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Journal Articles

On the origins of the m/z = 19 signals in residual gas analysis

Sean Davies, Dane E. Walker, John A. Rees, David L. Seymour
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 41, 044203 (2023)
https://doi.org/10.1116/6.0002498
Published: May 2023
View article titled, On the origins of the m/z = 19 signals in residual gas analysis
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Journal Articles

Outgassing during large area field emitter operation in the diode system

Sergey V. Filippov, Anatoly G. Kolosko, Eugeni O. Popov
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 024002 (2022)
https://doi.org/10.1116/6.0001648
Published: February 2022
View article titled, Outgassing during large area field emitter operation in the diode system
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Includes: Supplementary data
Journal Articles

Stabilization of cold-field-emission current from a CeB6 single-crystal emitter by using a faceted (100) plane

Toshiaki Kusunoki, Tomihiro Hashizume, Keigo Kasuya, Noriaki Arai
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 013202 (2021)
https://doi.org/10.1116/6.0000739
Published: December 2020
View article titled, Stabilization of cold-field-emission current from a CeB<sub>6</sub> single-crystal emitter by using a faceted (100) plane
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Journal Articles

Fusion data analysis of imaging data of hydrogen-permeated steel obtained by complementary methods

Tomomi Akiyama, Naoya Miyauchi, Akiko N. Itakura, Takayuki Yamagishi, Satoka Aoyagi
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 034007 (2020)
https://doi.org/10.1116/6.0000009
Published: April 2020
View article titled, Fusion data analysis of imaging data of hydrogen-permeated steel obtained by complementary methods
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Journal Articles

Predicting radiation-induced carbon contamination of EUV optics

Jeromy T. Hollenshead, Leonard E. Klebanoff, Gil Delgado
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 021602 (2019)
https://doi.org/10.1116/1.5072797
Published: February 2019
View article titled, Predicting radiation-induced carbon contamination of EUV optics
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Includes: Supplementary data
Journal Articles

High emission current of 1000 μA at 4 × 10−10 Pa from W⟨310⟩ cold field emitter in electron gun

Keigo Kasuya, Souichi Katagiri, Takashi Ohshima
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 34, 042202 (2016)
https://doi.org/10.1116/1.4953070
Published: June 2016
View article titled, High emission current of 1000 <em>μ</em>A at 4 × 10<sup>−10 </sup>Pa from W⟨310⟩ cold field emitter in electron gun
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Journal Articles

Mass-spectrum investigation of the phenomena accompanying field electron emission

Eugeni O. Popov, Anatoly G. Kolosko, Sergey V. Filippov, Igor L. Fedichkin, Pavel A. Romanov
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 33, 03C109 (2015)
https://doi.org/10.1116/1.4906161
Published: January 2015
View article titled, Mass-spectrum investigation of the phenomena accompanying field electron emission
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Journal Articles

Patterned atomic layer epitaxy of Si/Si(001):H

James H. G. Owen, Joshua Ballard, John N. Randall, Justin Alexander, James R. Von Ehr
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 29, 06F201 (2011)
https://doi.org/10.1116/1.3628673
Published: August 2011
View article titled, Patterned atomic layer epitaxy of Si/Si(001):H
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Journal Articles

Electron beam induced etching of silicon with SF 6

N. Vanhove, P. Lievens, W. Vandervorst
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 28, 1206–1209 (2010)
https://doi.org/10.1116/1.3504594
Published: October 2010
View article titled, Electron beam induced etching of silicon with SF 6
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Journal Articles

Photoyield recovery of Cs + NF 3 activated negative electron affinity GaAs photoemitters without additional alkali deposition

G. A. Mulhollan, J. C. Bierman
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 28, 899–902 (2010)
https://doi.org/10.1116/1.3478712
Published: August 2010
View article titled, Photoyield recovery of Cs + NF 3 activated negative electron affinity GaAs photoemitters without additional alkali deposition
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Journal Articles

Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and image of an Al atom cluster

Yahachi Saito, Tomohiro Matsukawa, Koji Asaka, Hitoshi Nakahara
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 28, C2A5–C2A8 (2010)
https://doi.org/10.1116/1.3271173
Published: March 2010
View article titled, Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and image of an Al atom cluster
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Journal Articles

Atomic precision lithography on Si

J. N. Randall, J. W. Lyding, S. Schmucker, J. R. Von Ehr, J. Ballard, R. Saini, H. Xu, Y. Ding
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 27, 2764–2768 (2009)
https://doi.org/10.1116/1.3237096
Published: December 2009
View article titled, Atomic precision lithography on Si
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Journal Articles

Concept and operation of Schottky emitter without suppressor electrode

A. K. Dokania, P. Kruit
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 27, 2426–2431 (2009)
https://doi.org/10.1116/1.3258657
Published: November 2009
View article titled, Concept and operation of Schottky emitter without suppressor electrode
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Journal Articles

Hyperthermal atomic hydrogen and oxygen etching of vertically oriented graphene sheets

M. Bagge-Hansen, R. A. Outlaw, M. Y. Zhu, H. J. Chen, D. M. Manos
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 27, 2413–2419 (2009)
https://doi.org/10.1116/1.3263245
Published: November 2009
View article titled, Hyperthermal atomic hydrogen and oxygen etching of vertically oriented graphene sheets
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Journal Articles

Scanning tunneling microscope–cathodoluminescence measurement of the GaAs/AlGaAs heterostructure

Kentaro Watanabe, Yoshiaki Nakamura, Masakazu Ichikawa, Shigeyuki Kuboya, Ryuji Katayama, Kentaro Onabe
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 27, 1874–1880 (2009)
https://doi.org/10.1116/1.3155827
Published: June 2009
View article titled, Scanning tunneling microscope–cathodoluminescence measurement of the GaAs/AlGaAs heterostructure
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Journal Articles

Multi-walled nanotube polymer composite degradation under high emission current regime as revealed by mass spectrometry

E. O. Popov, A. A. Pashkevich, A. O. Pozdnyakov, O. F. Pozdnyakov
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 26, 745–750 (2008)
https://doi.org/10.1116/1.2894895
Published: April 2008
View article titled, Multi-walled nanotube polymer composite degradation under high emission current regime as revealed by mass spectrometry
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Journal Articles

Measurements of local optical properties of Si-doped GaAs (110) surfaces using modulation scanning tunneling microscope cathodoluminescence spectroscopy

Kentaro Watanabe, Yoshiaki Nakamura, Masakazu Ichikawa
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 26, 195–200 (2008)
https://doi.org/10.1116/1.2830640
Published: January 2008
View article titled, Measurements of local optical properties of Si-doped GaAs (110) surfaces using modulation scanning tunneling microscope cathodoluminescence spectroscopy
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Journal Articles

Residual gas analysis based on carbon nanotube field emission display

Jinchan Wang, Xiaobing Zhang, Wei Lei, Mei Xiao, Yunkang Cui, Yunsong Di, Fuming Mao
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 25, 615–617 (2007)
https://doi.org/10.1116/1.2715970
Published: March 2007
View article titled, Residual gas analysis based on carbon nanotube field emission display
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Journal Articles

Gettering by Ba films in color cathode ray tubes

Daniel den Engelsen, Bruno Ferrario
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 22, 809–817 (2004)
https://doi.org/10.1116/1.1689973
Published: March 2004
View article titled, Gettering by Ba films in color cathode ray tubes
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Journal Articles

Feasibility of thin film microfabricated hydrogen ion sources

Robert H. Reuss, Babu R. Chalamala
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 20, 1132–1134 (2002)
https://doi.org/10.1116/1.1473181
Published: June 2002
View article titled, Feasibility of thin film microfabricated hydrogen ion sources
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