1-20 of 65
Data acquisition
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach

Featured
B. Maxwell Clark, George H. Major, Joshua W. Pinder, Daniel E. Austin, Donald R. Baer, Mark C. Biesinger, Christopher D. Easton, Sarah L. Harmer, Alberto Herrera-Gomez, Anthony E. Hughes, William M. Skinner, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 063213 (2024)
https://doi.org/10.1116/6.0004093
Published: November 2024
View article titled, Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach
Open the PDF for Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach in another window
Journal Articles

Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy

Featured
Kateryna Artyushkova, Stuart R. Leadley, Alexander G. Shard
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 052801 (2024)
https://doi.org/10.1116/6.0003740
Published: July 2024
View article titled, Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy
Open the PDF for Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy in another window
Journal Articles

Impact of the DC intensity and electrode distance on pulsed-DC powder-pack boride layer growth kinetics

I. Campos-Silva, L. E. Castillo-Vela, I. Mejía-Caballero, J. L. Rosales-Lopez, M. Olivares-Luna, K. D. Chaparro-Pérez, F. P. Espino-Cortes, J. M. González-Carmona
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 063115 (2023)
https://doi.org/10.1116/6.0003167
Published: November 2023
View article titled, Impact of the DC intensity and electrode distance on pulsed-DC powder-pack boride layer growth kinetics
Open the PDF for Impact of the DC intensity and electrode distance on pulsed-DC powder-pack boride layer growth kinetics in another window
Journal Articles

Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

George H. Major, B. Maxwell Clark, Kevin Cayabyab, Nathan Engel, Christopher D. Easton, Jan Čechal, Donald R. Baer, Jeff Terry, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043201 (2023)
https://doi.org/10.1116/6.0002714
Published: May 2023
View article titled, Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature
Open the PDF for Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature in another window
Journal Articles

X-ray absorption measurements at a bending magnet beamline with an Everhart–Thornley detector: A monolayer of Ho3N@C80 on graphene

Wei Chuang Lee, Ryunosuke Sagehashi, Yang Zhang, Alexey A. Popov, Matthias Muntwiler, Thomas Greber
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 053205 (2022)
https://doi.org/10.1116/6.0001961
Published: September 2022
View article titled, X-ray absorption measurements at a bending magnet beamline with an Everhart–Thornley detector: A monolayer of Ho<sub>3</sub>N@C<sub>80</sub> on graphene
Open the PDF for X-ray absorption measurements at a bending magnet beamline with an Everhart–Thornley detector: A monolayer of Ho<sub>3</sub>N@C<sub>80</sub> on graphene in another window
Journal Articles

Machine learning approach to thickness prediction from in situ spectroscopic ellipsometry data for atomic layer deposition processes

Ayush Arunachalam, S. Novia Berriel, Corbin Feit, Udit Kumar, Sudipta Seal, Kanad Basu, Parag Banerjee
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 012405 (2022)
https://doi.org/10.1116/6.0001482
Published: December 2021
View article titled, Machine learning approach to thickness prediction from <em>in situ</em> spectroscopic ellipsometry data for atomic layer deposition processes
Open the PDF for Machine learning approach to thickness prediction from <em>in situ</em> spectroscopic ellipsometry data for atomic layer deposition processes in another window
Journal Articles

Numerical ellipsometry: A method for selecting a near-minimal infrared measurement set for β-gallium oxide

Frank K. Urban, III, David Barton, Mathias Schubert
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 052801 (2021)
https://doi.org/10.1116/6.0001002
Published: July 2021
View article titled, Numerical ellipsometry: A method for selecting a near-minimal infrared measurement set for β-gallium oxide
Open the PDF for Numerical ellipsometry: A method for selecting a near-minimal infrared measurement set for β-gallium oxide in another window
Journal Articles

In situ compositional mapping of combinatorial materials libraries by scanning low-angle x-ray spectroscopy

Editor’s Pick
Jeonggoo Kim, Mikhail D. Strikovski, Steven L. Garrahan, Richard Mozelack, Jonathan E. Parkinson, Solomon H. Kolagani
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 033413 (2021)
https://doi.org/10.1116/6.0000862
Published: April 2021
View article titled, <em>In situ</em> compositional mapping of combinatorial materials libraries by scanning low-angle x-ray spectroscopy
Open the PDF for <em>In situ</em> compositional mapping of combinatorial materials libraries by scanning low-angle x-ray spectroscopy in another window
Journal Articles

Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum

Thomas R. Gengenbach, George H. Major, Matthew R. Linford, Christopher D. Easton
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 013204 (2021)
https://doi.org/10.1116/6.0000682
Published: January 2021
View article titled, Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum
Open the PDF for Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum in another window
Journal Articles

Introduction to x-ray photoelectron spectroscopy

Fred A. Stevie, Carrie L. Donley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063204 (2020)
https://doi.org/10.1116/6.0000412
Published: September 2020
View article titled, Introduction to x-ray photoelectron spectroscopy
Open the PDF for Introduction to x-ray photoelectron spectroscopy in another window
Journal Articles

