1-20 of 63
Surface analysis techniques
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Plasma functionalization mechanism to modify isocyanate groups on multiwalled carbon nanotubes

Daisuke Ogawa, Keiji Nakamura
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 063001 (2023)
https://doi.org/10.1116/6.0002835
Published: September 2023
View article titled, Plasma functionalization mechanism to modify isocyanate groups on multiwalled carbon nanotubes
Open the PDF for Plasma functionalization mechanism to modify isocyanate groups on multiwalled carbon nanotubes in another window
Journal Articles

VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS

Francesca Bennet, Robert Opitz, Narges Ghoreishi, Kristina Plate, Jean-Paul Barnes, Allen Bellew, Anna Belu, Giacomo Ceccone, Eric de Vito, Arnaud Delcorte, Alexis Franquet, Francesco Fumagalli, Douglas Gilliland, Harald Jungnickel, Tae Geol Lee, Claude Poleunis, Derk Rading, Hyun Kyong Shon, Valentina Spampinato, Jin Gyeong Son, Fuyi Wang, Yung-Chen Andrew Wang, Yao Zhao, Alexander Roloff, Jutta Tentschert, Jörg Radnik
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 053210 (2023)
https://doi.org/10.1116/6.0002814
Published: August 2023
View article titled, VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO<sub>2</sub> nanoparticles using ToF-SIMS
Open the PDF for VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO<sub>2</sub> nanoparticles using ToF-SIMS in another window
Includes: Supplementary data
Journal Articles

ToF-SIMS in battery research: Advantages, limitations, and best practices

Teo Lombardo, Felix Walther, Christine Kern, Yannik Moryson, Timo Weintraut, Anja Henss, Marcus Rohnke
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 053207 (2023)
https://doi.org/10.1116/6.0002850
Published: August 2023
View article titled, ToF-SIMS in battery research: Advantages, limitations, and best practices
Open the PDF for ToF-SIMS in battery research: Advantages, limitations, and best practices in another window
Includes: Supplementary data
Journal Articles

Comparing sputter rates, depth resolution, and ion yields for different gas cluster ion beams (GCIB): A practical guide to choosing the best GCIB for every application

N. Sano, A. Bellew, P. Blenkinsopp
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 053204 (2023)
https://doi.org/10.1116/6.0002864
Published: July 2023
View article titled, Comparing sputter rates, depth resolution, and ion yields for different gas cluster ion beams (GCIB): A practical guide to choosing the best GCIB for every application
Open the PDF for Comparing sputter rates, depth resolution, and ion yields for different gas cluster ion beams (GCIB): A practical guide to choosing the best GCIB for every application in another window
Journal Articles

Peak intensities in Auger electron spectroscopy for quantification: Relationship between differentiated spectral intensities and direct peak areas

Katsumi Watanabe, Daisuke Watanabe, Kazutoshi Mamiya, Seiji Koizumi, Noriaki Sanada, Mineharu Suzuki
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043209 (2023)
https://doi.org/10.1116/6.0002487
Published: June 2023
View article titled, Peak intensities in Auger electron spectroscopy for quantification: Relationship between differentiated spectral intensities and direct peak areas
Open the PDF for Peak intensities in Auger electron spectroscopy for quantification: Relationship between differentiated spectral intensities and direct peak areas in another window
Journal Articles

The ST component in the Si 2p photoemission spectrum from H-terminated and oxidized Si (001) surfaces

A. Herrera-Gomez, M. O. Vazquez-Lepe, P. G. Mani-Gonzalez, P. Pianetta, F. S. Aguirre-Tostado, O. Ceballos-Sanchez
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043206 (2023)
https://doi.org/10.1116/6.0002690
Published: May 2023
View article titled, The <em>S<sub>T</sub></em> component in the Si 2<em>p</em> photoemission spectrum from H-terminated and oxidized Si (001) surfaces
Open the PDF for The <em>S<sub>T</sub></em> component in the Si 2<em>p</em> photoemission spectrum from H-terminated and oxidized Si (001) surfaces in another window
Journal Articles

Conductive TiN thin films grown by plasma-enhanced atomic layer deposition: Effects of N-sources and thermal treatments

Clémence Badie, Héloïse Tissot, Beniamino Sciacca, Maïssa K. Barr, Julien Bachmann, Christophe Vallée, Gaël Gautier, Thomas Defforge, Vincent Astie, Jean-Manuel Decams, Mikhael Bechelany, Lionel Santinacci
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 032401 (2023)
https://doi.org/10.1116/6.0002288
Published: March 2023
View article titled, Conductive TiN thin films grown by plasma-enhanced atomic layer deposition: Effects of N-sources and thermal treatments
Open the PDF for Conductive TiN thin films grown by plasma-enhanced atomic layer deposition: Effects of N-sources and thermal treatments in another window
Includes: Supplementary data
Journal Articles

Characterization of vacuum ultraviolet-irradiated surface modification of CoO(111) crystal by low-energy atom scattering spectroscopy

