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Journal Articles

Maximizing the performance of a field emission device by profiling the emitter’s height distribution

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Sergey V. Filippov, Fernando F. Dall’Agnol, Eugeni O. Popov, Anatoly G. Kolosko, Thiago A. de Assis
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 050601 (2023)
https://doi.org/10.1116/6.0003016
Published: September 2023
View articletitled, Maximizing the performance of a field emission device by profiling the emitter’s height distribution
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Journal Articles

Limitations of the independent control of ion flux and energy distribution function in high-density inductively coupled chlorine plasmas

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Dmitry Levko, Rochan R. Upadhyay, Kenta Suzuki, Laxminarayan L. Raja
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 012205 (2023)
https://doi.org/10.1116/6.0002236
Published: December 2022
View articletitled, Limitations of the independent control of ion flux and energy distribution function in high-density inductively coupled chlorine plasmas
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Journal Articles

Low-macroscopic field emission structure: Using the shape of the conductor to identify a local difference in electric potential

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Laurent Lapena, Alain Degiovanni, Victoria Tishkova, Evelyne Salançon
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 024004 (2022)
https://doi.org/10.1116/6.0001716
Published: March 2022
View articletitled, Low-macroscopic field emission structure: Using the shape of the conductor to identify a local difference in electric potential
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Journal Articles

Theoretical model for fast calculations of the electrical resistivity of thin metallic films with rough surfaces

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Alexander. A. Pribylov
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 022804 (2021)
https://doi.org/10.1116/6.0000781
Published: February 2021
View articletitled, Theoretical model for fast calculations of the electrical resistivity of thin metallic films with rough surfaces
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Journal Articles

Thermal study of multilayer resistive random access memories based on HfO2 and Al2O3 oxides

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Manuel Cazorla, Samuel Aldana, Marcos Maestro, Mireia Bargalló González, Francesca Campabadal, Enrique Moreno, Francisco Jiménez-Molinos, Juan Bautista Roldán
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 012204 (2019)
https://doi.org/10.1116/1.5058294
Published: January 2019
View articletitled, Thermal study of multilayer resistive random access memories based on HfO2 and Al2O3 oxides
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Journal Articles

Dynamic characteristics of beam perveance under thermal deformation for a three-grid ion thruster

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Jianfei Long, Xiaodong Wen
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 012905 (2019)
https://doi.org/10.1116/1.5051810
Published: January 2019
View articletitled, Dynamic characteristics of beam perveance under thermal deformation for a three-grid ion thruster
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Journal Articles

Theoretical investigation of the enhancement factor for a single field emitter in close proximity to the counter electrode

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Steve Lenk, Claudia Lenk, Ivo W. Rangelow
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 06JL01 (2018)
https://doi.org/10.1116/1.5046940
Published: September 2018
View articletitled, Theoretical investigation of the enhancement factor for a single field emitter in close proximity to the counter electrode
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Journal Articles

Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers

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Nunzio Tuccitto, Alessandra Bombace, Alberto Torrisi, Antonino Licciardello
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F124 (2018)
https://doi.org/10.1116/1.5019698
Published: March 2018
View articletitled, Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers
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Includes: Supplementary data
Journal Articles

Unexpected validity of Schottky's conjecture for two-stage field emitters: A response via Schwarz–Christoffel transformation

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Edgar Marcelino, Thiago A. de Assis, Caio M. C. de Castilho
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 35, 051801 (2017)
https://doi.org/10.1116/1.4989428
Published: August 2017
View articletitled, Unexpected validity of Schottky's conjecture for two-stage field emitters: A response via Schwarz–Christoffel transformation
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Journal Articles

Classical momentum gap for electron transport in vacuum and consequences for space charge in thermionic converters with a grid electrode

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Amir H. Khoshaman, Alireza Nojeh
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 040610 (2016)
https://doi.org/10.1116/1.4958801
Published: July 2016
View articletitled, Classical momentum gap for electron transport in vacuum and consequences for space charge in thermionic converters with a grid electrode
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Journal Articles

Operational characteristics of a graphene-based electron field emitter

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Gregory S. Bocharov, Alexander V. Eletskii, Dmitry G. Kvashnin, Leonid A. Chernozatonskii
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 33, 041801 (2015)
https://doi.org/10.1116/1.4921546
Published: May 2015
View articletitled, Operational characteristics of a graphene-based electron field emitter
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Journal Articles

