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Journal Articles

Work function measurement by ultraviolet photoelectron spectroscopy: Versailles project on advanced materials and standards interlaboratory study

Jeong Won Kim, Ansoon Kim, Hui Ung Hwang, Jun Hyung Kim, Seungwook Choi, Norbert Koch, Dongguen Shin, Zhijuan Zhao, Fen Liu, Minki Choi, Kyu Myung Lee, Yongsup Park
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 053211 (2023)
https://doi.org/10.1116/6.0002852
Published: August 2023
View article titled, Work function measurement by ultraviolet photoelectron spectroscopy: Versailles project on advanced materials and standards interlaboratory study
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Journal Articles

Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

George H. Major, B. Maxwell Clark, Kevin Cayabyab, Nathan Engel, Christopher D. Easton, Jan Čechal, Donald R. Baer, Jeff Terry, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043201 (2023)
https://doi.org/10.1116/6.0002714
Published: May 2023
View article titled, Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature
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Journal Articles

Measurements and model of UV-induced oxidation of aluminum

Robert F. Berg, Charles Tarrio, Thomas B. Lucatorto
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 033204 (2023)
https://doi.org/10.1116/6.0002432
Published: March 2023
View article titled, Measurements and model of UV-induced oxidation of aluminum
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Journal Articles

Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting

George H. Major, Vincent Fernandez, Neal Fairley, Emily F. Smith, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 063201 (2022)
https://doi.org/10.1116/6.0001975
Published: September 2022
View article titled, Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting
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Journal Articles

Exploration of the nonideal behavior observed in engineered, multilayer MgO/Ag/MgO photocathodes

ZhengRong Lee, Linda Spentzouris, Manfred Mascheck, Jeff Terry
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 063202 (2021)
https://doi.org/10.1116/6.0001136
Published: September 2021
View article titled, Exploration of the nonideal behavior observed in engineered, multilayer MgO/Ag/MgO photocathodes
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Journal Articles

Work function performance of a C12A7 electride surface exposed to low pressure low temperature hydrogen plasmas

A. Heiler, K. Waetzig, M. Tajmar, R. Friedl, R. Nocentini, U. Fantz
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 013002 (2021)
https://doi.org/10.1116/6.0000749
Published: December 2020
View article titled, Work function performance of a C12A7 electride surface exposed to low pressure low temperature hydrogen plasmas
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Journal Articles

Introduction to x-ray photoelectron spectroscopy

Fred A. Stevie, Carrie L. Donley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063204 (2020)
https://doi.org/10.1116/6.0000412
Published: September 2020
View article titled, Introduction to x-ray photoelectron spectroscopy
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Journal Articles

Practical guides for x-ray photoelectron spectroscopy: Quantitative XPS

Alexander G. Shard
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 041201 (2020)
https://doi.org/10.1116/1.5141395
Published: July 2020
View article titled, Practical guides for x-ray photoelectron spectroscopy: Quantitative XPS
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Journal Articles

X-ray photoelectron spectroscopy: A perspective on quantitation accuracy for composition analysis of homogeneous materials

Christopher Richard Brundle, Bruce Vincent Crist
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 041001 (2020)
https://doi.org/10.1116/1.5143897
Published: June 2020
View article titled, X-ray photoelectron spectroscopy: A perspective on quantitation accuracy for composition analysis of homogeneous materials
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Includes: Supplementary data
Journal Articles

Achieving reproducible data: Examples from surface analysis in semiconductor technology

Thierry Conard, Anja Vanleenhove, Paul van der Heide
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 033206 (2020)
https://doi.org/10.1116/1.5140746
Published: March 2020
View article titled, Achieving reproducible data: Examples from surface analysis in semiconductor technology
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Journal Articles

Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy

Cedric J. Powell
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 023209 (2020)
https://doi.org/10.1116/1.5141079
Published: February 2020
View article titled, Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy
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Journal Articles

In situ x-ray photoelectron emission analysis of the thermal stability of atomic layer deposited WOx as hole-selective contacts for Si solar cells