G. Tan, H. Fukuta, K. K. H. De Silva, A. Matsuda, M. Yoshimura, M. Yoshimoto, K. Umezawa
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 063202 (2022)
https://doi.org/10.1116/6.0001971
Published: September 2022
View article titled, Characterization of vacuum ultraviolet-irradiated surface modification of CoO(111) crystal by low-energy atom scattering spectroscopy
Open the PDF for Characterization of vacuum ultraviolet-irradiated surface modification of CoO(111) crystal by low-energy atom scattering spectroscopy in another window
Journal Articles

Low-energy ion scattering from quasicrystals

Robert Bastasz
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 010805 (2022)
https://doi.org/10.1116/6.0001502
Published: December 2021
View article titled, Low-energy ion scattering from quasicrystals
Open the PDF for Low-energy ion scattering from quasicrystals in another window
Journal Articles

High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy

Julien E. Rault, Cheng-Tai Kuo, Henrique P. Martins, Giuseppina Conti, Slavomír Nemšák
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 060802 (2021)
https://doi.org/10.1116/6.0001289
Published: October 2021
View article titled, High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy
Open the PDF for High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy in another window
Journal Articles

Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis

Donald R. Baer, Gary E. McGuire, Kateryna Artyushkova, Christopher D. Easton, Mark H. Engelhard, Alexander G. Shard
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 021601 (2021)
https://doi.org/10.1116/6.0000873
Published: February 2021
View article titled, Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis
Open the PDF for Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis in another window
Journal Articles

Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum

Thomas R. Gengenbach, George H. Major, Matthew R. Linford, Christopher D. Easton
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 013204 (2021)
https://doi.org/10.1116/6.0000682
Published: January 2021
View article titled, Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum
Open the PDF for Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum in another window
Journal Articles

Introduction to x-ray photoelectron spectroscopy

Fred A. Stevie, Carrie L. Donley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063204 (2020)
https://doi.org/10.1116/6.0000412
Published: September 2020
View article titled, Introduction to x-ray photoelectron spectroscopy
Open the PDF for Introduction to x-ray photoelectron spectroscopy in another window
Journal Articles

Variation in plutonium dioxide sputter yields for 1–5 keV Ar+ ions

Scott B. Donald, Jeff A. Stanford, Rory T. Gollott, David J. Roberts, Art J. Nelson, W. McLean
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 053202 (2020)
https://doi.org/10.1116/6.0000301
Published: July 2020
View article titled, Variation in plutonium dioxide sputter yields for 1–5 keV Ar<sup>+</sup> ions
Open the PDF for Variation in plutonium dioxide sputter yields for 1–5 keV Ar<sup>+</sup> ions in another window
Includes: Supplementary data
Journal Articles

Role of consistent terminology in XPS reproducibility

Donald R. Baer, Alexander G. Shard
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 031203 (2020)
https://doi.org/10.1116/6.0000016
Published: April 2020
View article titled, Role of consistent terminology in XPS reproducibility
Open the PDF for Role of consistent terminology in XPS reproducibility in another window
Journal Articles

Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy

Cedric J. Powell
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 023209 (2020)
https://doi.org/10.1116/1.5141079
Published: February 2020
View article titled, Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy
Open the PDF for Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy in another window
Journal Articles

Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements

Donald R. Baer, Kateryna Artyushkova, Christopher Richard Brundle, James E. Castle, Mark H. Engelhard, Karen J. Gaskell, John T. Grant, Richard T. Haasch, Matthew R. Linford, Cedric J. Powell, Alexander G. Shard, Peter M. A. Sherwood, Vincent S. Smentkowski
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 37, 031401 (2019)
https://doi.org/10.1116/1.5065501
Published: April 2019
View article titled, Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements
Open the PDF for Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements in another window
Journal Articles

Growth of aluminum oxide on silicon carbide with an atomically sharp interface

Ana Gomes Silva, Kjeld Pedersen, Zheshen Li, Jeanette Hvam, Rajnish Dhiman, Per Morgen
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 01B142 (2017)
https://doi.org/10.1116/1.4972774
Published: December 2016
View article titled, Growth of aluminum oxide on silicon carbide with an atomically sharp interface
Open the PDF for Growth of aluminum oxide on silicon carbide with an atomically sharp interface in another window
Journal Articles

Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs

Naoko Sano, Graham W. H. Purvis, Anders J. Barlow, Geoffrey D. Abbott, Neil N. D. Gray, Peter J. Cumpson
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 041405 (2016)
https://doi.org/10.1116/1.4954940
Published: July 2016
View article titled, Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs
Open the PDF for Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs in another window
Journal Articles

Cross-sectional scanning tunneling microscopy of antiphase boundaries in epitaxially grown GaP layers on Si(001)

Christopher Prohl, Henning Döscher, Peter Kleinschmidt, Thomas Hannappel, Andrea Lenz
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 031102 (2016)
https://doi.org/10.1116/1.4945992
Published: April 2016
View article titled, Cross-sectional scanning tunneling microscopy of antiphase boundaries in epitaxially grown GaP layers on Si(001)
Open the PDF for Cross-sectional scanning tunneling microscopy of antiphase boundaries in epitaxially grown GaP layers on Si(001) in another window