Utilization of polarization-inverted AlInGaN or relatively thinner AlGaN electron blocking layer in InGaN-based blue–violet laser diodes

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Lingcong Le, Degang Zhao, Desheng Jiang, Ping Chen, Zongshun Liu, Jianjun Zhu, Jing Yang, Xiaojing Li, Xiaoguang He, Jianping Liu, Shuming Zhang, Hui Yang
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 33, 011209 (2015)
https://doi.org/10.1116/1.4905430
Published: January 2015
View articletitled, Utilization of polarization-inverted AlInGaN or relatively thinner AlGaN electron blocking layer in InGaN-based blue–violet laser diodes
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Journal Articles

Advanced methodology for electrical characterization of metal/high-k interfaces

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Rosario Rao, Paolo Lorenzi, Fernanda Irrera
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 32, 03D120 (2014)
https://doi.org/10.1116/1.4868366
Published: March 2014
View articletitled, Advanced methodology for electrical characterization of metal/high-k interfaces
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Journal Articles

Enhancement of AlGaN/GaN high electron mobility transistors off-state drain breakdown voltage via backside proton irradiation

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Shun Li, Ya-Hsi Hwang, Yueh-Ling Hsieh, Lei Lei, Fan Ren, Stephen J. Pearton, Erin Patrick, Mark E. Law, Camilo Velez Cuervo, David. J. Smith
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 32, 021203 (2014)
https://doi.org/10.1116/1.4864070
Published: February 2014
View articletitled, Enhancement of AlGaN/GaN high electron mobility transistors off-state drain breakdown voltage via backside proton irradiation
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Journal Articles

Universal three-dimensional nanofabrication for hard materials

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Kenji Yamazaki, Hiroshi Yamaguchi
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 31, 051802 (2013)
https://doi.org/10.1116/1.4817177
Published: August 2013
View articletitled, Universal three-dimensional nanofabrication for hard materials
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Includes: Supplementary data
Journal Articles

Using the 3D beam propagation method to model the effects of lithographic roughness on the attenuation of highly multimodal polymer waveguides

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Nicholas Riegel, Christopher Middlebrook, Kevin Kruse, Michael Roggemann
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 31, 031206 (2013)
https://doi.org/10.1116/1.4802979
Published: May 2013
View articletitled, Using the 3D beam propagation method to model the effects of lithographic roughness on the attenuation of highly multimodal polymer waveguides
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Journal Articles

Measurement of surface potential of insulating film on a conductive substrate in a scanning electron microscope specimen chamber

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Masatoshi Kotera, Akira Osada, Masaru Otani, Yasuhiro Ohara
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 29, 06F316 (2011)
https://doi.org/10.1116/1.3662079
Published: December 2011
View articletitled, Measurement of surface potential of insulating film on a conductive substrate in a scanning electron microscope specimen chamber
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Journal Articles

Field induced shape and work function modification for the ZrO/W(100) Schottky cathode

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K. Liu, G. A. Schwind, L. W. Swanson, J. A. Campbell
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 28, C6C26–C6C33 (2010)
https://doi.org/10.1116/1.3501362
Published: November 2010
View articletitled, Field induced shape and work function modification for the ZrO/W(100) Schottky cathode
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Journal Articles

Modeling of precursor coverage in ion-beam induced etching and verification with experiments using XeF 2 on SiO 2

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Christoph Ebm, Gerhard Hobler, Simon Waid, Heinz D. Wanzenboeck
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 28, 946–951 (2010)
https://doi.org/10.1116/1.3481139
Published: August 2010
View articletitled, Modeling of precursor coverage in ion-beam induced etching and verification with experiments using XeF 2 on SiO 2
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Journal Articles

Polarized emission from GaN/AlN quantum dots subject to uniaxial thermal interfacial stresses

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O. Moshe, D. H. Rich, B. Damilano, J. Massies
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 28, C5E25–C5E34 (2010)
https://doi.org/10.1116/1.3435325
Published: July 2010
View articletitled, Polarized emission from GaN/AlN quantum dots subject to uniaxial thermal interfacial stresses
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