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Journal Articles

Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy

Featured
Kateryna Artyushkova, Stuart R. Leadley, Alexander G. Shard
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 052801 (2024)
https://doi.org/10.1116/6.0003740
Published: July 2024
View article titled, Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy
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Journal Articles

Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

George H. Major, B. Maxwell Clark, Kevin Cayabyab, Nathan Engel, Christopher D. Easton, Jan Čechal, Donald R. Baer, Jeff Terry, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043201 (2023)
https://doi.org/10.1116/6.0002714
Published: May 2023
View article titled, Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature
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Journal Articles

XPS characterization of a PuGa-7 at. % alloy

P. Roussel, S. C. Hernandez, J. J. Joyce, K. S. Graham, T. Venhaus
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 023204 (2023)
https://doi.org/10.1116/6.0002365
Published: February 2023
View article titled, XPS characterization of a PuGa-7 at. % alloy
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Includes: Supplementary data
Journal Articles

Nanometer-scale depth-resolved hard x-ray absorption spectroscopy based on the detection of energy-loss Auger electrons with low energies

Noritake Isomura, Keiichiro Oh-ishi, Naoko Takahashi, Satoru Kosaka
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 063204 (2022)
https://doi.org/10.1116/6.0002131
Published: October 2022
View article titled, Nanometer-scale depth-resolved hard x-ray absorption spectroscopy based on the detection of energy-loss Auger electrons with low energies
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Includes: Supplementary data
Journal Articles

Chirality in double photoemission from a Cu(100) surface

Editor’s Pick
F. O. Schumann, G. Di Fillippo, Z. Wei, G. Stefani
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 043204 (2022)
https://doi.org/10.1116/6.0001875
Published: June 2022
View article titled, Chirality in double photoemission from a Cu(100) surface
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Journal Articles

Partial densities of states from x-ray absorption and Auger electron spectroscopy: Use of core-hole memory

Eric L. Shirley, C. Weiland, J. C. Woicik
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 023410 (2022)
https://doi.org/10.1116/6.0001432
Published: February 2022
View article titled, Partial densities of states from x-ray absorption and Auger electron spectroscopy: Use of core-hole memory
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Journal Articles

Al Kα XPS reference spectra of polyethylene for all instrument geometries

Editor’s Pick
Alexander G. Shard, Benjamen P. Reed
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063209 (2020)
https://doi.org/10.1116/6.0000578
Published: November 2020
View article titled, Al Kα XPS reference spectra of polyethylene for all instrument geometries
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Journal Articles

Introduction to x-ray photoelectron spectroscopy

Fred A. Stevie, Carrie L. Donley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063204 (2020)
https://doi.org/10.1116/6.0000412
Published: September 2020
View article titled, Introduction to x-ray photoelectron spectroscopy
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Journal Articles

Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities

Mark H. Engelhard, Donald R. Baer, Alberto Herrera-Gomez, Peter M. A. Sherwood
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063203 (2020)
https://doi.org/10.1116/6.0000359
Published: September 2020
View article titled, Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities
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Journal Articles

Water adsorption on Al doped silicatene films grown on Mo(112)

M. T. Nayakasinghe, U. Burghaus
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 37, 041507 (2019)
https://doi.org/10.1116/1.5100610
Published: July 2019
View article titled, Water adsorption on Al doped silicatene films grown on Mo(112)
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Includes: Supplementary data
Journal Articles

Application of linear least squares to the analysis of Auger electron spectroscopy depth profiles of plutonium oxides

Scott B. Donald, Jeff A. Stanford, William McLean, Art J. Nelson
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 36, 03E104 (2018)
https://doi.org/10.1116/1.5021587
Published: March 2018
View article titled, Application of linear least squares to the analysis of Auger electron spectroscopy depth profiles of plutonium oxides
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Journal Articles

Beyond defect formation: Spectroscopic characterization of plasma-induced structural and electronic transformations in graphene

Joshua S. Wallace, Austin Quinn, Joseph A. Gardella, Jr., Da Huang, Jing Hu, Eric Siu-Wai Kong, Han-Ik Joh
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 061502 (2016)
https://doi.org/10.1116/1.4962287
Published: September 2016
View article titled, Beyond defect formation: Spectroscopic characterization of plasma-induced structural and electronic transformations in graphene
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Journal Articles

Spectroscopic investigation of the electronic structure of thin atomic layer deposition HfO2 films

Silma Alberton Corrêa, Simone Brizzi, Dieter Schmeisser
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 01A117 (2016)
https://doi.org/10.1116/1.4935338
Published: November 2015
View article titled, Spectroscopic investigation of the electronic structure of thin atomic layer deposition HfO<sub>2</sub> films
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Journal Articles

Excitation of XPS spectra from nanoscaled particles by local generation of x-rays

Christopher F. Mallinson, James E. Castle
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 05E116 (2015)
https://doi.org/10.1116/1.4926897
Published: July 2015
View article titled, Excitation of XPS spectra from nanoscaled particles by local generation of x-rays
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Journal Articles

Surface compositions of atomic layer deposited Zn1−xMgxO thin films studied using Auger electron spectroscopy

Ting Xie, Danilo Romero, Romel D. Gomez
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 05E110 (2015)
https://doi.org/10.1116/1.4922410
Published: June 2015
View article titled, Surface compositions of atomic layer deposited Zn<sub>1−x</sub>Mg<sub>x</sub>O thin films studied using Auger electron spectroscopy
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Journal Articles

X-ray excited Auger transitions of Pu compounds

Art J. Nelson, William K. Grant, Jeff A. Stanford, Wigbert J. Siekhaus, Patrick G. Allen, William McLean
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 031401 (2015)
https://doi.org/10.1116/1.4913886
Published: March 2015
View article titled, X-ray excited Auger transitions of Pu compounds
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Journal Articles

Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials

Cedric J. Powell, Wolfgang S. M. Werner, Werner Smekal
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 32, 050603 (2014)
https://doi.org/10.1116/1.4891628
Published: July 2014
View article titled, Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials
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Journal Articles

Measurement of the Auger parameter and Wagner plot for uranium compounds

Kiel S. Holliday, Wigbert Siekhaus, Art J. Nelson
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 031401 (2013)
https://doi.org/10.1116/1.4793477
Published: February 2013
View article titled, Measurement of the Auger parameter and Wagner plot for uranium compounds
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Journal Articles

Sample-morphology effects on x-ray photoelectron peak intensities

Cedric J. Powell, Sven Tougaard, Wolfgang S. M. Werner, Werner Smekal
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 021402 (2013)
https://doi.org/10.1116/1.4774214
Published: January 2013
View article titled, Sample-morphology effects on x-ray photoelectron peak intensities
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Journal Articles

Thin layer composition profiling with angular resolved x-ray photoemission spectroscopy: Factors affecting quantitative results

T. Conard, W. Vandervorst, A. Bergmaier, K. Kimura
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 30, 031509 (2012)
https://doi.org/10.1116/1.4704603
Published: April 2012
View article titled, Thin layer composition profiling with angular resolved x-ray photoemission spectroscopy: Factors affecting quantitative results
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