1-20 of 40
Image processing
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Cathode spot dynamics in axial magnetic fields

Jiongyu Liang (梁炯煜), Kostadinos Tsoutas, Marcela Bilek
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 023001 (2024)
https://doi.org/10.1116/6.0003243
Published: January 2024
View article titled, Cathode spot dynamics in axial magnetic fields
Open the PDF for Cathode spot dynamics in axial magnetic fields in another window
Journal Articles

Resolving buried interfaces with low energy ion scattering

Adele Valpreda, Jacobus M. Sturm, Andrey E. Yakshin, Marcelo Ackermann
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043203 (2023)
https://doi.org/10.1116/6.0002567
Published: May 2023
View article titled, Resolving buried interfaces with low energy ion scattering
Open the PDF for Resolving buried interfaces with low energy ion scattering in another window
Journal Articles

XPS group array analysis of a combinatorial Ni-Ti-Co thin film library

Jonathan D. P. Counsell, Naila M. Al Hasan, Edward Walton, Tieren Gao, Huilong Hou, Ichiro Takeuchi
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063407 (2020)
https://doi.org/10.1116/6.0000333
Published: October 2020
View article titled, XPS group array analysis of a combinatorial Ni-Ti-Co thin film library
Open the PDF for XPS group array analysis of a combinatorial Ni-Ti-Co thin film library in another window
Includes: Supplementary data
Journal Articles

Introduction to lateral resolution and analysis area measurements in XPS

Wolfgang E. S. Unger, Jörg M. Stockmann, Mathias Senoner, Thomas Weimann, Sebastian Bütefisch, Cristiana Passiu, Nicholas D. Spencer, Antonella Rossi
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 053206 (2020)
https://doi.org/10.1116/6.0000398
Published: September 2020
View article titled, Introduction to lateral resolution and analysis area measurements in XPS
Open the PDF for Introduction to lateral resolution and analysis area measurements in XPS in another window
Includes: Supplementary data
Journal Articles

Functionalization ratio of isocyanate groups on plasma-processed multiwalled carbon nanotubes

Daisuke Ogawa, Kazuki Michiya, Hideo Uchida, Keiji Nakamura
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 023010 (2020)
https://doi.org/10.1116/1.5130487
Published: February 2020
View article titled, Functionalization ratio of isocyanate groups on plasma-processed multiwalled carbon nanotubes
Open the PDF for Functionalization ratio of isocyanate groups on plasma-processed multiwalled carbon nanotubes in another window
Journal Articles

Surface degradation of uranium tetrafluoride

J. G. Tobin, A. M. Duffin, S.-W. Yu, R. Qiao, W. L. Yang, C. H. Booth, D. K. Shuh
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 03E108 (2017)
https://doi.org/10.1116/1.4979540
Published: March 2017
View article titled, Surface degradation of uranium tetrafluoride
Open the PDF for Surface degradation of uranium tetrafluoride in another window
Journal Articles

Use of a buried loop layer as a detector of interstitial flux during oxidation of SiGe heterostructures

Thomas P. Martin, Henry L. Aldridge, Jr., K. S. Jones, Renata A. Camillo-Castillo
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 35, 021101 (2017)
https://doi.org/10.1116/1.4972516
Published: December 2016
View article titled, Use of a buried loop layer as a detector of interstitial flux during oxidation of SiGe heterostructures
Open the PDF for Use of a buried loop layer as a detector of interstitial flux during oxidation of SiGe heterostructures in another window
Journal Articles

Atomic bonding effects in annular dark field scanning transmission electron microscopy. I. Computational predictions

Michael L. Odlyzko, Burak Himmetoglu, Matteo Cococcioni, K. Andre Mkhoyan
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 041602 (2016)
https://doi.org/10.1116/1.4954871
Published: June 2016
View article titled, Atomic bonding effects in annular dark field scanning transmission electron microscopy. I. Computational predictions
Open the PDF for Atomic bonding effects in annular dark field scanning transmission electron microscopy. I. Computational predictions in another window
Journal Articles

Local structure study of (In0.95−xFexCu0.05)2O3 thin films using x-ray absorption spectroscopy

Yuan Ren, Yaya Xing, Guanxiong Ma, Xingliang Zhao, Shiqi Wang, Yukai An, Jiwen Liu
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 041513 (2015)
https://doi.org/10.1116/1.4922643
Published: June 2015
View article titled, Local structure study of (In<sub>0.95−x</sub>Fe<sub>x</sub>Cu<sub>0.05</sub>)<sub>2</sub>O<sub>3</sub> thin films using x-ray absorption spectroscopy
Open the PDF for Local structure study of (In<sub>0.95−x</sub>Fe<sub>x</sub>Cu<sub>0.05</sub>)<sub>2</sub>O<sub>3</sub> thin films using x-ray absorption spectroscopy in another window
Journal Articles

