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Journal Articles

Comparative studies of metamorphic and strained InGaAs p-type semiconductor - intrinsic absorption layer - n-type semiconductor photodetector for low-temperature CH4 detection

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Xueting Du, Kai Niu, Wei Mi, Di Wang, Yan Zhu, Lin’an He, Liwei Zhou, Juan Wang, Xingcheng Zhang, Jinshi Zhao
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 42, 062207 (2024)
https://doi.org/10.1116/6.0004069
Published: November 2024
View articletitled, Comparative studies of metamorphic and strained InGaAs p-type semiconductor - intrinsic absorption layer - n-type semiconductor photodetector for low-temperature CH4 detection
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Journal Articles

Current–voltage characteristics of Ag/Nb:SrTiO3/Ag and Au/Nb:SrTiO3/Ag heterostructures

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Weibai Bian, Chen Han, Jiqiang Jia, Xiaoqin Liu
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 42, 054005 (2024)
https://doi.org/10.1116/6.0003843
Published: September 2024
View articletitled, Current–voltage characteristics of Ag/Nb:SrTiO3/Ag and Au/Nb:SrTiO3/Ag heterostructures
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Journal Articles

Development of aspect ratio trapping growth of GeSn on Si for midwave infrared applications

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Hryhorii Stanchu, Grey Abernathy, Joshua Grant, Fernando M. de Oliveira, Yuriy I. Mazur, Jifeng Liu, Wei Du, Baohua Li, Gregory J. Salamo, Shui-Qing Yu
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 42, 042802 (2024)
https://doi.org/10.1116/6.0003734
Published: July 2024
View articletitled, Development of aspect ratio trapping growth of GeSn on Si for midwave infrared applications
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Journal Articles

Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications

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Haochen Zhao, Suho Park, Guangyang Lin, Yuying Zhang, Tuofu Zhama, Chandan Samanta, Lorry Chang, Xiaofeng Zhu, Xu Feng, Kevin O. Díaz-Aponte, Lin Cong, Yuping Zeng
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 42, 042205 (2024)
https://doi.org/10.1116/6.0003561
Published: June 2024
View articletitled, Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications
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Includes: Supplementary data
Journal Articles

Group-IV based pin photodetectors for C-band application

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Michael Oehme, Maurice Wanitzek, Christian Spieth, Lukas Seidel, Michael Hack, Erich Kasper, Daniel Schwarz
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 42, 033202 (2024)
https://doi.org/10.1116/6.0003556
Published: April 2024
View articletitled, Group-IV based pin photodetectors for C-band application
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Journal Articles

Photoinduced carrier transport mechanism in pn- and nn-GaN/GaON heterojunctions

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Xiaojun Sun, Chao Wu, Yachao Wang, Daoyou Guo
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 40, 012204 (2022)
https://doi.org/10.1116/6.0001601
Published: January 2022
View articletitled, Photoinduced carrier transport mechanism in pn- and nn-GaN/GaON heterojunctions
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Journal Articles

Planar figure-8 coils for ultra-focal and directional micromagnetic brain stimulation

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Hongbae Jeong, Jiangdong Deng, Giorgio Bonmassar
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 39, 063202 (2021)
https://doi.org/10.1116/6.0001281
Published: October 2021
View articletitled, Planar figure-8 coils for ultra-focal and directional micromagnetic brain stimulation
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Journal Articles

Effects of mask material conductivity on lateral undercut etching in silicon nano-pillar fabrication

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Ripon Kumar Dey, Huseyin Ekinci, Bo Cui
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 38, 012207 (2020)
https://doi.org/10.1116/1.5123601
Published: January 2020
View articletitled, Effects of mask material conductivity on lateral undercut etching in silicon nano-pillar fabrication
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Journal Articles

Sub-rf period electrical characterization of a pulsed capacitively coupled argon plasma

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Alex F. Press, Matthew J. Goeckner, Lawrence J. Overzet
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 062926 (2019)
https://doi.org/10.1116/1.5132753
Published: November 2019
View articletitled, Sub-rf period electrical characterization of a pulsed capacitively coupled argon plasma
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Journal Articles

Measurement method for plume divergence angle of Hall thrusters

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Yongjie Ding, Hongbo Su, Hong Li, Boyang Jia, Liqiu Wei, Wuji Peng, Yanlin Hu, Wei Mao, Daren Yu
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 37, 012902 (2019)
https://doi.org/10.1116/1.5037440
Published: January 2019
View articletitled, Measurement method for plume divergence angle of Hall thrusters
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Journal Articles

