Klingner, Paul Mazarov, Wolfgang Pilz, Fabian Meyer
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 042801 (2020)
https://doi.org/10.1116/6.0000073
Published: May 2020
View articletitled, Boron liquid metal alloy ion sources for special focused ion beam applications
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Journal Articles

Analysis of useful ion yield for the Mg dopant in GaN by quadrupole—SIMS

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M. K. Indika Senevirathna, Michael D. Williams, Graham A. Cooke, Alexander Kozhanov, Mark Vernon, Garnett B. Cross
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034015 (2020)
https://doi.org/10.1116/1.5144500
Published: April 2020
View articletitled, Analysis of useful ion yield for the Mg dopant in GaN by quadrupole—SIMS
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Journal Articles

Secondary ion mass spectrometry measurements under ambient and humid conditions using MeV ions

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Toshio Seki, Kenta Ishii, Takaaki Aoki, Jiro Matsuo
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034014 (2020)
https://doi.org/10.1116/1.5145014
Published: April 2020
View articletitled, Secondary ion mass spectrometry measurements under ambient and humid conditions using MeV ions
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Journal Articles

Improvement of ionization yield in sputtered neutral mass spectrometry using pulsed infrared and ultraviolet lasers

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Reiko Saito, Haruko Akutsu, Jun Asakawa, Yue Zhao, Kei Kiyokawa, Masato Morita, Tetsuo Sakamoto, Masaaki Fujii
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034011 (2020)
https://doi.org/10.1116/6.0000088
Published: April 2020
View articletitled, Improvement of ionization yield in sputtered neutral mass spectrometry using pulsed infrared and ultraviolet lasers
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Journal Articles

Comparison of quantitative analyses using SIMS, atom probe tomography, and femtosecond laser ablation inductively coupled plasma mass spectrometry with Si1−XGeX and Fe1−X NiX binary alloys

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Yun Jung Jang, Seon Hee Kim, Kyung Joong Kim, Donghwan Kim, Yeonhee Lee
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034009 (2020)
https://doi.org/10.1116/6.0000101
Published: April 2020
View articletitled, Comparison of quantitative analyses using SIMS, atom probe tomography, and femtosecond laser ablation inductively coupled plasma mass spectrometry with Si1−XGeX and Fe1−X NiX binary alloys
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Journal Articles

Band offsets at amorphous hydrogenated boron nitride/high-k oxide interfaces from x-ray photoelectron spectroscopy with charging effects analysis

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Michelle M. Paquette, Anthony N. Caruso, Justin Brockman, Jeff Bielefeld, Markus Kuhn, Sean W. King
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 030601 (2020)
https://doi.org/10.1116/6.0000005
Published: April 2020
View articletitled, Band offsets at amorphous hydrogenated boron nitride/high-k oxide interfaces from x-ray photoelectron spectroscopy with charging effects analysis
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Journal Articles

Structural analysis of organic ultrathin-layer by using Ar-gas-cluster ion beam sputter collecting method

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Hiroyuki Noda, Yoshiteru Sasaki, Daigo Murai, Masaki Hachiya
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034003 (2020)
https://doi.org/10.1116/6.0000102
Published: April 2020
View articletitled, Structural analysis of organic ultrathin-layer by using Ar-gas-cluster ion beam sputter collecting method
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Journal Articles

Effects of polymer crystallization on the molecular sensitivity in TOF-SIMS measurements using Bi1+ and Bi32+ ions

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Rie Shishido, Masaya Mitsuishi, Shigeru Suzuki
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034004 (2020)
https://doi.org/10.1116/6.0000015
Published: April 2020
View articletitled, Effects of polymer crystallization on the molecular sensitivity in TOF-SIMS measurements using Bi1+ and Bi32+ ions
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