High sensitivity Rutherford backscattering spectrometry using multidetector digital pulse processing

Grazia Laricchiuta, Wilfried Vandervorst, Ivan Zyulkov, Silvia Armini, Johan Meersschaut
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 36, 02D407 (2018)
https://doi.org/10.1116/1.5016033
Published: February 2018
View article titled, High sensitivity Rutherford backscattering spectrometry using multidetector digital pulse processing
Open the PDF for High sensitivity Rutherford backscattering spectrometry using multidetector digital pulse processing in another window
Journal Articles

Improved inflection point method of emissive probe for accurate measurement of plasma potential

Jian-quan Li, Jun Xu, Yu-jing Bai, Wen-qi Lu, You-nian Wang
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 34, 061304 (2016)
https://doi.org/10.1116/1.4964834
Published: October 2016
View article titled, Improved inflection point method of emissive probe for accurate measurement of plasma potential
Open the PDF for Improved inflection point method of emissive probe for accurate measurement of plasma potential in another window
Journal Articles

Framework for alternating-least-squares-based multivariate curve resolution with application to time-of-flight secondary ion mass spectrometry imaging

Michael R. Keenan, Willem Windig, Henrik Arlinghaus
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 05E123 (2015)
https://doi.org/10.1116/1.4927528
Published: August 2015
View article titled, Framework for alternating-least-squares-based multivariate curve resolution with application to time-of-flight secondary ion mass spectrometry imaging
Open the PDF for Framework for alternating-least-squares-based multivariate curve resolution with application to time-of-flight secondary ion mass spectrometry imaging in another window
Journal Articles

Temporal evolution of ion energy distribution functions and ion charge states of Cr and Cr-Al pulsed arc plasmas

Koichi Tanaka, André Anders
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 33, 061301 (2015)
https://doi.org/10.1116/1.4926750
Published: July 2015
View article titled, Temporal evolution of ion energy distribution functions and ion charge states of Cr and Cr-Al pulsed arc plasmas
Open the PDF for Temporal evolution of ion energy distribution functions and ion charge states of Cr and Cr-Al pulsed arc plasmas in another window
Journal Articles

Desorption and sublimation kinetics for fluorinated aluminum nitride surfaces

Sean W. King, Robert F. Davis, Robert J. Nemanich
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 32, 051402 (2014)
https://doi.org/10.1116/1.4891650
Published: July 2014
View article titled, Desorption and sublimation kinetics for fluorinated aluminum nitride surfaces
Open the PDF for Desorption and sublimation kinetics for fluorinated aluminum nitride surfaces in another window
Journal Articles

Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials

Cedric J. Powell, Wolfgang S. M. Werner, Werner Smekal
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 32, 050603 (2014)
https://doi.org/10.1116/1.4891628
Published: July 2014
View article titled, Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials
Open the PDF for Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials in another window
Journal Articles

Validity of automated x-ray photoelectron spectroscopy algorithm to determine the amount of substance and the depth distribution of atoms

Sven Tougaard
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 031503 (2013)
https://doi.org/10.1116/1.4795246
Published: March 2013
View article titled, Validity of automated x-ray photoelectron spectroscopy algorithm to determine the amount of substance and the depth distribution of atoms
Open the PDF for Validity of automated x-ray photoelectron spectroscopy algorithm to determine the amount of substance and the depth distribution of atoms in another window
Journal Articles

Surface reconstruction at the initial Ge adsorption stage on Si(114)-2 × 1

Ganbat Duvjir, Hidong Kim, Otgonbayar Dugerjav, Huiting Li, Moaaed Motlak, Amarmunkh Arvisbaatar, Jae M. Seo
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 021404 (2013)
https://doi.org/10.1116/1.4792243
Published: February 2013
View article titled, Surface reconstruction at the initial Ge adsorption stage on Si(114)-2 × 1
Open the PDF for Surface reconstruction at the initial Ge adsorption stage on Si(114)-2 × 1 in another window
Journal Articles

Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates

Simon Gaudet, Koen De Keyser, Samuel Lambert-Milot, Jean Jordan-Sweet, Christophe Detavernier, Christian Lavoie, Patrick Desjardins
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 31, 021505 (2013)
https://doi.org/10.1116/1.4789984
Published: February 2013
View article titled, Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates
Open the PDF for Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates in another window
Includes: Supplementary data
Journal Articles

Apparatus for deposition of composition spread alloy films: The rotatable shadow mask

Benoit Fleutot, James B. Miller, Andrew J. Gellman
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 30, 061511 (2012)
https://doi.org/10.1116/1.4766194
Published: November 2012
View article titled, Apparatus for deposition of composition spread alloy films: The rotatable shadow mask
Open the PDF for Apparatus for deposition of composition spread alloy films: The rotatable shadow mask in another window