Effect of magnetic field directionality on discharging characteristics of Hall effect thruster with azimuthal diversion rail

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Yongjie Ding, Hongbo Su, Lei Wang, Hong Li, Liqiu Wei, Boyang Jia, Hezhi Sun, Peng Li, Daren Yu
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 062801 (2018)
https://doi.org/10.1116/1.5037215
Published: October 2018
View articletitled, Effect of magnetic field directionality on discharging characteristics of Hall effect thruster with azimuthal diversion rail
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Journal Articles

Effects of annular-cylindrical combined channel Hall thruster length on the discharge characteristics

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Yongjie Ding, Hongbo Su, Boyang Jia, Hong Li, Liqiu Wei, Peng Li, Hezhi Sun, Daren Yu
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 062601 (2018)
https://doi.org/10.1116/1.5037740
Published: October 2018
View articletitled, Effects of annular-cylindrical combined channel Hall thruster length on the discharge characteristics
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Journal Articles

Highly parallel scanning tunneling microscope based hydrogen depassivation lithography

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John N. Randall, James H. G. Owen, Joseph Lake, Rahul Saini, Ehud Fuchs, Mohammad Mahdavi, S. O. Reza Moheimani, Benjamin Carrion Schaefer
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 06JL05 (2018)
https://doi.org/10.1116/1.5047939
Published: October 2018
View articletitled, Highly parallel scanning tunneling microscope based hydrogen depassivation lithography
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Journal Articles

First-order reversal curve diagrams for characterizing ferroelectricity of Hf0.5Zr0.5O2 films grown at different rates

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Youngin Goh, Sanghun Jeon
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 052204 (2018)
https://doi.org/10.1116/1.5046762
Published: September 2018
View articletitled, First-order reversal curve diagrams for characterizing ferroelectricity of Hf0.5Zr0.5O2 films grown at different rates
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Journal Articles

Extraction of the current distribution out of saturated integral measurement data of p-type silicon field emitter arrays

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Janis Breuer, Michael Bachmann, Felix Düsberg, Andreas Pahlke, Simon Edler, Christoph Langer, Christian Prommesberger, Robert Ławrowski, Rupert Schreiner, Pavel Serbun, Dirk Lützenkirchen-Hecht
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 051805 (2018)
https://doi.org/10.1116/1.5035189
Published: September 2018
View articletitled, Extraction of the current distribution out of saturated integral measurement data of p-type silicon field emitter arrays
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Journal Articles

Electrical and optical characterization of CdTe solar cells with CdS and CdSe buffers—A comparative study

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Md Dalim Mia, Craig H. Swartz, Sanjoy Paul, Sandeep Sohal, Corey R. Grice, Yanfa Yan, Mark Holtz, Jian V. Li
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 052904 (2018)
https://doi.org/10.1116/1.5044219
Published: September 2018
View articletitled, Electrical and optical characterization of CdTe solar cells with CdS and CdSe buffers—A comparative study
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Journal Articles

Effect of adding an insulator between metal and semiconductor layers on contact resistance

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Hyunjung Kim, Woochool Jang, Heewoo Lim, Youngkyun Kweon, Minwook Bang, Saejin Kwon, Bumsik Kim, Haewon Cho, Hyeongtag Jeon
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 032202 (2018)
https://doi.org/10.1116/1.5020310
Published: April 2018
View articletitled, Effect of adding an insulator between metal and semiconductor layers on contact resistance
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Journal Articles

Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers

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Nunzio Tuccitto, Alessandra Bombace, Alberto Torrisi, Antonino Licciardello
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 03F124 (2018)
https://doi.org/10.1116/1.5019698
Published: March 2018
View articletitled, Effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers
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Includes: Supplementary data
Journal Articles

Field emission characterization of in situ deposited gold nanocones with variable cone densities

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Johannes Bieker, Farough Roustaie, Helmut F. Schlaak, Christoph Langer, Rupert Schreiner, Marcel Lotz, Stefan Wilfert
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 02C105 (2018)
https://doi.org/10.1116/1.5009504
Published: January 2018
View articletitled, Field emission characterization of in situ deposited gold nanocones with variable cone densities
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Journal Articles

Electron emission from electrically isolated spheres

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Joshua T. Holgate, Michael Coppins
Journal: Journal of Vacuum Science & Technology B
J. Vac. Sci. Technol. B 36, 02C102 (2018)
https://doi.org/10.1116/1.5004748
Published: December 2017
View articletitled, Electron emission from electrically isolated spheres
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