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Vacuum Nanoelectronics

This Special Topic Collection is in conjunction with the 34th International Vacuum Nanoelectronics Conference, IVNC 2021, which was held virtually on July 5-9, 2021. This collection is devoted to the nanoscience and technology of vacuum electron sources and their applications. Topics covered include but are not limited to the understanding of the physics, chemistry, electron emission and beam properties of novel nano-emitters based on various electron emission mechanisms, as well as the materials, growth, and fabrication technologies of sources and vacuum electronic devices. The collection contains material from papers presented at IVNC 2021 as well as research articles that are on these topics but were not presented at the conference.

Guest Editors:
Stephen T. Purcell, Université Claude Bernard Lyon1
Kevin Jensen, Naval Research Laboratory
Jean-Paul Mazzelier, Thales Research and Technology

Image Credit: Robert Ławrowski, Michael Bachmann and Rupert Schreiner, JVST B 40, 023203 (2022); 10.1116/6.0001547

Nanoscale Science and Technology

On modeling the induced charge in density-functional calculations for field emitters

S. M. Masur; C. J. Edgcombe; C. H. W. Barnes

https://doi.org/10.1116/6.0001886

Review Articles

On the brightness, transverse emittance, and transverse coherence of field emission beam

Soichiro Tsujino

https://doi.org/10.1116/6.0001776

Measurement and Characterization

Outgassing during large area field emitter operation in the diode system

Sergey V. Filippov; Anatoly G. Kolosko; Eugeni O. Popov

https://doi.org/10.1116/6.0001648

Vacuum Measurement and Technology

Comparison of the effective parameters of single-tip tungsten emitter using Fowler–Nordheim and Murphy–Good plots

Eugeni O. Popov; Sergey V. Filippov; Anatoly G. Kolosko; Alexandr Knápek

https://doi.org/10.1116/6.0001645

Electronic and Optoelectronic Materials, Devices and Processing

Gate offset and emitter design effects of triode cold cathode electron beams on focal spot sizes for x-ray imaging techniques

Yi Yin Yu; Kyu Chang Park

https://doi.org/10.1116/6.0001588

Nanoscale Science and Technology

Negative differential resistance in photoassisted field emission from Si nanowires

M. Choueib; A. Derouet; P. Vincent; A. Ayari; S. Perisanu; P. Poncharal; C. S. Cojocaru; R. Martel; S. T. Purcell

https://doi.org/10.1116/6.0001650

Measurement and Characterization

All field emission models are wrong, … but are any of them useful?

Anthony Ayari; Pascal Vincent; Sorin Perisanu; Philippe Poncharal; Stephen T. Purcell

https://doi.org/10.1116/6.0001677

Microelectronic and Nanoelectronic Devices

Field emission arrays from graphite fabricated by laser micromachining

Robert Ławrowski; Michael Bachmann; Rupert Schreiner

https://doi.org/10.1116/6.0001547

Nanoscale Science and Technology

Thermal-field emission from cones and wires

Kevin L. Jensen; Michael S. McDonald; Mia K. Dhillon; Daniel Finkenstadt; Andrew Shabaev; Michael Osofsky

https://doi.org/10.1116/6.0001656

Letters

High current silicon nanowire field emitter arrays

Michael Bachmann; Felix Düsberg; Andreas Pahlke; Simon Edler; Andreas Schels; Florian Herdl; Robert Ławrowski; Rupert Schreiner

https://doi.org/10.1116/6.0001639

Vacuum Measurement and Technology

In situ quantitative field emission imaging using a low-cost CMOS imaging sensor

Andreas Schels; Simon Edler; Florian Herdl; Walter Hansch; Michael Bachmann; Daniela Ritter; Markus Dudeck; Felix Düsberg; Manuel Meyer; Andreas Pahlke; Matthias Hausladen; Philipp Buchner; Rupert Schreiner

https://doi.org/10.1116/6.0001551

Nanoscale Science and Technology

Field ion microscopy images of multilayered graphene and graphene oxide

Yahachi Saito

https://doi.org/10.1116/6.0001545

Letters

Experimental considerations in electron beam transport on a nanophotonic chip using alternating phase focusing

Roy Shiloh; Tomáš Chlouba; Peter Hommelhoff

https://doi.org/10.1116/6.0001598

Vacuum Measurement and Technology

Magnetron co-sputtered μm-thick Mo–Cu films as structural material with low heat extension for key parts of high-power millimeter-band vacuum microelectronic devices

Andrey V. Starodubov; Alexey A. Serdobintsev; Viktor V. Galushka; Ilya O. Kozhevnikov; Anton M. Pavlov; Giacomo Ulisse; Viktor Krozer; Nikita M. Ryskin

https://doi.org/10.1116/6.0001552

Microelectronic and Nanoelectronic Devices

Origin of the current saturation level of p-doped silicon field emitters

Simon Edler; Andreas Schels; Florian Herdl; Walter Hansch; Michael Bachmann; Markus Dudeck; Felix Düsberg; Andreas Pahlke; Matthias Hausladen; Philipp Buchner; Rupert Schreiner

https://doi.org/10.1116/6.0001554

Nanoscale Science and Technology