Skip to Main Content
Skip Nav Destination

Conference Collection: 8th International Conference on Spectroscopic Ellipsometry 2019, ICSE

This is a collection of papers originating from the 8th International Conference on Spectroscopic Ellipsometry 2019 (ICSE-8) held May 26–31, 2019 in Barcelona, Spain. The collection covers science and applications of spectroscopic ellipsometry and related techniques.

Image Credit: Nina Hong and James N. Hilfiker, JVST B 38, 014012 (2020); https://doi.org/10.1116/1.5129691

Special Collection Image
Nuwanjula S. Samarasingha; Stefan Zollner; Dipayan Pal; Rinki Singh; Sudeshna Chattopadhyay
Christian Negara; Thomas Längle; Jürgen Beyerer
Shirly Espinoza; Fabio Samparisi; Fabio Frassetto; Steffen Richter; Mateusz Rebarz; Ondrej Finke; Martin Albrecht; Matej Jurkovic; Ondrej Hort; Nicola Fabris; Anna Zymaková; Dong Du Mai; Roman Antipenkov; Jaroslav Nejdl; Luca Poletto; Jakob Andreasson
Jia Shen; Wei Liu; Yu Niu; Meng Li; Gang Jin
Agnieszka Chrzanowska; Sebastian Babiarz
Haoyu Liu; Jia Shen; Wei Liu; Yu Niu; Gang Jin
Christian Negara; Thomas Längle; Jürgen Beyerer
Stefan Schöche; Po-Hsun Ho; John A. Roberts; Shangjie J. Yu; Jonathan A. Fan; Abram L. Falk
Eugene Bortchagovsky
Corentin Guyot; Philippe Leclère; Michel Voué
Franziska Naumann; Johanna Reck; Hassan Gargouri; Bernd Gruska; Adrian Blümich; Ali Mahmoodinezhad; Christoph Janowitz; Karsten Henkel; Jan Ingo Flege
Alberto Alvarez-Fernandez; Guillaume Fleury; Virginie Ponsinet; Per Magnus Walmsness; Morten Kildemo
Nina Hong; James N. Hilfiker
Chien-Yuan Han; Meng-Ting Chen; Hong-Bin Lai; Shih-Hsiang Lai; Shih-Chin Lin
Pilar García Parejo; Antonio Campos-Jara; Enric García-Caurel; Oriol Arteaga; Alberto Álvarez-Herrero
Arturo Mendoza-Galván; Yuanyuan Li; Xuan Yang; Roger Magnusson; Kenneth Järrendahl; Lars Berglund; Hans Arwin
Hans Arwin; Roger Magnusson; Kenneth Järrendahl; Stefan Schoeche
Pierre Koleják; Daniel Vala; Kamil Postava; Pavlína Provazníková; Jaromír Pištora
Chia-Wei Chen; Matthias Hartrumpf; Thomas Längle; Jürgen Beyerer
Andreas Furchner; Christoph Kratz; Wojciech Ogieglo; Ingo Pinnau; Jörg Rappich; Karsten Hinrichs
Close Modal

or Create an Account

Close Modal
Close Modal