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Journal Articles
Sequence modeling for predicting three-dimensional plasma etching profiles with deep learning
J. Vac. Sci. Technol. A 43, 043005 (2025)
Published: June 2025
Journal Articles
Tiffany C. Kaspar, Sarah Akers, Henry W. Sprueill, Arman H. Ter-Petrosyan, Jenna A. Bilbrey, Derek Hopkins, Ajay Harilal, Jijo Christudasjustus, Patrick Gemperline, Ryan B. Comes
J. Vac. Sci. Technol. A 43, 032702 (2025)
Published: March 2025
Journal Articles
Implementation of an artificial spiking neuron with photoreceptor functionality using gas discharge tubes
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J. Vac. Sci. Technol. A 43, 033002 (2025)
Published: March 2025
Journal Articles
Improvement of data analytics techniques in reflection high-energy electron diffraction to enable machine learning
J. Vac. Sci. Technol. A 43, 032701 (2025)
Published: March 2025
Journal Articles
Applications of machine learning in ion beam analysis of materials
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J. Vac. Sci. Technol. A 43, 020803 (2025)
Published: February 2025
Journal Articles
Attention-enhanced conditional variational autoencoder integrating 3D plasma etching simulation for etching process optimization
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J. Vac. Sci. Technol. A 43, 023003 (2025)
Published: February 2025
Journal Articles
J. Vac. Sci. Technol. A 43, 012603 (2025)
Published: January 2025
Journal Articles
Numerical ellipsometry: AI for real-time, in situ process control for absorbing films growing on unknown transparent substrates
J. Vac. Sci. Technol. A 42, 053405 (2024)
Published: August 2024
Journal Articles
Machine learning-based prediction of the electron energy distribution function and electron density of argon plasma from the optical emission spectra
Fatima Jenina Arellano, Minoru Kusaba, Stephen Wu, Ryo Yoshida, Zoltán Donkó, Peter Hartmann, Tsanko V. Tsankov, Satoshi Hamaguchi
J. Vac. Sci. Technol. A 42, 053001 (2024)
Published: July 2024
Journal Articles
Case study in machine learning for predicting moderate pressure plasma behavior
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J. Vac. Sci. Technol. A 42, 043001 (2024)
Published: May 2024
Journal Articles
Numerical ellipsometry: Artificial intelligence for rapid analysis of indium tin oxide films on silicon
J. Vac. Sci. Technol. A 42, 043401 (2024)
Published: May 2024
Journal Articles
Numerical ellipsometry: Artificial intelligence for real-time, in situ absorbing film process control
J. Vac. Sci. Technol. A 42, 023404 (2024)
Published: January 2024
Journal Articles
Optimizing impedance matching parameters for single-frequency capacitively coupled plasma via machine learning
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J. Vac. Sci. Technol. A 42, 013001 (2024)
Published: December 2023
Journal Articles
Effect of data preprocessing and machine learning hyperparameters on mass spectrometry imaging models
Open AccessWil Gardner, David A. Winkler, David L. J. Alexander, Davide Ballabio, Benjamin W. Muir, Paul J. Pigram
J. Vac. Sci. Technol. A 41, 063204 (2023)
Published: September 2023
Includes: Supplementary data
Journal Articles
J. Vac. Sci. Technol. A 41, 063202 (2023)
Published: September 2023
Includes: Supplementary data
Journal Articles
J. Vac. Sci. Technol. A 40, 062408 (2022)
Published: November 2022
Journal Articles
J. Vac. Sci. Technol. A 37, 040802 (2019)
Published: June 2019
Journal Articles
Feedback control of HfO 2 etch processing in inductively coupled Cl 2 / N 2 / Ar plasmas
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J. Vac. Sci. Technol. A 26, 1282–1286 (2008)
Published: August 2008
Journal Articles
Plasma control using neural network and optical emission spectroscopy
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J. Vac. Sci. Technol. A 23, 355–358 (2005)
Published: March 2005
Journal Articles
Prediction of SiC etching in a N F 3 ∕ C H 4 plasma using neural network
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J. Vac. Sci. Technol. A 22, 2517–2522 (2004)
Published: November 2004
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