On the formation of copper nanoparticles in nanocluster aggregation source

Mikhail V. Dutka, Anatoliy A. Turkin, David I. Vainchtein, Jeff Th. M. De Hosson
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 031509 (2015)
https://doi.org/10.1116/1.4917002
Published: April 2015
View article titled, On the formation of copper nanoparticles in nanocluster aggregation source
Open the PDF for On the formation of copper nanoparticles in nanocluster aggregation source in another window
Journal Articles

Progress and issues in e-beam and other top down nanolithography

Donald M. Tennant
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 050813 (2013)
https://doi.org/10.1116/1.4813761
Published: July 2013
View article titled, Progress and issues in e-beam and other top down nanolithography
Open the PDF for Progress and issues in e-beam and other top down nanolithography in another window
Journal Articles

Noninvasive, real-time measurements of plasma parameters via optical emission spectroscopy

Shicong Wang, Amy E. Wendt, John B. Boffard, Chun C. Lin, Svetlana Radovanov, Harold Persing
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 021303 (2013)
https://doi.org/10.1116/1.4792671
Published: February 2013
View article titled, Noninvasive, real-time measurements of plasma parameters via optical emission spectroscopy
Open the PDF for Noninvasive, real-time measurements of plasma parameters via optical emission spectroscopy in another window
Journal Articles

X-ray photoelectron spectroscopic study on interface bonding between Pt and Zn- and O-terminated ZnO

Michiko Yoshitake, Petr Blumentrit, Slavomir Nemsak
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 020601 (2013)
https://doi.org/10.1116/1.4772464
Published: December 2012
View article titled, X-ray photoelectron spectroscopic study on interface bonding between Pt and Zn- and O-terminated ZnO
Open the PDF for X-ray photoelectron spectroscopic study on interface bonding between Pt and Zn- and O-terminated ZnO in another window
Journal Articles

Transmission electron microscopy specimen preparation perpendicular to the long axis of high aspect ratio features

R. B. Irwin, A. Anciso, P. J. Jones, A. L. Glenn, B. L. Williams, S. Sridhar, S. Arshad
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 27, 1352–1359 (2009)
https://doi.org/10.1116/1.3248271
Published: October 2009
View article titled, Transmission electron microscopy specimen preparation perpendicular to the long axis of high aspect ratio features
Open the PDF for Transmission electron microscopy specimen preparation perpendicular to the long axis of high aspect ratio features in another window
Journal Articles

Surface slope distribution with mathematical molding on Au(111) thin film growth

A. González-González, J. L. Sacedón, C. Polop, E. Rodríguez-Cañas, J. A. Aznárez, E. Vasco
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 27, 1012–1016 (2009)
https://doi.org/10.1116/1.3130145
Published: June 2009
View article titled, Surface slope distribution with mathematical molding on Au(111) thin film growth
Open the PDF for Surface slope distribution with mathematical molding on Au(111) thin film growth in another window
Journal Articles

Effects of pulsing parameters on production and distribution of macroparticles in cathodic vacuum arc deposition

Yawei Hu, Liuhe Li, Hua Dai, Xiaoling Li, Xun Cai, Paul K. Chu
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 24, 957–961 (2006)
https://doi.org/10.1116/1.2201046
Published: May 2006
View article titled, Effects of pulsing parameters on production and distribution of macroparticles in cathodic vacuum arc deposition
Open the PDF for Effects of pulsing parameters on production and distribution of macroparticles in cathodic vacuum arc deposition in another window
Journal Articles

Summary: Update to ASTM guide E 1523 to charge control and charge referencing techniques in x-ray photoelectron spectroscopy

D. R. Baer
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 23, 577–578 (2005)
https://doi.org/10.1116/1.1901672
Published: April 2005
View article titled, Summary: Update to ASTM guide E 1523 to charge control and charge referencing techniques in x-ray photoelectron spectroscopy
Open the PDF for Summary: Update to ASTM guide E 1523 to charge control and charge referencing techniques in x-ray photoelectron spectroscopy in another window
Journal Articles

High resolution, high speed ultrahigh vacuum microscopy

Helmut Poppa
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 22, 1931–1947 (2004)
https://doi.org/10.1116/1.1786304
Published: September 2004
View article titled, High resolution, high speed ultrahigh vacuum microscopy
Open the PDF for High resolution, high speed ultrahigh vacuum microscopy in another window
Journal Articles

Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time

D. E. Peebles, J. A. Ohlhausen, P. G. Kotula, S. Hutton, C. Blomfield
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 22, 1579–1586 (2004)
https://doi.org/10.1116/1.1765134
Published: July 2004
View article titled, Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time
Open the PDF for Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time in another window
Journal Articles

Consistent, combined quantitative Auger electron spectroscopy and x-ray photoelectron spectroscopy digital databases: Convergence of theory and experiment

M. P. Seah, I. S. Gilmore, S. J. Spencer
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 18, 1083–1088 (2000)
https://doi.org/10.1116/1.582304
Published: July 2000
View article titled, Consistent, combined quantitative Auger electron spectroscopy and x-ray photoelectron spectroscopy digital databases: Convergence of theory and experiment
Open the PDF for Consistent, combined quantitative Auger electron spectroscopy and x-ray photoelectron spectroscopy digital databases: Convergence of theory and experiment in another window