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Journal Articles
Method for monitoring high aspect ratio contact dry etching process using calibration and normalization method for optical emission spectroscopy
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J. Vac. Sci. Technol. B 43, 044202 (2025)
Published: June 2025
Journal Articles
Influence of etching profile on pattern collapse in complementary metal oxide semiconductor image sensor pixel with deep trench isolation
Available to PurchaseClément Sart, Jérôme Dubois, Emilie Prevost, Philippe Garnier, Benjamin Vianne, Frédéric Giovannoni, Caroline Bringolf-Penner, Sébastien Gallois-Garreignot
J. Vac. Sci. Technol. B 43, 033203 (2025)
Published: April 2025
Journal Articles
Measurement of field emission array current distributions by metal-coated CMOS image sensors
Mattias Hausladen, Andreas Schels, Philipp Buchner, Mathias Bartl, Ali Asgharzade, Simon Edler, Dominik Wohlfartsstätter, Michael Bachmann, Rupert Schreiner
J. Vac. Sci. Technol. B 42, 062209 (2024)
Published: November 2024
Journal Articles
Correlation between electromigration-related void volumes and time-to-failure, the high-resolution x-ray tomography’s vital support
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J. Vac. Sci. Technol. B 38, 044004 (2020)
Published: June 2020
Journal Articles
Fabrication and optical behavior of graded-index, moth-eye antireflective structures in CdTe
Lesley Chan, Amitabh Ghoshal, Eric A. DeCuir, Jr., Yuan Ping Chen, Daniel E. Morse, Michael J. Gordon
J. Vac. Sci. Technol. B 35, 011201 (2017)
Published: December 2016
Journal Articles
Electrostatic-focusing image sensor with volcano-structured Spindt-type field emitter array
Available to PurchaseYuki Honda, Masakazu Nanba, Kazunori Miyakawa, Misao Kubota, Masayoshi Nagao, Yoichiro Neo, Hidenori Mimura, Norifumi Egami
J. Vac. Sci. Technol. B 34, 052201 (2016)
Published: July 2016
Journal Articles
J. Vac. Sci. Technol. B 34, 041220 (2016)
Published: June 2016
Journal Articles
Beam profile measurement of volcano-structured double-gate Spindt-type field emitter arrays
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J. Vac. Sci. Technol. B 34, 02G108 (2016)
Published: March 2016
Journal Articles
Electron beam collimation from an all-metal double-gate 40 000 nanotip array: Improved emission current and beam uniformity upon neon gas conditioning
Available to PurchasePratyush Das Kanungo, Patrick Helfenstein, Vitaliy Guzenko, Chiwon Lee, Martin Paraliev, Soichiro Tsujino
J. Vac. Sci. Technol. B 33, 03C113 (2015)
Published: April 2015
Journal Articles
Active-matrix Spindt-type field emitter array with faster response time for image sensor with high-gain avalanche rushing amorphous photoconductor target
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J. Vac. Sci. Technol. B 33, 012205 (2015)
Published: January 2015
Journal Articles
Minority carrier lifetime of lattice-matched CdZnTe alloy grown on InSb substrates using molecular beam epitaxy
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J. Vac. Sci. Technol. B 33, 011207 (2015)
Published: January 2015
Journal Articles
Development of gasbag-assisted ultraviolet-based imprinting process for replication of microstructures onto cylindrical surface
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J. Vac. Sci. Technol. B 32, 051802 (2014)
Published: August 2014
Journal Articles
Impact of electron scattering in extreme ultraviolet reflective multilayer on electron image
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J. Vac. Sci. Technol. B 31, 06F601 (2013)
Published: August 2013
Journal Articles
Evidence of long-wave-infrared excited state transition at high temperature (200 K) in 35-layer In0.50Ga0.50As/GaAs quantum dot infrared photodetector
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J. Vac. Sci. Technol. B 31, 03C128 (2013)
Published: April 2013
Journal Articles
High performance long-wave type-II superlattice infrared detectors
Available to PurchaseArezou Khoshakhlagh, Linda Höglund, David Z. Ting, Cory J. Hill, Sam A. Keo, Alexander Soibel, Jean Nguyen, Sarath D. Gunapala
J. Vac. Sci. Technol. B 31, 03C122 (2013)
Published: April 2013
Journal Articles
MBE growth of GaSb-based photodetectors on 6-inch diameter GaAs substrates via select buffers
Available to PurchaseJoel M. Fastenau, Dmitri Lubyshev, Yueming Qiu, Amy W. K. Liu, Edwin J. Koerperick, Jon T. Olesberg, Dennis Norton, Jr.
J. Vac. Sci. Technol. B 31, 03C106 (2013)
Published: February 2013
Journal Articles
Evaluation of lithographic performance of extreme ultra violet mask using coherent scattering microscope
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J. Vac. Sci. Technol. B 30, 06F504 (2012)
Published: November 2012
Journal Articles
High resolution patterning on nonplanar substrates with large height variation using electron beam lithography
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J. Vac. Sci. Technol. B 30, 06F303 (2012)
Published: October 2012
Journal Articles
Quasistatic and dynamic mechanical properties of Al–Si–Cu structural films in uniaxial tension
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J. Vac. Sci. Technol. B 30, 031804 (2012)
Published: May 2012
Journal Articles
Temperature mapping using single wavelength pyrometry during epitaxial growth
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J. Vac. Sci. Technol. B 29, 060604 (2011)
Published: November 2011
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