1-20 of 741
Scanning tunneling microscopy
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Endoscope-assisted manipulator for precooling and deposition in low-temperature scanning tunneling microscope systems

Editor’s Pick
Ungdon Ham, Ji-Soo Yoon, Hyeonjung Kim, Jinho Lee, Tae-Hwan Kim
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 42, 062806 (2024)
https://doi.org/10.1116/6.0004090
Published: December 2024
View article titled, Endoscope-assisted manipulator for precooling and deposition in low-temperature scanning tunneling microscope systems
Open the PDF for Endoscope-assisted manipulator for precooling and deposition in low-temperature scanning tunneling microscope systems in another window
Journal Articles

Heating samples to 2000 °C and above for scanning tunneling microscopy studies in ultrahigh vacuum

Editor’s Pick
Buddhika S. A. Gedara, Michael Trenary
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 42, 014201 (2024)
https://doi.org/10.1116/6.0003280
Published: January 2024
View article titled, Heating samples to 2000 °C and above for scanning tunneling microscopy studies in ultrahigh vacuum
Open the PDF for Heating samples to 2000 °C and above for scanning tunneling microscopy studies in ultrahigh vacuum in another window
Includes: Supplementary data
Journal Articles

Multipurpose active scanning probe cantilevers for near-field spectroscopy, scanning tunnel imaging, and atomic-resolution lithography

Isaac Stricklin, Teodor Gotszalk, Mahmoud Behzadirad, Eberhard Manske, Thomas Kissinger, Ivo W. Rangelow, Tito L. Busani
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 042601 (2023)
https://doi.org/10.1116/6.0002486
Published: June 2023
View article titled, Multipurpose active scanning probe cantilevers for near-field spectroscopy, scanning tunnel imaging, and atomic-resolution lithography
Open the PDF for Multipurpose active scanning probe cantilevers for near-field spectroscopy, scanning tunnel imaging, and atomic-resolution lithography in another window
Journal Articles

Morphologic and electronic changes induced by thermally supported hydrogen cleaning of GaAs(110) facets

D. S. Rosenzweig, M. Schnedler, R. E. Dunin-Borkowski, Ph. Ebert, H. Eisele
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 044202 (2023)
https://doi.org/10.1116/6.0002733
Published: May 2023
View article titled, Morphologic and electronic changes induced by thermally supported hydrogen cleaning of GaAs(110) facets
Open the PDF for Morphologic and electronic changes induced by thermally supported hydrogen cleaning of GaAs(110) facets in another window
Journal Articles

Electronic structure of InSb (001), (110), and (111)B surfaces

Editor’s Pick
Jason T. Dong, Hadass S. Inbar, Mihir Pendharkar, Teun A. J. van Schijndel, Elliot C. Young, Connor P. Dempsey, Christopher J. Palmstrøm
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 032808 (2023)
https://doi.org/10.1116/6.0002606
Published: May 2023
View article titled, Electronic structure of InSb (001), (110), and (111)B surfaces
Open the PDF for Electronic structure of InSb (001), (110), and (111)B surfaces in another window
Includes: Supplementary data
Journal Articles

Selective growth of graphene films on gallium-focused ion beam irradiated domains

Editor’s Pick
Jacques Gierak, Gilles Raynaud, Caroline Guiziou, Jean René Coudevylle, Ali Madouri, Lars Bruchhaus, Achim Nadzeyka, Björn Whittman, Ralf Jede, Christophe David, Jean Christophe Girard
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 052602 (2022)
https://doi.org/10.1116/6.0002104
Published: September 2022
View article titled, Selective growth of graphene films on gallium-focused ion beam irradiated domains
Open the PDF for Selective growth of graphene films on gallium-focused ion beam irradiated domains in another window
Journal Articles

Atomic-resolution lithography with an on-chip scanning tunneling microscope

Editor’s Pick
Afshin Alipour, Emma L. Fowler, S. O. Reza Moheimani, James H. G. Owen, John N. Randall
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 030603 (2022)
https://doi.org/10.1116/6.0001826
Published: April 2022
View article titled, Atomic-resolution lithography with an on-chip scanning tunneling microscope
Open the PDF for Atomic-resolution lithography with an on-chip scanning tunneling microscope in another window
Journal Articles

Hydrogen etching of the SiC(0001) surface at moderate temperature

Toshiya Hamasaki, Kazuma Yagyu, Hisashi Mitani, Takashi Nishida, Hiroshi Tochihara, Takayuki Suzuki
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 052801 (2021)
https://doi.org/10.1116/6.0001147
Published: July 2021
View article titled, Hydrogen etching of the SiC(0001) surface at moderate temperature
Open the PDF for Hydrogen etching of the SiC(0001) surface at moderate temperature in another window
Journal Articles

Atomic precision imaging with an on-chip scanning tunneling microscope integrated into a commercial ultrahigh vacuum STM system

Afshin Alipour, S. O. Reza Moheimani, James H. G. Owen, Ehud Fuchs, John N. Randall
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 040603 (2021)
https://doi.org/10.1116/6.0001107
Published: June 2021
View article titled, Atomic precision imaging with an on-chip scanning tunneling microscope integrated into a commercial ultrahigh vacuum STM system
Open the PDF for Atomic precision imaging with an on-chip scanning tunneling microscope integrated into a commercial ultrahigh vacuum STM system in another window
Journal Articles

