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Journal Articles
Theoretical investigation of the enhancement factor for a single field emitter in close proximity to the counter electrode
Available to Purchase
J. Vac. Sci. Technol. B 36, 06JL01 (2018)
Published: September 2018
Journal Articles
2D/3D image charge for modeling field emission
Open Access
J. Vac. Sci. Technol. B 35, 02C101 (2017)
Published: November 2016
Journal Articles
Fast aerial image simulations for partially coherent systems by transmission cross coefficient decomposition with analytical kernels
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J. Vac. Sci. Technol. B 30, 06FG03 (2012)
Published: November 2012
Journal Articles
Space charge, emittance, trajectories, and the modeling of field emitter arrays
Available to Purchase
J. Vac. Sci. Technol. B 29, 02B101 (2011)
Published: January 2011
Journal Articles
Electronic and field emission properties of two-dimensional nanotori
Available to Purchase
J. Vac. Sci. Technol. B 29, 02B105 (2011)
Published: January 2011
Journal Articles
Simple derivation of the formula for Sommerfeld supply density used in electron-emission physics and limitations on its use
Available to Purchase
J. Vac. Sci. Technol. B 28, 1326–1329 (2010)
Published: December 2010
Journal Articles
Numerical testing of the Fowler–Nordheim equation for the electronic field emission from a flat metal and proposition for an improved equation
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J. Vac. Sci. Technol. B 28, 758–762 (2010)
Published: July 2010
Journal Articles
Configuration-dependent enhancements of electric fields near the quadruple and the triple junction
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J. Vac. Sci. Technol. B 28, C2A94–C2A97 (2010)
Published: April 2010
Journal Articles
General theoretical model for the vapor-phase growth and growth rate of semiconductor nanowires
Available to Purchase
J. Vac. Sci. Technol. B 28, 329–352 (2010)
Published: March 2010
Journal Articles
Measuring the nose roundness of diamond cutting tools based on atomic force microscopy
Available to Purchase
J. Vac. Sci. Technol. B 27, 1394–1398 (2009)
Published: May 2009
Journal Articles
Field emission pattern of carbon nanotubes and phase distribution of wave function in the end cap structure
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J. Vac. Sci. Technol. B 27, 766–771 (2009)
Published: March 2009
Journal Articles
Multilevel visualization of local electric field at probe apex using scanning electron microscopy
Available to Purchase
J. Vac. Sci. Technol. B 26, 2069–2072 (2008)
Published: December 2008
Journal Articles
Economic approximate models for backscattered electrons
Available to Purchase
J. Vac. Sci. Technol. B 25, 2425–2429 (2007)
Published: December 2007
Journal Articles
Accurate control of remaining resist depth for nanoscale three-dimensional structures in electron-beam grayscale lithography
Available to Purchase
J. Vac. Sci. Technol. B 25, 2008–2012 (2007)
Published: December 2007
Journal Articles
Theoretical analysis of triple junction field emission for a type of cold cathode
Available to Purchase
J. Vac. Sci. Technol. B 24, 909–912 (2006)
Published: March 2006
Journal Articles
Integrated field effect transistors for microelectromechanical systems applications, modeling, and results
Available to Purchase
J. Vac. Sci. Technol. B 23, 1032–1035 (2005)
Published: May 2005
Journal Articles
Astigmatism measurement by lateral shearing interferometer
Available to PurchaseZhiqiang Liu, Kasumi Sugisaki, Mikihiko Ishii, Yucong Zhu, Jun Saito, Akiyosi Suzuki, Masanobu Hasegawa, Katsuhiko Murakami
J. Vac. Sci. Technol. B 22, 2980–2983 (2004)
Published: December 2004
Journal Articles
Electrostatic potential for a hyperbolic probe tip near a semiconductor
Available to Purchase
J. Vac. Sci. Technol. B 21, 2080–2088 (2003)
Published: September 2003
Journal Articles
Optimal coherent decompositions for radially symmetric optical systems
Available to Purchase
J. Vac. Sci. Technol. B 15, 2412–2416 (1997)
Published: November 1997
Journal Articles
Writing strategies of circular gratings for surface‐emitting lasers using focused ion‐beam (x–y coordinate) and electron‐beam (polar coordinate) lithography
Available to Purchase
J. Vac. Sci. Technol. B 12, 3626–3630 (1994)
Published: November 1994