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Journal Articles

Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy

Kateryna Artyushkova, Stuart R. Leadley, Alexander G. Shard

J. Vac. Sci. Technol. A 42, 052801 (2024)

https://doi.org/10.1116/6.0003740

Published: July 2024

View article titled, Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy

Journal Articles

Best practices for performing quantitative TOF-SIMS analyses

Alan M. Spool, Lorie Finney

J. Vac. Sci. Technol. A 42, 043204 (2024)

https://doi.org/10.1116/6.0003660

Published: July 2024

View article titled, Best practices for performing quantitative TOF-SIMS analyses

Journal Articles

XPS guide for insulators: Electron flood gun operation and optimization, surface charging, controlled charging, differential charging, useful FWHMs, problems and solutions, and advice

B. Vincent Crist

J. Vac. Sci. Technol. A 42, 032803 (2024)

https://doi.org/10.1116/6.0003439

Published: April 2024

View article titled, XPS guide for insulators: Electron flood gun operation and optimization, surface charging, controlled charging, differential charging, useful FWHMs, problems and solutions, and advice

Journal Articles

Significant decrease in surface charging of electrically isolated ionic liquid by cluster ion bombardment

Yukio Fujiwara

J. Vac. Sci. Technol. A 42, 033207 (2024)

https://doi.org/10.1116/6.0003500

Published: April 2024

View article titled, Significant decrease in surface charging of electrically isolated ionic liquid by cluster ion bombardment

Includes: Supplementary data

Journal Articles

Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

George H. Major, B. Maxwell Clark, Kevin Cayabyab, Nathan Engel, Christopher D. Easton, Jan Čechal, Donald R. Baer, Jeff Terry, Matthew R. Linford

J. Vac. Sci. Technol. A 41, 043201 (2023)

https://doi.org/10.1116/6.0002714

Published: May 2023

View article titled, Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

Journal Articles

Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials

Yukio Fujiwara, Naoaki Saito

J. Vac. Sci. Technol. A 40, 053203 (2022)

https://doi.org/10.1116/6.0001999

Published: August 2022

View article titled, Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials

Journal Articles

Negative-cluster ion beam production from the tip of a sharp needle: Suppression of surface charging and surface analysis of an insulated sample

Yukio Fujiwara, Naoaki Saito

J. Vac. Sci. Technol. A 39, 063218 (2021)

https://doi.org/10.1116/6.0001431

Published: October 2021

View article titled, Negative-cluster ion beam production from the tip of a sharp needle: Suppression of surface charging and surface analysis of an insulated sample

Includes: Supplementary data

Journal Articles

Procedure which allows the performance and calibration of an XPS instrument to be checked rapidly and frequently

John Wolstenholme

J. Vac. Sci. Technol. A 38, 043206 (2020)

https://doi.org/10.1116/6.0000224

Published: June 2020

View article titled, Procedure which allows the performance and calibration of an XPS instrument to be checked rapidly and frequently

Includes: Supplementary data

Journal Articles

Differential charging analysis of Nb-TiO₂ thin films on SiO₂ substrates

Susanna L. Bergman, Girija Sahasrabudhe, Tamie Ai Jia Loh, Steven L. Bernasek

J. Vac. Sci. Technol. A 37, 051101 (2019)

https://doi.org/10.1116/1.5111926

Published: August 2019

View article titled, Differential charging analysis of Nb-TiO<sub>2</sub> thin films on SiO<sub>2</sub> substrates

Journal Articles

X-ray photoelectron spectroscopy for identification of morphological defects and disorders in graphene devices

Pinar Aydogan, Emre O. Polat, Coskun Kocabas, Sefik Suzer

J. Vac. Sci. Technol. A 34, 041516 (2016)

https://doi.org/10.1116/1.4954401

Published: June 2016

View article titled, X-ray photoelectron spectroscopy for identification of morphological defects and disorders in graphene devices

Includes: Supplementary data

Journal Articles

Combining dynamic and static depth profiling in low energy ion scattering

Rik ter Veen, Michael Fartmann, Reinhard Kersting, Birgit Hagenhoff

J. Vac. Sci. Technol. A 31, 01A113 (2013)

https://doi.org/10.1116/1.4764111

Published: October 2012

View article titled, Combining dynamic and static depth profiling in low energy ion scattering

Journal Articles

Optimizing charge neutralization for a magnetic sector SIMS instrument in negative mode

Alexander L. Pivovarov, Georgiy M. Guryanov

J. Vac. Sci. Technol. A 30, 040601 (2012)

https://doi.org/10.1116/1.4719960

Published: May 2012

View article titled, Optimizing charge neutralization for a magnetic sector SIMS instrument in negative mode

Journal Articles

Application of multivariate statistical analysis methods for improved time-of-flight secondary ion mass spectrometry depth profiling of buried interfaces and particulate

K. G. Lloyd

J. Vac. Sci. Technol. A 25, 878–885 (2007)

https://doi.org/10.1116/1.2735950

Published: July 2007

View article titled, Application of multivariate statistical analysis methods for improved time-of-flight secondary ion mass spectrometry depth profiling of buried interfaces and particulate