Ultrafast method for scanning tunneling spectroscopy

Hamed Alemansour, S. O. Reza Moheimani, James H. G. Owen, John N. Randall, Ehud Fuchs
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 042802 (2021)
https://doi.org/10.1116/6.0001087
Published: June 2021
View article titled, Ultrafast method for scanning tunneling spectroscopy
Open the PDF for Ultrafast method for scanning tunneling spectroscopy in another window
Journal Articles

High signal-to-noise ratio differential conductance spectroscopy

Editor’s Pick
Hamed Alemansour, S. O. Reza Moheimani, James H. G. Owen, John N. Randall, Ehud Fuchs
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 010601 (2021)
https://doi.org/10.1116/6.0000823
Published: January 2021
View article titled, High signal-to-noise ratio differential conductance spectroscopy
Open the PDF for High signal-to-noise ratio differential conductance spectroscopy in another window
Journal Articles

Bias-voltage-dependent measurement of apparent barrier height on low-work-function thin film

Katsumi Nagaoka, Shun-ichiro Ohmi
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 062801 (2020)
https://doi.org/10.1116/6.0000436
Published: October 2020
View article titled, Bias-voltage-dependent measurement of apparent barrier height on low-work-function thin film
Open the PDF for Bias-voltage-dependent measurement of apparent barrier height on low-work-function thin film in another window
Journal Articles

Simple, low degree-of-freedom load-lock and in-vacuum sample transfer

Catlin N. Schalk, David A. Turner, Ashley R. Gans-Forrest, Matthew M. Jobbins, S. Alex Kandel
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 054201 (2020)
https://doi.org/10.1116/6.0000495
Published: September 2020
View article titled, Simple, low degree-of-freedom load-lock and in-vacuum sample transfer
Open the PDF for Simple, low degree-of-freedom load-lock and in-vacuum sample transfer in another window
Includes: Supplementary data
Journal Articles

Direct molecular quantification of electronic disorder in N,N′-Di-[(1-naphthyl)-N,N′-diphenyl]-1,1′-biphenyl)-4,4′-diamine on Au(111)

Jiuyang Wang, Jingying Wang, Daniel B. Dougherty
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 053401 (2020)
https://doi.org/10.1116/6.0000401
Published: August 2020
View article titled, Direct molecular quantification of electronic disorder in <em>N,N</em>′-Di-[(1-naphthyl)-<em>N,N</em>′-diphenyl]-1,1′-biphenyl)-4,4′-diamine on Au(111)
Open the PDF for Direct molecular quantification of electronic disorder in <em>N,N</em>′-Di-[(1-naphthyl)-<em>N,N</em>′-diphenyl]-1,1′-biphenyl)-4,4′-diamine on Au(111) in another window
Journal Articles

Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques

Editor’s Pick
Markus Ahlskog, Matti J. Hokkanen, Dmitry Levshov, Krister Svensson, Alexander Volodin, Chris van Haesendonck
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 042804 (2020)
https://doi.org/10.1116/6.0000187
Published: June 2020
View article titled, Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques
Open the PDF for Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques in another window
Journal Articles

Adsorption behavior of cobalt phthalocyanine submonolayer coverages on B-Si(111)- 3 × 3 R 30 °

Scilight
Milan Kubicki, Susi Lindner, Martin Franz, Holger Eisele, Mario Dähne
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 042803 (2020)
https://doi.org/10.1116/6.0000242
Published: June 2020
View article titled, Adsorption behavior of cobalt phthalocyanine submonolayer coverages on B-Si(111)- 3 × 3 R 30 °
Open the PDF for Adsorption behavior of cobalt phthalocyanine submonolayer coverages on B-Si(111)- 3 × 3 R 30 ° in another window
Journal Articles

Controlled removal of hydrogen atoms from H-terminated silicon surfaces

Hamed Alemansour, S. O. Reza Moheimani, James H. G. Owen, John N. Randall, Ehud Fuchs
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 040601 (2020)
https://doi.org/10.1116/6.0000241
Published: May 2020
View article titled, Controlled removal of hydrogen atoms from H-terminated silicon surfaces
Open the PDF for Controlled removal of hydrogen atoms from H-terminated silicon surfaces in another window
Journal Articles

Etching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy

Patrick Wallace Krantz, Venkat Chandrasekhar
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 024004 (2020)
https://doi.org/10.1116/1.5132848
Published: February 2020
View article titled, Etching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy
Open the PDF for Etching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy in another window
Journal Articles

Next generation of extreme-resolution electron beam lithography

John N. Randall, James H. G. Owen, Joseph Lake, Ehud Fuchs
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 061605 (2019)
https://doi.org/10.1116/1.5119392
Published: October 2019
View article titled, Next generation of extreme-resolution electron beam lithography
Open the PDF for Next generation of extreme-resolution electron beam lithography in another window
Journal Articles

Preparation of Ga-terminated negative electron affinity-GaAs (100) surface by HCl-isopropanol treatment for nanoanalysis by scanning tunneling microscopy

Ryutaro Fukuzoe, Masayuki Hirao, Daichi Yamanaka, Youta Iwabuchi, Hokuto Iijima, Takashi Meguro
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 06JK01 (2018)
https://doi.org/10.1116/1.5048060
Published: October 2018
View article titled, Preparation of Ga-terminated negative electron affinity-GaAs (100) surface by HCl-isopropanol treatment for nanoanalysis by scanning tunneling microscopy
Open the PDF for Preparation of Ga-terminated negative electron affinity-GaAs (100) surface by HCl-isopropanol treatment for nanoanalysis by scanning tunneling microscopy in another window