Tian Zhang, Chang-Yeh Lee, Bin Gong, Sean Lim, Stuart Wenham, Bram Hoex
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 36, 031601 (2018)
https://doi.org/10.1116/1.5020339
Published: March 2018
View article titled, <em>In situ</em> x-ray photoelectron emission analysis of the thermal stability of atomic layer deposited WO<sub>x</sub> as hole-selective contacts for Si solar cells
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Includes: Supplementary data
Journal Articles

Mixed oxides on rutile TiO2(011): Cr2O3 and Cu2O

Sandamali Halpegamage, Matthias Batzill
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 061406 (2017)
https://doi.org/10.1116/1.5000333
Published: October 2017
View article titled, Mixed oxides on rutile TiO<sub>2</sub>(011): Cr<sub>2</sub>O<sub>3</sub> and Cu<sub>2</sub>O
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Journal Articles

Growth of lead thin films on silicon and niobium substrates by sputtering technique

Francisco Gontad, Antonella Lorusso, Massimo Di Giulio, Fredrik Eriksson, Esteban Broitman, Alessio Perrone
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 031502 (2017)
https://doi.org/10.1116/1.4978040
Published: March 2017
View article titled, Growth of lead thin films on silicon and niobium substrates by sputtering technique
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Journal Articles

Hard x-ray photoemission study of oxidation states of Ti underlayer in Fe/Ti film system

Akito Takashima, Eiji Ikenaga, Takayuki Muro, Akio Kawabata, Tomo Murakami, Mizuhisa Nihei, Naoki Yokoyama
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 021507 (2017)
https://doi.org/10.1116/1.4973964
Published: January 2017
View article titled, Hard x-ray photoemission study of oxidation states of Ti underlayer in Fe/Ti film system
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Journal Articles

Growth of aluminum oxide on silicon carbide with an atomically sharp interface

Ana Gomes Silva, Kjeld Pedersen, Zheshen Li, Jeanette Hvam, Rajnish Dhiman, Per Morgen
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 01B142 (2017)
https://doi.org/10.1116/1.4972774
Published: December 2016
View article titled, Growth of aluminum oxide on silicon carbide with an atomically sharp interface
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Journal Articles

Conduction and rectification in NbOx- and NiO-based metal-insulator-metal diodes

Richard M. Osgood, III, Stephen Giardini, Joel Carlson, Prakash Periasamy, Harvey Guthrey, Ryan O'Hayre, Matthew Chin, Barbara Nichols, Madan Dubey, Gustavo Fernandes, Jin Ho Kim, Jimmy Xu, Philip Parilla, Joseph Berry, David Ginley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 051514 (2016)
https://doi.org/10.1116/1.4960962
Published: August 2016
View article titled, Conduction and rectification in NbO<sub>x</sub>- and NiO-based metal-insulator-metal diodes
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Journal Articles

Recent applications of hard x-ray photoelectron spectroscopy

Conan Weiland, Abdul K. Rumaiz, Piero Pianetta, Joseph C. Woicik
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 030801 (2016)
https://doi.org/10.1116/1.4946046
Published: May 2016
View article titled, Recent applications of hard x-ray photoelectron spectroscopy
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Journal Articles

Native oxide transport and removal during the atomic layer deposition of Ta2O5 on InAs(100) surfaces

Alex J. Henegar, Theodosia Gougousi
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 031101 (2016)
https://doi.org/10.1116/1.4945115
Published: March 2016
View article titled, Native oxide transport and removal during the atomic layer deposition of Ta<sub>2</sub>O<sub>5</sub> on InAs(100) surfaces
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Journal Articles

Magnetic and electronic properties of La0.7Ca0.3MnO3/h-YMnO3 bilayer

Manish Kumar, R. J. Choudhary, D. M. Phase
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 021506 (2016)
https://doi.org/10.1116/1.4937356
Published: December 2015
View article titled, Magnetic and electronic properties of La<sub>0.7</sub>Ca<sub>0.3</sub>MnO<sub>3</sub>/h-YMnO<sub>3</sub> bilayer
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