Journal Articles

Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators

Z. Zhu, C. Gu, F. A. Stevie, D. P. Griffis

J. Vac. Sci. Technol. A 25, 769–774 (2007)

https://doi.org/10.1116/1.2746044

Published: June 2007

View article titled, Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators

Journal Articles

Alternative method of using an electron beam for charge compensation during ultralow energy secondary-ion-mass spectroscopy experiments

B. Guzmán de la Mata, M. G. Dowsett, R. J. H. Morris

J. Vac. Sci. Technol. A 24, 953–956 (2006)

https://doi.org/10.1116/1.2201044

Published: May 2006

View article titled, Alternative method of using an electron beam for charge compensation during ultralow energy secondary-ion-mass spectroscopy experiments

Journal Articles

Bulk and interface charge in low temperature silicon nitride for thin film transistors on plastic substrates

Kie Jin Park, Gregory N. Parsons

J. Vac. Sci. Technol. A 22, 2256–2260 (2004)

https://doi.org/10.1116/1.1795822

Published: October 2004

View article titled, Bulk and interface charge in low temperature silicon nitride for thin film transistors on plastic substrates

Journal Articles

Oxygen environmental Auger electron spectroscopy: Eliminating the electron beam effects on Al 2 O 3 during Auger analysis

Hansheng Guo, W. Maus-Friedrichs, V. Kempter, Y. Ji

J. Vac. Sci. Technol. A 21, 1009–1016 (2003)

https://doi.org/10.1116/1.1582453

Published: June 2003

View article titled, Oxygen environmental Auger electron spectroscopy: Eliminating the electron beam effects on Al 2 O 3 during Auger analysis

Journal Articles

Temperature dependence in time-of-flight ion scattering spectra of LiTaO 3 (0001̄) and surface charge compensation of pyroelectric changes

Z. L. Fang, K. M. Lui, W. M. Lau, B. Makarenko, J. W. Rabalais

J. Vac. Sci. Technol. A 21, 127–133 (2003)

https://doi.org/10.1116/1.1525814

Published: December 2002

View article titled, Temperature dependence in time-of-flight ion scattering spectra of LiTaO 3 (0001̄) and surface charge compensation of pyroelectric changes

Journal Articles

Visible emission from amorphous AlN thin-film phosphors with Cu, Mn, or Cr

A. L. Martin, C. M. Spalding, V. I. Dimitrova, P. G. Van Patten, M. L. Caldwell, M. E. Kordesch, H. H. Richardson

J. Vac. Sci. Technol. A 19, 1894–1897 (2001)

https://doi.org/10.1116/1.1353544

Published: July 2001

View article titled, Visible emission from amorphous AlN thin-film phosphors with Cu, Mn, or Cr

Journal Articles

A permanent, retractable screen for charge neutralization of insulating specimens during x‐ray photoelectron spectroscopy analysis

G. D. Davis, C. R. Anderson, H. M. Clearfield

J. Vac. Sci. Technol. A 11, 3135–3137 (1993)

https://doi.org/10.1116/1.578463

Published: November 1993

View article titled, A permanent, retractable screen for charge neutralization of insulating specimens during x‐ray photoelectron spectroscopy analysis

NARROW

Topics

Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy

Best practices for performing quantitative TOF-SIMS analyses

XPS guide for insulators: Electron flood gun operation and optimization, surface charging, controlled charging, differential charging, useful FWHMs, problems and solutions, and advice

Significant decrease in surface charging of electrically isolated ionic liquid by cluster ion bombardment

Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials

Negative-cluster ion beam production from the tip of a sharp needle: Suppression of surface charging and surface analysis of an insulated sample

Procedure which allows the performance and calibration of an XPS instrument to be checked rapidly and frequently

Differential charging analysis of Nb-TiO₂ thin films on SiO₂ substrates

X-ray photoelectron spectroscopy for identification of morphological defects and disorders in graphene devices

Combining dynamic and static depth profiling in low energy ion scattering

Optimizing charge neutralization for a magnetic sector SIMS instrument in negative mode

Application of multivariate statistical analysis methods for improved time-of-flight secondary ion mass spectrometry depth profiling of buried interfaces and particulate

Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators

Alternative method of using an electron beam for charge compensation during ultralow energy secondary-ion-mass spectroscopy experiments

Bulk and interface charge in low temperature silicon nitride for thin film transistors on plastic substrates

Oxygen environmental Auger electron spectroscopy: Eliminating the electron beam effects on Al 2 O 3 during Auger analysis

Temperature dependence in time-of-flight ion scattering spectra of LiTaO 3 (0001̄) and surface charge compensation of pyroelectric changes

Visible emission from amorphous AlN thin-film phosphors with Cu, Mn, or Cr

A permanent, retractable screen for charge neutralization of insulating specimens during x‐ray photoelectron spectroscopy analysis

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